Direct measurement of refractive-index dispersion of transparent media by white-light interferometry

Direct measurement of refractive-index dispersion of transparent media by white-light interferometry

We report on a technique for measuring the refractive indices of nonabsorbing media over a broad spectral range from 0.5 to 5 microm. White-light interferometry based on a double-interferometer system consisting of a fixed Mach-Zehnder interferometer and a Fourier-transform spectrometer is used for...

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Veröffentlicht in:Applied Optics 2003-07, Vol.42 (19), p.3910-3914
Hauptverfasser: Galli, Matteo, Marabelli, Franco, Guizzetti, Giorgio
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container_title Applied Optics
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creator Galli, Matteo
Marabelli, Franco
Guizzetti, Giorgio
description We report on a technique for measuring the refractive indices of nonabsorbing media over a broad spectral range from 0.5 to 5 microm. White-light interferometry based on a double-interferometer system consisting of a fixed Mach-Zehnder interferometer and a Fourier-transform spectrometer is used for direct measurement of the absolute rotation-dependent phase shift induced by an optical element. Refractive index n(lambda) over the whole investigated spectral range is thus obtained directly to an accuracy of 10(-4) without the need for any specific assumption about dispersion. Results for synthetic fused silica are presented and discussed.
doi_str_mv 10.1364/ao.42.003910
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_73476770</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>73476770</sourcerecordid><originalsourceid>FETCH-LOGICAL-c353t-c84162d7252b25e1d1c03928e7f2aa3b45ed21681408a43f56a8bb940c94316e3</originalsourceid><addsrcrecordid>eNpFkEtLxDAURoMojo7uXEtXrsyYZ5suh_EJA7NRcBfS9NaJ9GWSqvPvbZkBV_dy7-GD8yF0RcmC8lTcmW4h2IIQnlNyhM6o5DkWkrHjaZc5pky9z9B5CJ8jI0WenaLZeEuV4uQMlffOg41JAyYMHhpoY9JViYfKGxvdN2DXlvCblC704IPr2ukdvWlDb_xEN1A6kxS75GfrIuDafWxj4toIvgLfNRD97gKdVKYOcHmYc_T2-PC6esbrzdPLarnGlksesVWCpqzMmGQFk0BLakcrpiCrmDG8EBJKRlNFBVFG8EqmRhVFLojNBacp8Dm62ef2vvsaIETduGChrk0L3RB0xkWWZhkZwds9aH0Xwiire-8a43eaEj21qpcbLZjetzri14fcoRh1_-FDjfwPQjNzug</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>73476770</pqid></control><display><type>article</type><title>Direct measurement of refractive-index dispersion of transparent media by white-light interferometry</title><source>Alma/SFX Local Collection</source><source>Optica Publishing Group Journals</source><creator>Galli, Matteo ; Marabelli, Franco ; Guizzetti, Giorgio</creator><creatorcontrib>Galli, Matteo ; Marabelli, Franco ; Guizzetti, Giorgio</creatorcontrib><description>We report on a technique for measuring the refractive indices of nonabsorbing media over a broad spectral range from 0.5 to 5 microm. White-light interferometry based on a double-interferometer system consisting of a fixed Mach-Zehnder interferometer and a Fourier-transform spectrometer is used for direct measurement of the absolute rotation-dependent phase shift induced by an optical element. Refractive index n(lambda) over the whole investigated spectral range is thus obtained directly to an accuracy of 10(-4) without the need for any specific assumption about dispersion. Results for synthetic fused silica are presented and discussed.</description><identifier>ISSN: 1559-128X</identifier><identifier>ISSN: 0003-6935</identifier><identifier>EISSN: 1539-4522</identifier><identifier>DOI: 10.1364/ao.42.003910</identifier><identifier>PMID: 12868830</identifier><language>eng</language><publisher>United States</publisher><ispartof>Applied Optics, 2003-07, Vol.42 (19), p.3910-3914</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c353t-c84162d7252b25e1d1c03928e7f2aa3b45ed21681408a43f56a8bb940c94316e3</citedby><cites>FETCH-LOGICAL-c353t-c84162d7252b25e1d1c03928e7f2aa3b45ed21681408a43f56a8bb940c94316e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27903,27904</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/12868830$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Galli, Matteo</creatorcontrib><creatorcontrib>Marabelli, Franco</creatorcontrib><creatorcontrib>Guizzetti, Giorgio</creatorcontrib><title>Direct measurement of refractive-index dispersion of transparent media