Few-Layer Graphene Characterization by Near-Field Scanning Microwave Microscopy

Near-field scanning microwave microscopy is employed for quantitative imaging at 4 GHz of the local impedance for monolayer and few-layer graphene. The microwave response of graphene is found to be thickness dependent and determined by the local sheet resistance of the graphene flake. Calibration of...

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Veröffentlicht in:ACS nano 2010-07, Vol.4 (7), p.3831-3838
Hauptverfasser: Talanov, Vladimir V., Barga, Christopher Del, Wickey, Lee, Kalichava, Irakli, Gonzales, Edward, Shaner, Eric A., Gin, Aaron V., Kalugin, Nikolai G.
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container_end_page 3838
container_issue 7
container_start_page 3831
container_title ACS nano
container_volume 4
creator Talanov, Vladimir V.
Barga, Christopher Del
Wickey, Lee
Kalichava, Irakli
Gonzales, Edward
Shaner, Eric A.
Gin, Aaron V.
Kalugin, Nikolai G.
description Near-field scanning microwave microscopy is employed for quantitative imaging at 4 GHz of the local impedance for monolayer and few-layer graphene. The microwave response of graphene is found to be thickness dependent and determined by the local sheet resistance of the graphene flake. Calibration of the measurement system and knowledge of the probe geometry allows evaluation of the AC impedance for monolayer and few-layer graphene, which is found to be predominantly active. The use of localized evanescent electromagnetic field in our experiment provides a promising tool for investigations of plasma waves in graphene with wave numbers determined by the spatial spectrum of the near-field. By using near-field microwave microscopy one can perform simultaneous imaging of location, geometry, thickness, and distribution of electrical properties of graphene without a need for device fabrication.
doi_str_mv 10.1021/nn100493f
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_748926302</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>748926302</sourcerecordid><originalsourceid>FETCH-LOGICAL-a380t-ac681faba134b30f56b7d5bb366d5c2b3729967924a55e866cffcb4ba5583e8b3</originalsourceid><addsrcrecordid>eNptkE1Lw0AQhhdRbP04-AckFxEP0d1sstkcpdgqVHtQwVuY3UxsSrqJu4kl_npTUnvyNO_Aw8vMQ8gFo7eMBuzOGEZpmPD8gIxZwoVPpfg43OeIjciJcytKo1jG4piMAhpxwWQ8Jospbvw5dGi9mYV6iQa9yRIs6AZt8QNNURlPdd4LgvWnBZaZ96rBmMJ8es-FttUGvnFITld1d0aOcigdnu_mKXmfPrxNHv35YvY0uZ_7wCVtfNBCshwUMB4qTvNIqDiLlOJCZJEOFI-DJBFxEoQQRSiF0HmuVaj6TXKUip-S66G3ttVXi65J14XTWJZgsGpdGocyCQSnQU_eDOT2RGcxT2tbrMF2KaPpVl-619ezl7vWVq0x25N_vnrgagBAu3RVtdb0T_5T9AsK0na3</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>748926302</pqid></control><display><type>article</type><title>Few-Layer Graphene Characterization by Near-Field Scanning Microwave Microscopy</title><source>American Chemical Society Journals</source><creator>Talanov, Vladimir V. ; Barga, Christopher Del ; Wickey, Lee ; Kalichava, Irakli ; Gonzales, Edward ; Shaner, Eric A. ; Gin, Aaron V. ; Kalugin, Nikolai G.</creator><creatorcontrib>Talanov, Vladimir V. ; Barga, Christopher Del ; Wickey, Lee ; Kalichava, Irakli ; Gonzales, Edward ; Shaner, Eric A. ; Gin, Aaron V. ; Kalugin, Nikolai G.