Melting points, spectral reflectivity, and emissivity of semitransparent ceramic materials
A new method based on multiwavelength optical probing and multiwavelength pyroreflectometry of open sample surface to measure spectral optical properties of semitransparent ceramic materials at their melting points and to determine their true melting temperatures has been developed. With the method...
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| Veröffentlicht in: | International journal of thermophysics 1999-11, Vol.20 (6), p.1801-1809 |
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| container_end_page | 1809 |
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| container_issue | 6 |
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| container_title | International journal of thermophysics |
| container_volume | 20 |
| creator | SALIKHOV, T. P KAN, V. V |
| description | A new method based on multiwavelength optical probing and multiwavelength pyroreflectometry of open sample surface to measure spectral optical properties of semitransparent ceramic materials at their melting points and to determine their true melting temperatures has been developed. With the method developed the spectral optical properties (reflectivity, emissivity, transmittance) of Nd sub(2)O sub(3), Gd sub(2)O sub(3), Er sub(2)O sub(3), and Ho sub(2)O sub(3) for seven wavelengths in the spectral range 0.4 to 1.1 mu m at their melting points have been measured for the first time. It is shown that the method developed has a high precision in determining the true melting temperatures for semitransparent ceramic materials. In open surface pyrometry this method is used for the first time. |
| doi_str_mv | 10.1023/A:1022622316322 |
| format | Article |
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P</creatorcontrib><creatorcontrib>KAN, V. V</creatorcontrib><title>Melting points, spectral reflectivity, and emissivity of semitransparent ceramic materials</title><title>International journal of thermophysics</title><description>A new method based on multiwavelength optical probing and multiwavelength pyroreflectometry of open sample surface to measure spectral optical properties of semitransparent ceramic materials at their melting points and to determine their true melting temperatures has been developed. With the method developed the spectral optical properties (reflectivity, emissivity, transmittance) of Nd sub(2)O sub(3), Gd sub(2)O sub(3), Er sub(2)O sub(3), and Ho sub(2)O sub(3) for seven wavelengths in the spectral range 0.4 to 1.1 mu m at their melting points have been measured for the first time. It is shown that the method developed has a high precision in determining the true melting temperatures for semitransparent ceramic materials. In open surface pyrometry this method is used for the first time.</description><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Equations of state, phase equilibria, and phase transitions</subject><subject>Exact sciences and technology</subject><subject>Heat radiation</subject><subject>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</subject><subject>Melting</subject><subject>Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)</subject><subject>Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity</subject><subject>Optical instruments, equipment and techniques</subject><subject>Optical properties</subject><subject>Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation</subject><subject>Optical properties of bulk materials and thin films</subject><subject>Oxides</subject><subject>Physics</subject><subject>Pyrometry</subject><subject>Reflectometers</subject><subject>Solid-liquid transitions</subject><subject>Specific phase transitions</subject><issn>0195-928X</issn><issn>1572-9567</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1999</creationdate><recordtype>article</recordtype><recordid>eNotjktLAzEYRYMoWKtrt1kIbjqaxySZuCulPqDiRkHcDN-kiUQyD5NU6L83aFfnXjhcLkKXlNxQwvjt8q6AScY4lZyxIzSjQrFKC6mO0YxQLSrNmvdTdJbSFyFEK81n6OPZhuyHTzyNfshpgdNkTY4QcLQulOh_fN4vMAxbbHuf0l_Ho8Op1CIOaYJoh4yNjdB7g3vINnoI6RyduAJ7ceAcvd2vX1eP1ebl4Wm13FSGSZKrRtbEAZeN3oKxonOCUlKDrCkooZxTWkHHOmeV5FYSQxqppOq2XIBjhBE-R9f_u1Mcv3c25bb8NDYEGOy4S62qa8l0rUQxrw4mJAPBlffGp3aKvoe4bylrVEM5_wW0P2QA</recordid><startdate>19991101</startdate><enddate>19991101</enddate><creator>SALIKHOV, T. P</creator><creator>KAN, V. V</creator><general>Springer</general><scope>IQODW</scope><scope>7TC</scope></search><sort><creationdate>19991101</creationdate><title>Melting points, spectral reflectivity, and emissivity of semitransparent ceramic materials</title><author>SALIKHOV, T. P ; KAN, V. V</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c260t-8640fa3689dace5bf51104a641a757ff797ab2bfe763e60c086767bd35af20203</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1999</creationdate><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Equations of state, phase equilibria, and phase transitions</topic><topic>Exact sciences and technology</topic><topic>Heat radiation</topic><topic>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</topic><topic>Melting</topic><topic>Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)</topic><topic>Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity</topic><topic>Optical instruments, equipment and techniques</topic><topic>Optical properties</topic><topic>Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation</topic><topic>Optical properties of bulk materials and thin films</topic><topic>Oxides</topic><topic>Physics</topic><topic>Pyrometry</topic><topic>Reflectometers</topic><topic>Solid-liquid transitions</topic><topic>Specific phase transitions</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>SALIKHOV, T. P</creatorcontrib><creatorcontrib>KAN, V. V</creatorcontrib><collection>Pascal-Francis</collection><collection>Mechanical Engineering Abstracts</collection><jtitle>International journal of thermophysics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>SALIKHOV, T. P</au><au>KAN, V. V</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Melting points, spectral reflectivity, and emissivity of semitransparent ceramic materials</atitle><jtitle>International journal of thermophysics</jtitle><date>1999-11-01</date><risdate>1999</risdate><volume>20</volume><issue>6</issue><spage>1801</spage><epage>1809</epage><pages>1801-1809</pages><issn>0195-928X</issn><eissn>1572-9567</eissn><coden>IJTHDY</coden><abstract>A new method based on multiwavelength optical probing and multiwavelength pyroreflectometry of open sample surface to measure spectral optical properties of semitransparent ceramic materials at their melting points and to determine their true melting temperatures has been developed. With the method developed the spectral optical properties (reflectivity, emissivity, transmittance) of Nd sub(2)O sub(3), Gd sub(2)O sub(3), Er sub(2)O sub(3), and Ho sub(2)O sub(3) for seven wavelengths in the spectral range 0.4 to 1.1 mu m at their melting points have been measured for the first time. It is shown that the method developed has a high precision in determining the true melting temperatures for semitransparent ceramic materials. In open surface pyrometry this method is used for the first time.</abstract><cop>New York, NY</cop><pub>Springer</pub><doi>10.1023/A:1022622316322</doi><tpages>9</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0195-928X |
| ispartof | International journal of thermophysics, 1999-11, Vol.20 (6), p.1801-1809 |
| issn | 0195-928X 1572-9567 |
| language | eng |
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| source | SpringerNature Journals |
| subjects | Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Equations of state, phase equilibria, and phase transitions Exact sciences and technology Heat radiation Instruments, apparatus, components and techniques common to several branches of physics and astronomy Melting Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity) Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity Optical instruments, equipment and techniques Optical properties Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of bulk materials and thin films Oxides Physics Pyrometry Reflectometers Solid-liquid transitions Specific phase transitions |
| title | Melting points, spectral reflectivity, and emissivity of semitransparent ceramic materials |
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