Quality control and characterization of Cu(In,Ga)Se sub(2)-based thin-film solar cells by surface photovoltage spectroscopy
Surface photovoltage spectroscopy (SPS) has been used for quality control of ZnO/CdS/ Cu(In,Ga)Se sub(2) (CIGS) thin-film solar cells. The results show that SPS makes it possible to detect `hard failures' following CIGS deposition, and both `hard' and `soft' failures following CdS dep...
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| Veröffentlicht in: | Solar energy materials and solar cells 1998-02, Vol.51 (1), p.21-34 |
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| container_title | Solar energy materials and solar cells |
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| creator | Kronik, L Mishori, B Fefer, E Shapira, Y Riedl, W |
| description | Surface photovoltage spectroscopy (SPS) has been used for quality control of ZnO/CdS/ Cu(In,Ga)Se sub(2) (CIGS) thin-film solar cells. The results show that SPS makes it possible to detect `hard failures' following CIGS deposition, and both `hard' and `soft' failures following CdS deposition and following ZnO deposition. In addition, a semi-quantitative screening of CdS/CIGS and ZnO/CdS /CIGS samples is possible. Hence, SPS is suggested as a useful tool for in-line monitoring of CIGS-based solar cell production lines. Moreover, SPS is shown to yield important new information regarding CIGS-based solar cells: (a) A deep gap state is found in samples of superior performance. (b) As opposed to the CdS/CIGS structure, a marked decrease in the open-circuit voltage upon Na contamination in ZnO/CIGS structures is found. |
| format | Article |
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The results show that SPS makes it possible to detect `hard failures' following CIGS deposition, and both `hard' and `soft' failures following CdS deposition and following ZnO deposition. In addition, a semi-quantitative screening of CdS/CIGS and ZnO/CdS /CIGS samples is possible. Hence, SPS is suggested as a useful tool for in-line monitoring of CIGS-based solar cell production lines. Moreover, SPS is shown to yield important new information regarding CIGS-based solar cells: (a) A deep gap state is found in samples of superior performance. (b) As opposed to the CdS/CIGS structure, a marked decrease in the open-circuit voltage upon Na contamination in ZnO/CIGS structures is found.</description><identifier>ISSN: 0927-0248</identifier><language>eng</language><subject>Copper compounds ; Deposition ; Energy gap ; Quality control ; Semiconducting cadmium compounds ; Semiconducting films ; Semiconducting zinc compounds ; Spectroscopic analysis ; Thin film devices ; Zinc oxide</subject><ispartof>Solar energy materials and solar cells, 1998-02, Vol.51 (1), p.21-34</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780</link.rule.ids></links><search><creatorcontrib>Kronik, L</creatorcontrib><creatorcontrib>Mishori, B</creatorcontrib><creatorcontrib>Fefer, E</creatorcontrib><creatorcontrib>Shapira, Y</creatorcontrib><creatorcontrib>Riedl, W</creatorcontrib><title>Quality control and characterization of Cu(In,Ga)Se sub(2)-based thin-film solar cells by surface photovoltage spectroscopy</title><title>Solar energy materials and solar cells</title><description>Surface photovoltage spectroscopy (SPS) has been used for quality control of ZnO/CdS/ Cu(In,Ga)Se sub(2) (CIGS) thin-film solar cells. The results show that SPS makes it possible to detect `hard failures' following CIGS deposition, and both `hard' and `soft' failures following CdS deposition and following ZnO deposition. In addition, a semi-quantitative screening of CdS/CIGS and ZnO/CdS /CIGS samples is possible. Hence, SPS is suggested as a useful tool for in-line monitoring of CIGS-based solar cell production lines. Moreover, SPS is shown to yield important new information regarding CIGS-based solar cells: (a) A deep gap state is found in samples of superior performance. (b) As opposed to the CdS/CIGS structure, a marked decrease in the open-circuit voltage upon Na contamination in ZnO/CIGS structures is found.