</creatorcontrib><description>Near-field scanning microwave microscopy is employed for quantitative imaging at 4 GHz of the local impedance for monolayer and few-layer graphene. The microwave response of graphene is found to be thickness dependent and determined by the local sheet resistance of the graphene flake. Calibration of the measurement system and knowledge of the probe geometry allows evaluation of the AC impedance for monolayer and few-layer graphene, which is found to be predominantly active. The use of localized evanescent electromagnetic field in our experiment provides a promising tool for investigations of plasma waves in graphene with wave numbers determined by the spatial spectrum of the near-field. By using near-field microwave microscopy one can perform simultaneous imaging of location, geometry, thickness, and distribution of electrical properties of graphene without a need for device fabrication.</description><identifier>ISSN: 1936-0851</identifier><identifier>EISSN: 1936-086X</identifier><identifier>DOI: 10.1021/nn100493f</identifier><identifier>PMID: 20536187</identifier><language>eng</language><publisher>United States: American Chemical Society</publisher><ispartof>ACS nano, 2010-07, Vol.4 (7), p.3831-3838</ispartof><rights>Copyright © 2010 American Chemical Society</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-a380t-ac681faba134b30f56b7d5bb366d5c2b3729967924a55e866cffcb4ba5583e8b3</citedby><cites>FETCH-LOGICAL-a380t-ac681faba134b30f56b7d5bb366d5c2b3729967924a55e866cffcb4ba5583e8b3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://pubs.acs.org/doi/pdf/10.1021/nn100493f$$EPDF$$P50$$Gacs$$H</linktopdf><linktohtml>$$Uhttps://pubs.acs.org/doi/10.1021/nn100493f$$EHTML$$P50$$Gacs$$H</linktohtml><link.rule.ids>314,780,784,2765,27076,27924,27925,56738,56788</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/20536187$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Talanov, Vladimir V.</creatorcontrib><creatorcontrib>Barga, Christopher Del</creatorcontrib><creatorcontrib>Wickey, Lee</creatorcontrib><creatorcontrib>Kalichava, Irakli</creatorcontrib><creatorcontrib>Gonzales, Edward</creatorcontrib><creatorcontrib>Shaner, Eric A.</creatorcontrib><creatorcontrib>Gin, Aaron V.</creatorcontrib><creatorcontrib>Kalugin, Nikolai G.</creatorcontrib><title>Few-Layer Graphene Characterization by Near-Field Scanning Microwave Microscopy</title><title>ACS nano</title><addtitle>ACS Nano</addtitle><description>Near-field scanning microwave microscopy is employed for quantitative imaging at 4 GHz of the local impedance for monolayer and few-layer graphene. The microwave response of graphene is found to be thickness dependent and determined by the local sheet resistance of the graphene flake. Calibration of the measurement system and knowledge of the probe geometry allows evaluation of the AC impedance for monolayer and few-layer graphene, which is found to be predominantly active. The use of localized evanescent electromagnetic field in our experiment provides a promising tool for investigations of plasma waves in graphene with wave numbers determined by the spatial spectrum of the near-field. By using near-field microwave microscopy one can perform simultaneous imaging of location, geometry, thickness, and distribution of electrical properties of graphene without a need for device fabrication.</description><issn>1936-0851</issn><issn>1936-086X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNptkE1Lw0AQhhdRbP04-AckFxEP0d1sstkcpdgqVHtQwVuY3UxsSrqJu4kl_npTUnvyNO_Aw8vMQ8gFo7eMBuzOGEZpmPD8gIxZwoVPpfg43OeIjciJcytKo1jG4piMAhpxwWQ8Jospbvw5dGi9mYV6iQa9yRIs6AZt8QNNURlPdd4LgvWnBZaZ96rBmMJ8es-FttUGvnFITld1d0aOcigdnu_mKXmfPrxNHv35YvY0uZ_7wCVtfNBCshwUMB4qTvNIqDiLlOJCZJEOFI-DJBFxEoQQRSiF0HmuVaj6TXKUip-S66G3ttVXi65J14XTWJZgsGpdGocyCQSnQU_eDOT2RGcxT2tbrMF2KaPpVl-619ezl7vWVq0x25N_vnrgagBAu3RVtdb0T_5T9AsK0na3</recordid><startdate>20100727</startdate><enddate>20100727</enddate><creator>Talanov, Vladimir V.