Analysis of magnetic microstructure in MRAM bits by electron holography and Lorentz microscopy

Magnetic flux and magnetic domain structure in fabricated MRAM bits were observed by an electron holography technique under the residual magnetic field

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Veröffentlicht in:Journal of electron microscopy 2006-01, Vol.55 (1), p.17-21
Hauptverfasser: Park, Jong-Bong, Park, Gyeong-Su, Song, In-Yong, Bae, Jun-Soo, Lee, Jang-Eun, Yoo, Jeong-Ho, Murakami, Yasukazu, Shindo, Daisuke
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Sprache:eng
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Zusammenfassung:Magnetic flux and magnetic domain structure in fabricated MRAM bits were observed by an electron holography technique under the residual magnetic field
ISSN:0022-0744
1477-9986
2050-5701
DOI:10.1093/jmicro/dfl007