Substrate-Removed HgCdTe-Based Focal-Plane Arrays for Short-Wavelength Infrared Astronomy
Removal of the CdZnTe substrate offers several performance benefits for near-infrared (NIR, 1.7 μ m) and short-wave infrared (SWIR, 2.5 μ m) focal-plane arrays (FPAs). Among these are visible wavelength detection, improved infrared sensitivity and uniformity, and greatly reduced susceptibility to...
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description | Removal of the CdZnTe substrate offers several performance benefits for near-infrared (NIR, 1.7
μ
m) and short-wave infrared (SWIR, 2.5
μ
m) focal-plane arrays (FPAs). Among these are visible wavelength detection, improved infrared sensitivity and uniformity, and greatly reduced susceptibility to the effects of ionizing radiation. Data for substrate-removed NIR FPAs fabricated for the Wide Field Camera 3 (WFC3) upgrade to the Hubble Space Telescope (HST) are presented, including detailed data from delivered units and summary trends for additional units. The WFC3 flight FPA is expected to improve discovery speed by 3.5–120× over current HST instruments. For SWIR FPAs, selected results are presented from the 16 megapixel mosaic delivered to Observatories of Carnegie Institution in Washington which serve as an example of the current state of the art. |
doi_str_mv | 10.1007/s11664-008-0421-8 |
format | Article |
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μ
m) and short-wave infrared (SWIR, 2.5
μ
m) focal-plane arrays (FPAs). Among these are visible wavelength detection, improved infrared sensitivity and uniformity, and greatly reduced susceptibility to the effects of ionizing radiation. Data for substrate-removed NIR FPAs fabricated for the Wide Field Camera 3 (WFC3) upgrade to the Hubble Space Telescope (HST) are presented, including detailed data from delivered units and summary trends for additional units. The WFC3 flight FPA is expected to improve discovery speed by 3.5–120× over current HST instruments. For SWIR FPAs, selected results are presented from the 16 megapixel mosaic delivered to Observatories of Carnegie Institution in Washington which serve as an example of the current state of the art.</description><identifier>ISSN: 0361-5235</identifier><identifier>EISSN: 1543-186X</identifier><identifier>DOI: 10.1007/s11664-008-0421-8</identifier><identifier>CODEN: JECMA5</identifier><language>eng</language><publisher>Boston: Springer US</publisher><subject>Applied sciences ; Astronomy ; Bolometer; infrared, submillimeter wave, microwave and radiowave receivers and detectors ; Cadmium zinc telluride ; Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Cross-disciplinary physics: materials science; rheology ; Electronics ; Electronics and Microelectronics ; Exact sciences and technology ; Infrared, submillimeter wave, microwave and radiowave instruments, equipment and techniques ; Instrumentation ; Instruments, apparatus, components and techniques common to several branches of physics and astronomy ; Materials Science ; Mercury cadmium telluride ; Methods of deposition of films and coatings; film growth and epitaxy ; Molecular beam epitaxy ; Molecular, atomic, ion, and chemical beam epitaxy ; Optical and Electronic Materials ; Optoelectronic devices ; Physics ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Solid State Physics ; Space telescopes ; Substrates</subject><ispartof>Journal of electronic materials, 2008-09, Vol.37 (9), p.1396-1400</ispartof><rights>TMS 2008</rights><rights>2009 INIST-CNRS</rights><rights>Copyright Minerals, Metals & Materials Society Sep 2008</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c377t-3dfd21ace92450bb0010fa1b880fa14d3fae4790639748b549b1f85172f3ba623</citedby><cites>FETCH-LOGICAL-c377t-3dfd21ace92450bb0010fa1b880fa14d3fae4790639748b549b1f85172f3ba623</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s11664-008-0421-8$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s11664-008-0421-8$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>309,310,314,780,784,789,790,23930,23931,25140,27924,27925,41488,42557,51319</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=20801181$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Piquette, E.C.</creatorcontrib><creatorcontrib>Edwall, D.D.</creatorcontrib><creatorcontrib>Arnold, H.</creatorcontrib><creatorcontrib>Chen, A.</creatorcontrib><creatorcontrib>Auyeung, J.</creatorcontrib><title>Substrate-Removed HgCdTe-Based Focal-Plane Arrays for Short-Wavelength Infrared Astronomy</title><title>Journal of electronic materials</title><addtitle>Journal of Elec Materi</addtitle><description>Removal of the CdZnTe substrate offers several performance benefits for near-infrared (NIR, 1.7