</creator><creator>Barga, Christopher Del</creator><creator>Wickey, Lee</creator><creator>Kalichava, Irakli</creator><creator>Gonzales, Edward</creator><creator>Shaner, Eric A.</creator><creator>Gin, Aaron V.</creator><creator>Kalugin, Nikolai G.</creator><general>American Chemical Society</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>20100727</creationdate><title>Few-Layer Graphene Characterization by Near-Field Scanning Microwave Microscopy</title><author>Talanov, Vladimir V. ; Barga, Christopher Del ; Wickey, Lee ; Kalichava, Irakli ; Gonzales, Edward ; Shaner, Eric A. ; Gin, Aaron V. ; Kalugin, Nikolai G.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a380t-ac681faba134b30f56b7d5bb366d5c2b3729967924a55e866cffcb4ba5583e8b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Talanov, Vladimir V.</creatorcontrib><creatorcontrib>Barga, Christopher Del</creatorcontrib><creatorcontrib>Wickey, Lee</creatorcontrib><creatorcontrib>Kalichava, Irakli</creatorcontrib><creatorcontrib>Gonzales, Edward</creatorcontrib><creatorcontrib>Shaner, Eric A.</creatorcontrib><creatorcontrib>Gin, Aaron V.</creatorcontrib><creatorcontrib>Kalugin, Nikolai G.</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>ACS nano</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Talanov, Vladimir V.</au><au>Barga, Christopher Del</au><au>Wickey, Lee</au><au>Kalichava, Irakli</au><au>Gonzales, Edward</au><au>Shaner, Eric A.</au><au>Gin, Aaron V.</au><au>Kalugin, Nikolai G.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Few-Layer Graphene Characterization by Near-Field Scanning Microwave Microscopy</atitle><jtitle>ACS nano</jtitle><addtitle>ACS Nano</addtitle><date>2010-07-27</date><risdate>2010</risdate><volume>4</volume><issue>7</issue><spage>3831</spage><epage>3838</epage><pages>3831-3838</pages><issn>1936-0851</issn><eissn>1936-086X</eissn><abstract>Near-field scanning microwave microscopy is employed for quantitative imaging at 4 GHz of the local impedance for monolayer and few-layer graphene. The microwave response of graphene is found to be thickness dependent and determined by the local sheet resistance of the graphene flake. Calibration of the measurement system and knowledge of the probe geometry allows evaluation of the AC impedance for monolayer and few-layer graphene, which is found to be predominantly active. The use of localized evanescent electromagnetic field in our experiment provides a promising tool for investigations of plasma waves in graphene with wave numbers determined by the spatial spectrum of the near-field. By using near-field microwave microscopy one can perform simultaneous imaging of location, geometry, thickness, and distribution of electrical properties of graphene without a need for device fabrication.</abstract><cop>United States</cop><pub>American Chemical Society</pub><pmid>20536187</pmid><doi>10.1021/nn100493f</doi><tpages>8</tpages></addata></record>
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title Few-Layer Graphene Characterization by Near-Field Scanning Microwave Microscopy
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-25T03%3A38%3A48IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Few-Layer%20Graphene%20Characterization%20by%20Near-Field%20Scanning%20Microwave%20Microscopy&rft.jtitle=ACS%20nano&rft.au=Talanov,%20Vladimir%20V.&rft.date=2010-07-27&rft.volume=4&rft.issue=7&rft.spage=3831&rft.epage=3838&rft.pages=3831-3838&rft.issn=1936-0851&rft.eissn=1936-086X&rft_id=info:doi/10.1021/nn100493f&rft_dat=%3Cproquest_cross%3E748926302%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=748926302&rft_id=info:pmid/20536187&rfr_iscdi=true