A high voltage computer controlled experimental system for the investigation of amorphous semiconductors as image sensors
This paper describes an ongoing programme of work designed to investigate dark discharge and photoconductivity in amorphous semiconductors with a view to applying these materials to industrial optical process tomography (OPT). Extensive laboratory equipment has been developed to investigate the afor...
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| Veröffentlicht in: | Transactions of the Institute of Measurement and Control 2002-01, Vol.24 (4), p.303-332 |
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| Hauptverfasser: | , |
| Format: | Artikel |
| Sprache: | eng |
| Online-Zugang: | Volltext |
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