X-ray fluorescence measurements of thin film chalcopyrite solar cells

X-ray fluorescence has turned out to be a very suitable and reliable tool for the characterization of thin film chalcopyrite solar cells. Besides the composition determination in atomic percent the total mass per unit square (mg/cm 2) of the analyzed elements and the film thickness can be measured a...

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Veröffentlicht in:Solar energy materials and solar cells 1999-01, Vol.58 (3), p.299-319
Hauptverfasser: Klenk, M, Schenker, O, Probst, U, Bucher, E
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creator Klenk, M
Schenker, O
Probst, U
Bucher, E
description X-ray fluorescence has turned out to be a very suitable and reliable tool for the characterization of thin film chalcopyrite solar cells. Besides the composition determination in atomic percent the total mass per unit square (mg/cm 2) of the analyzed elements and the film thickness can be measured accurately. Furthermore, a real multi-layer analysis allows in addition to determine the CdS, ZnO and Mo thickness simultaneously with the absorber measurement. By the use of etching techniques, information about a vertical composition gradient can also be obtained. This work shows the possibilities and limitations of the X-ray fluorescence technique for the chalcopyrite solar cell characterization and emphasizes the advantages over the widespread electron probe microanalysis.
doi_str_mv 10.1016/S0927-0248(99)00014-8
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source ScienceDirect Journals (5 years ago - present)
subjects Applied sciences
Cadmium compounds
Chalcopyrite
Chemical analysis
Composition
Copper compounds
Energy
Etching
Exact sciences and technology
Fluorescence
Multilayers
Natural energy
Photovoltaic conversion
Polycrystalline
Solar cells. Photoelectrochemical cells
Solar energy
Thickness measurement
Thin films
X ray analysis
X-ray
Zinc oxide
title X-ray fluorescence measurements of thin film chalcopyrite solar cells
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