by white-light interferometry</title><title>Applied Optics</title><addtitle>Appl Opt</addtitle><description>We report on a technique for measuring the refractive indices of nonabsorbing media over a broad spectral range from 0.5 to 5 microm. White-light interferometry based on a double-interferometer system consisting of a fixed Mach-Zehnder interferometer and a Fourier-transform spectrometer is used for direct measurement of the absolute rotation-dependent phase shift induced by an optical element. Refractive index n(lambda) over the whole investigated spectral range is thus obtained directly to an accuracy of 10(-4) without the need for any specific assumption about dispersion. Results for synthetic fused silica are presented and discussed.</description><issn>1559-128X</issn><issn>0003-6935</issn><issn>1539-4522</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2003</creationdate><recordtype>article</recordtype><recordid>eNpFkEtLxDAURoMojo7uXEtXrsyYZ5suh_EJA7NRcBfS9NaJ9GWSqvPvbZkBV_dy7-GD8yF0RcmC8lTcmW4h2IIQnlNyhM6o5DkWkrHjaZc5pky9z9B5CJ8jI0WenaLZeEuV4uQMlffOg41JAyYMHhpoY9JViYfKGxvdN2DXlvCblC704IPr2ukdvWlDb_xEN1A6kxS75GfrIuDafWxj4toIvgLfNRD97gKdVKYOcHmYc_T2-PC6esbrzdPLarnGlksesVWCpqzMmGQFk0BLakcrpiCrmDG8EBJKRlNFBVFG8EqmRhVFLojNBacp8Dm62ef2vvsaIETduGChrk0L3RB0xkWWZhkZwds9aH0Xwiire-8a43eaEj21qpcbLZjetzri14fcoRh1_-FDjfwPQjNzug</recordid><startdate>20030701</startdate><enddate>20030701</enddate><creator>Galli, Matteo</creator><creator>Marabelli, Franco</creator><creator>Guizzetti, Giorgio</creator><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>20030701</creationdate><title>Direct measurement of refractive-index dispersion of transparent media by white-light interferometry</title><author>Galli, Matteo ; Marabelli, Franco ; Guizzetti, Giorgio</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c353t-c84162d7252b25e1d1c03928e7f2aa3b45ed21681408a43f56a8bb940c94316e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2003</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Galli, Matteo</creatorcontrib><creatorcontrib>Marabelli, Franco</creatorcontrib><creatorcontrib>Guizzetti, Giorgio</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Applied Optics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Galli, Matteo</au><au>Marabelli, Franco</au><au>Guizzetti, Giorgio</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Direct measurement of refractive-index dispersion of transparent media by white-light interferometry</atitle><jtitle>Applied Optics</jtitle><addtitle>Appl Opt</addtitle><date>2003-07-01</date><risdate>2003</risdate><volume>42</volume><issue>19</issue><spage>3910</spage><epage>3914</epage><pages>3910-3914</pages><issn>1559-128X</issn><issn>0003-6935</issn><eissn>1539-4522</eissn><abstract>We report on a technique for measuring the refractive indices of nonabsorbing media over a broad spectral range from 0.5 to 5 microm. White-light interferometry based on a double-interferometer system consisting of a fixed Mach-Zehnder interferometer and a Fourier-transform spectrometer is used for direct measurement of the absolute rotation-dependent phase shift induced by an optical element. Refractive index n(lambda) over the whole investigated spectral range is thus obtained directly to an accuracy of 10(-4) without the need for any specific assumption about dispersion. Results for synthetic fused silica are presented and discussed.</abstract><cop>United States</cop><pmid>12868830</pmid><doi>10.1364/ao.42.003910</doi><tpages>5</tpages></addata></record>
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0003-6935
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title Direct measurement of refractive-index dispersion of transparent media by white-light interferometry
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-27T12%3A16%3A13IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Direct%20measurement%20of%20refractive-index%20dispersion%20of%20transparent%20media%20by%20white-light%20interferometry&rft.jtitle=Applied%20Optics&rft.au=Galli,%20Matteo&rft.date=2003-07-01&rft.volume=42&rft.issue=19&rft.spage=3910&rft.epage=3914&rft.pages=3910-3914&rft.issn=1559-128X&rft.eissn=1539-4522&rft_id=info:doi/10.1364/ao.42.003910&rft_dat=%3Cproquest_cross%3E73476770%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=73476770&rft_id=info:pmid/12868830&rfr_iscdi=true