Analysis of thick brain sections by obverse—Reverse computer microscopy: Application of a new, high clarity Golgi—Nissl stain

Exceptionally clear Golgi—Nissl sections of 300 μm thickness have been morphometrically studied by light microscopy using oil immersion objectives. The clarity results from a new variation of a staining procedure that combines Golgi and Nissl images in one section. A viewing technique has been devel...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of neuroscience methods 1981-08, Vol.4 (2), p.117-125
Hauptverfasser: Glaser, Edmund M., Van der Loos, Hendrik
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Exceptionally clear Golgi—Nissl sections of 300 μm thickness have been morphometrically studied by light microscopy using oil immersion objectives. The clarity results from a new variation of a staining procedure that combines Golgi and Nissl images in one section. A viewing technique has been developed that permits a histologic preparation to be examined from its obverse (or normally viewed) side and its reverse (or under) side. The technique was designed for use with a computer microscope but can be employed with any light microscope whose stage position can be measured within 100 μm. Sections thicker than 300 μm can be studied dependent on the working distance of the objective lens, provided that the clarity of the material permits it.
ISSN:0165-0270
1872-678X
DOI:10.1016/0165-0270(81)90045-5