X-ray fluorescence measurements of thin film chalcopyrite solar cells
X-ray fluorescence has turned out to be a very suitable and reliable tool for the characterization of thin film chalcopyrite solar cells. Besides the composition determination in atomic percent the total mass per unit square (mg/cm 2) of the analyzed elements and the film thickness can be measured a...
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Veröffentlicht in: | Solar energy materials and solar cells 1999-01, Vol.58 (3), p.299-319 |
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creator | Klenk, M Schenker, O Probst, U Bucher, E |
description | X-ray fluorescence has turned out to be a very suitable and reliable tool for the characterization of thin film chalcopyrite solar cells. Besides the composition determination in atomic percent the total mass per unit square (mg/cm
2) of the analyzed elements and the film thickness can be measured accurately. Furthermore, a real multi-layer analysis allows in addition to determine the CdS, ZnO and Mo thickness simultaneously with the absorber measurement. By the use of etching techniques, information about a vertical composition gradient can also be obtained. This work shows the possibilities and limitations of the X-ray fluorescence technique for the chalcopyrite solar cell characterization and emphasizes the advantages over the widespread electron probe microanalysis. |
doi_str_mv | 10.1016/S0927-0248(99)00014-8 |
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source | ScienceDirect Journals (5 years ago - present) |
subjects | Applied sciences Cadmium compounds Chalcopyrite Chemical analysis Composition Copper compounds Energy Etching Exact sciences and technology Fluorescence Multilayers Natural energy Photovoltaic conversion Polycrystalline Solar cells. Photoelectrochemical cells Solar energy Thickness measurement Thin films X ray analysis X-ray Zinc oxide |
title | X-ray fluorescence measurements of thin film chalcopyrite solar cells |
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