The top–bottom effect of a tilted thick specimen and its influence on electron tomography

We present the top–bottom effect (TBE) of a 5 µm thick amorphous specimen in a 3 MV ultrahigh voltage electron microscope (ultra-HVEM) and its influence on the quality of electron tomography (ET). The 40-nm gold particles on the top surface of the specimen tilted at different angles have been observ...

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Veröffentlicht in:	Journal of electron microscopy 2005-08, Vol.54 (4), p.367-371
Hauptverfasser:	Yang, Chao, Zhang, Hai-Bo, Li, Jing-Jing, Takaoka, Akio
Format:	Artikel
Sprache:	eng
Schlagworte:	electron tomography image quality point spread function thick specimen top–bottom effect transmission electron microscopy (TEM)
Online-Zugang:	Volltext
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