Passivation and gettering of defective crystalline silicon solar cell

Different polycrystalline silicon and single-crystalline silicon with dislocations were used for passivation and gettering processes. These materials have defects and more impurity in the crystal. The dominant increase of electronic performance was found for wafers with more defects by using a different casting method. The wafers of single crystalline silicon with dislocations also have higher increase of efficiency of cell in comparison with that wafer without dislocations during oxide passivation processes used. POCl 3 was used for gettering processes. Single-crystal wafer with or without dislocations was used for comparison of gettering.