μ
m) and short-wave infrared (SWIR, 2.5
μ
m) focal-plane arrays (FPAs). Among these are visible wavelength detection, improved infrared sensitivity and uniformity, and greatly reduced susceptibility to the effects of ionizing radiation. Data for substrate-removed NIR FPAs fabricated for the Wide Field Camera 3 (WFC3) upgrade to the Hubble Space Telescope (HST) are presented, including detailed data from delivered units and summary trends for additional units. The WFC3 flight FPA is expected to improve discovery speed by 3.5–120× over current HST instruments. For SWIR FPAs, selected results are presented from the 16 megapixel mosaic delivered to Observatories of Carnegie Institution in Washington which serve as an example of the current state of the art.</description><subject>Applied sciences</subject><subject>Astronomy</subject><subject>Bolometer; infrared, submillimeter wave, microwave and radiowave receivers and detectors</subject><subject>Cadmium zinc telluride</subject><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Electronics</subject><subject>Electronics and Microelectronics</subject><subject>Exact sciences and technology</subject><subject>Infrared, submillimeter wave, microwave and radiowave instruments, equipment and techniques</subject><subject>Instrumentation</subject><subject>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</subject><subject>Materials Science</subject><subject>Mercury cadmium telluride</subject><subject>Methods of deposition of films and coatings; film growth and epitaxy</subject><subject>Molecular beam epitaxy</subject><subject>Molecular, atomic, ion, and chemical beam epitaxy</subject><subject>Optical and Electronic Materials</subject><subject>Optoelectronic devices</subject><subject>Physics</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Solid State Physics</subject><subject>Space telescopes</subject><subject>Substrates</subject><issn>0361-5235</issn><issn>1543-186X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2008</creationdate><recordtype>article</recordtype><sourceid>8G5</sourceid><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><sourceid>GUQSH</sourceid><sourceid>M2O</sourceid><recordid>eNp1kEtLAzEUhYMoWB8_wN0giKvovUlmJrOsxRcIilXUVcjMJH0wndRkWui_N7VFQXB1CfnO4fARcoJwgQD5ZUDMMkEBJAXBkMod0sNUcIoye98lPeAZ0pTxdJ8chDAFwBQl9sjHcFGGzuvO0Gczc0tTJ3ejQf1i6JUO8XHjKt3Qp0a3Jul7r1chsc4nw7HzHX3TS9OYdtSNk_vWeu1joB_bXOtmqyOyZ3UTzPH2HpLXm-uXwR19eLy9H_QfaMXzvKO8tjVDXZmCiRTKMi4Dq7GUcn1Eza02Ii8g40UuZJmKokQrU8yZ5aXOGD8k55veuXefCxM6NZuEyjTryW4RVC644FkhMZKnf8ipW_g2jlMMhMykEBAh3ECVdyF4Y9XcT2barxSCWqtWG9UqqlZr1UrGzNm2WIeoK5poq0n4CTKQgPg9gG24EL_akfG_A_4v_wJNuYzw</recordid><startdate>20080901</startdate><enddate>20080901</enddate><creator>Piquette, E.C.</creator><creator>Edwall, D.D.</creator><creator>Arnold, H.</creator><creator>Chen, A.</creator><creator>Auyeung, J.</creator><general>Springer US</general><general>Springer</general><general>Springer Nature B.V</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7XB</scope><scope>88I</scope><scope>8AF</scope><scope>8AO</scope><scope>8FE</scope><scope>8FG</scope><scope>8FK</scope><scope>8G5</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>GNUQQ</scope><scope>GUQSH</scope><scope>HCIFZ</scope><scope>KB.</scope><scope>L6V</scope><scope>M2O</scope><scope>M2P</scope><scope>M7S</scope><scope>MBDVC</scope><scope>P5Z</scope><scope>P62</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>Q9U</scope><scope>S0X</scope><scope>7QQ</scope><scope>7SP</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20080901</creationdate><title>Substrate-Removed HgCdTe-Based Focal-Plane Arrays for Short-Wavelength Infrared Astronomy</title><author>Piquette, E.C. ; Edwall, D.D. ; Arnold, H. ; Chen, A. ; Auyeung, J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c377t-3dfd21ace92450bb0010fa1b880fa14d3fae4790639748b549b1f85172f3ba623</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Applied sciences</topic><topic>Astronomy</topic><topic>Bolometer; infrared, submillimeter wave, microwave and radiowave receivers and detectors</topic><topic>Cadmium zinc telluride</topic><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Electronics</topic><topic>Electronics and Microelectronics</topic><topic>Exact sciences and technology</topic><topic>Infrared, submillimeter wave, microwave and radiowave instruments, equipment and techniques</topic><topic>Instrumentation</topic><topic>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</topic><topic>Materials Science</topic><topic>Mercury cadmium telluride</topic><topic>Methods of deposition of films and coatings; film growth and epitaxy</topic><topic>Molecular beam epitaxy</topic><topic>Molecular, atomic, ion, and chemical beam epitaxy</topic><topic>Optical and Electronic Materials</topic><topic>Optoelectronic devices</topic><topic>Physics</topic><topic>Semiconductor electronics. 