Applying secondary ion mass spectrometry to the analysis of elements in goblet cells of conjunctiva

We investigated the location of elements in the goblet cells of rat conjunctiva by analyzing ion images produced by secondary ion mass spectrometry (SIMS) and comparing them with those produced by energy dispersive X‐ray analyser (EDX). Conjunctivas of normal Spraque‐Dawley rats were quenched in pro...

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Veröffentlicht in:	Journal of Electron Microscopy 2001-08, Vol.50 (4), p.325-332
Hauptverfasser:	Oba, Keisuke, Gong, Huaqing, Amemiya, Tsugio, Baba, Koumei, Takaya, Kenichi
Format:	Artikel
Sprache:	eng
Schlagworte:	Animals conjunctiva Conjunctiva - chemistry Conjunctiva - cytology Elements Energy dispersive X goblet cell Goblet Cells - chemistry Goblet Cells - cytology Microscopy, Electron, Scanning Rats Rats, Sprague-Dawley ray analyser secondary ion mass spectrometry Spectrometry, Mass, Secondary Ion - methods Spectrum Analysis X-Rays
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