The top–bottom effect of a tilted thick specimen and its influence on electron tomography
We present the top–bottom effect (TBE) of a 5 µm thick amorphous specimen in a 3 MV ultrahigh voltage electron microscope (ultra-HVEM) and its influence on the quality of electron tomography (ET). The 40-nm gold particles on the top surface of the specimen tilted at different angles have been observ...
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| Veröffentlicht in: | Journal of electron microscopy 2005-08, Vol.54 (4), p.367-371 |
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| container_title | Journal of electron microscopy |
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| creator | Yang, Chao Zhang, Hai-Bo Li, Jing-Jing Takaoka, Akio |
| description | We present the top–bottom effect (TBE) of a 5 µm thick amorphous specimen in a 3 MV ultrahigh voltage electron microscope (ultra-HVEM) and its influence on the quality of electron tomography (ET). The 40-nm gold particles on the top surface of the specimen tilted at different angles have been observed to be of poorer image quality than those on the symmetrical bottom surface obtained by tilting and turning over the specimen. The point spread function of the gold-particle images was calculated using the increment Wiener filter and the image-quality variation was then evaluated. The TBE is shown to become more remarkable with the increase of the effective thickness of the tilted specimen or the decrease of the magnification of the ultra-HVEM. The ET simulation indicates that the TBE may generate ∼4% distortion in the radial direction of a reconstructed sphere model. |
| doi_str_mv | 10.1093/jmicro/dfi057 |
| format | Article |
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The 40-nm gold particles on the top surface of the specimen tilted at different angles have been observed to be of poorer image quality than those on the symmetrical bottom surface obtained by tilting and turning over the specimen. The point spread function of the gold-particle images was calculated using the increment Wiener filter and the image-quality variation was then evaluated. The TBE is shown to become more remarkable with the increase of the effective thickness of the tilted specimen or the decrease of the magnification of the ultra-HVEM. 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The 40-nm gold particles on the top surface of the specimen tilted at different angles have been observed to be of poorer image quality than those on the symmetrical bottom surface obtained by tilting and turning over the specimen. The point spread function of the gold-particle images was calculated using the increment Wiener filter and the image-quality variation was then evaluated. The TBE is shown to become more remarkable with the increase of the effective thickness of the tilted specimen or the decrease of the magnification of the ultra-HVEM. The ET simulation indicates that the TBE may generate ∼4% distortion in the radial direction of a reconstructed sphere model.</description><subject>electron tomography</subject><subject>image quality</subject><subject>point spread function</subject><subject>thick specimen</subject><subject>top–bottom effect</subject><subject>transmission electron microscopy (TEM)</subject><issn>0022-0744</issn><issn>2050-5698</issn><issn>1477-9986</issn><issn>2050-5701</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNp9kc9qFEEQhxsxmDV69CqNBz1N0n-np48aNREWBImw6KHp6al2ezMzPXb3gLn5Dr6hT-KEXRLwkFMV1Fe_ovgQekHJKSWan-2G4FI863wgUj1CKyqUqrRu6sdoRQhjFVFCHKOnOe8IoUpQ8gQd05oyTmSzQt-vtoBLnP7-_tPGUuKAwXtwBUePLS6hL9Dhsg3uGucJXBhgxHbscCgZh9H3M4wOcBwx9MtWWpolI_5IdtrePENH3vYZnh_qCfr68cPV-WW1_nzx6fztunKCqlIBV8Kqmkqvpa9VKzxrQQjNbQMcGCO104x3UnStdYpa66XQtWwaJjXtCOMn6M0-d0rx5wy5mCFkB31vR4hzNkpwybjgfCFfP0jWjdK1orfgq__AXZzTuHxhGFVqOU3UAlV7aBGQcwJvphQGm24MJeZWjtnLMXs5C__yEDq3A3T39MHGfWDIBX7dzW26NrXiSprLzTfzbvPl_cV60xjN_wEPCZvz</recordid><startdate>200508</startdate><enddate>200508</enddate><creator>Yang, Chao</creator><creator>Zhang, Hai-Bo</creator><creator>Li, Jing-Jing</creator><creator>Takaoka, Akio</creator><general>Oxford University Press</general><general>Oxford Publishing Limited (England)</general><scope>BSCLL</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7QF</scope><scope>7QO</scope><scope>7QQ</scope><scope>7SC</scope><scope>7SE</scope><scope>7SP</scope><scope>7SR</scope><scope>7TA</scope><scope>7TB</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>H8D</scope><scope>H8G</scope><scope>JG9</scope><scope>JQ2</scope><scope>K9.</scope><scope>KR7</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>NAPCQ</scope><scope>P64</scope><scope>7X8</scope></search><sort><creationdate>200508</creationdate><title>The top–bottom effect of a tilted thick specimen and its influence on electron tomography</title><author>Yang, Chao ; 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| ispartof | Journal of electron microscopy, 2005-08, Vol.54 (4), p.367-371 |
| issn | 0022-0744 2050-5698 1477-9986 2050-5701 |
| language | eng |
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| source | Oxford University Press Journals All Titles (1996-Current) |
| subjects | electron tomography image quality point spread function thick specimen top–bottom effect transmission electron microscopy (TEM) |
| title | The top–bottom effect of a tilted thick specimen and its influence on electron tomography |
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