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Solid state devices</topic><topic>Solid State Physics</topic><topic>Space telescopes</topic><topic>Substrates</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Piquette, E.C.</creatorcontrib><creatorcontrib>Edwall, D.D.</creatorcontrib><creatorcontrib>Arnold, H.</creatorcontrib><creatorcontrib>Chen, A.</creatorcontrib><creatorcontrib>Auyeung, J.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Science Database (Alumni Edition)</collection><collection>STEM Database</collection><collection>ProQuest Pharma Collection</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>Research Library (Alumni Edition)</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central (Alumni)</collection><collection>ProQuest Central</collection><collection>Advanced Technologies & Aerospace Database (1962 - current)</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central</collection><collection>ProQuest Central Student</collection><collection>Research Library Prep</collection><collection>SciTech Premium Collection</collection><collection>Materials Science Database</collection><collection>ProQuest Engineering Collection</collection><collection>ProQuest Research Library</collection><collection>ProQuest Science Journals</collection><collection>Engineering Database</collection><collection>Research Library (Corporate)</collection><collection>ProQuest advanced technologies & aerospace journals</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Materials science collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering collection</collection><collection>ProQuest Central Basic</collection><collection>SIRS Editorial</collection><collection>Ceramic Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of electronic materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Piquette, E.C.</au><au>Edwall, D.D.</au><au>Arnold, H.</au><au>Chen, A.</au><au>Auyeung, J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Substrate-Removed HgCdTe-Based Focal-Plane Arrays for Short-Wavelength Infrared Astronomy</atitle><jtitle>Journal of electronic materials</jtitle><stitle>Journal of Elec Materi</stitle><date>2008-09-01</date><risdate>2008</risdate><volume>37</volume><issue>9</issue><spage>1396</spage><epage>1400</epage><pages>1396-1400</pages><issn>0361-5235</issn><eissn>1543-186X</eissn><coden>JECMA5</coden><abstract>Removal of the CdZnTe substrate offers several performance benefits for near-infrared (NIR, 1.7
μ
m) and short-wave infrared (SWIR, 2.5
μ
m) focal-plane arrays (FPAs). Among these are visible wavelength detection, improved infrared sensitivity and uniformity, and greatly reduced susceptibility to the effects of ionizing radiation. Data for substrate-removed NIR FPAs fabricated for the Wide Field Camera 3 (WFC3) upgrade to the Hubble Space Telescope (HST) are presented, including detailed data from delivered units and summary trends for additional units. The WFC3 flight FPA is expected to improve discovery speed by 3.5–120× over current HST instruments. For SWIR FPAs, selected results are presented from the 16 megapixel mosaic delivered to Observatories of Carnegie Institution in Washington which serve as an example of the current state of the art.</abstract><cop>Boston</cop><pub>Springer US</pub><doi>10.1007/s11664-008-0421-8</doi><tpages>5</tpages></addata></record> |
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subjects | Applied sciences Astronomy Bolometer infrared, submillimeter wave, microwave and radiowave receivers and detectors Cadmium zinc telluride Characterization and Evaluation of Materials Chemistry and Materials Science Cross-disciplinary physics: materials science rheology Electronics Electronics and Microelectronics Exact sciences and technology Infrared, submillimeter wave, microwave and radiowave instruments, equipment and techniques Instrumentation Instruments, apparatus, components and techniques common to several branches of physics and astronomy Materials Science Mercury cadmium telluride Methods of deposition of films and coatings film growth and epitaxy Molecular beam epitaxy Molecular, atomic, ion, and chemical beam epitaxy Optical and Electronic Materials Optoelectronic devices Physics Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Solid State Physics Space telescopes Substrates |
title | Substrate-Removed HgCdTe-Based Focal-Plane Arrays for Short-Wavelength Infrared Astronomy |
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