</description><subject>Copper compounds</subject><subject>Deposition</subject><subject>Energy gap</subject><subject>Quality control</subject><subject>Semiconducting cadmium compounds</subject><subject>Semiconducting films</subject><subject>Semiconducting zinc compounds</subject><subject>Spectroscopic analysis</subject><subject>Thin film devices</subject><subject>Zinc oxide</subject><issn>0927-0248</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1998</creationdate><recordtype>article</recordtype><recordid>eNqNjUFOwzAQRb0AqS30DrOjlRrJOCkl66oUlhXsq4k7aYxcT_DYSIHLEyQOwOpt3vv_Sk11bTaFNtXjRM1E3rXW5qGspur7kNG7NIDlkCJ7wHAC22FEmyi6L0yOA3AL27x4Cas9Ll8JJDcLsywaFDpB6lwoWucvIOwxgiXvBZphtGKLlqDvOPEn-4TnMe3Jjj9iuR9u1XWLXmj-xxt197R72z4XfeSPTJKOFye_cxiIsxw31bqu7k1dlv83fwA6kVG_</recordid><startdate>19980201</startdate><enddate>19980201</enddate><creator>Kronik, L</creator><creator>Mishori, B</creator><creator>Fefer, E</creator><creator>Shapira, Y</creator><creator>Riedl, W</creator><scope>7TC</scope></search><sort><creationdate>19980201</creationdate><title>Quality control and characterization of Cu(In,Ga)Se sub(2)-based thin-film solar cells by surface photovoltage spectroscopy</title><author>Kronik, L ; Mishori, B ; Fefer, E ; Shapira, Y ; Riedl, W</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-proquest_miscellaneous_7459412933</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1998</creationdate><topic>Copper compounds</topic><topic>Deposition</topic><topic>Energy gap</topic><topic>Quality control</topic><topic>Semiconducting cadmium compounds</topic><topic>Semiconducting films</topic><topic>Semiconducting zinc compounds</topic><topic>Spectroscopic analysis</topic><topic>Thin film devices</topic><topic>Zinc oxide</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kronik, L</creatorcontrib><creatorcontrib>Mishori, B</creatorcontrib><creatorcontrib>Fefer, E</creatorcontrib><creatorcontrib>Shapira, Y</creatorcontrib><creatorcontrib>Riedl, W</creatorcontrib><collection>Mechanical Engineering Abstracts</collection><jtitle>Solar energy materials and solar cells</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kronik, L</au><au>Mishori, B</au><au>Fefer, E</au><au>Shapira, Y</au><au>Riedl, W</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Quality control and characterization of Cu(In,Ga)Se sub(2)-based thin-film solar cells by surface photovoltage spectroscopy</atitle><jtitle>Solar energy materials and solar cells</jtitle><date>1998-02-01</date><risdate>1998</risdate><volume>51</volume><issue>1</issue><spage>21</spage><epage>34</epage><pages>21-34</pages><issn>0927-0248</issn><abstract>Surface photovoltage spectroscopy (SPS) has been used for quality control of ZnO/CdS/ Cu(In,Ga)Se sub(2) (CIGS) thin-film solar cells. The results show that SPS makes it possible to detect `hard failures' following CIGS deposition, and both `hard' and `soft' failures following CdS deposition and following ZnO deposition. In addition, a semi-quantitative screening of CdS/CIGS and ZnO/CdS /CIGS samples is possible. Hence, SPS is suggested as a useful tool for in-line monitoring of CIGS-based solar cell production lines. Moreover, SPS is shown to yield important new information regarding CIGS-based solar cells: (a) A deep gap state is found in samples of superior performance. (b) As opposed to the CdS/CIGS structure, a marked decrease in the open-circuit voltage upon Na contamination in ZnO/CIGS structures is found.</abstract></addata></record> |
| fulltext | fulltext |
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| ispartof | Solar energy materials and solar cells, 1998-02, Vol.51 (1), p.21-34 |
| issn | 0927-0248 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_745941293 |
| source | Elsevier ScienceDirect Journals |
| subjects | Copper compounds Deposition Energy gap Quality control Semiconducting cadmium compounds Semiconducting films Semiconducting zinc compounds Spectroscopic analysis Thin film devices Zinc oxide |
| title | Quality control and characterization of Cu(In,Ga)Se sub(2)-based thin-film solar cells by surface photovoltage spectroscopy |
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