Testing the radiometric accuracy of Fourier transform infrared transmittance measurements

Testing the radiometric accuracy of Fourier transform infrared transmittance measurements

We have investigated the ordinate scale accuracy of ambient temperature transmittance measurements made with a Fourier transform infrared (FT-IR) spectrophotometer over the wavelength range of 2-10 mum. Two approaches are used: (1) measurements of Si wafers whose index of refraction are well known f...

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Veröffentlicht in:Applied Optics 1997-12, Vol.36 (34), p.8896-8908
Hauptverfasser: Kaplan, S G, Hanssen, L M, Datla, R U
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creator Kaplan, S G
Hanssen, L M
Datla, R U
description We have investigated the ordinate scale accuracy of ambient temperature transmittance measurements made with a Fourier transform infrared (FT-IR) spectrophotometer over the wavelength range of 2-10 mum. Two approaches are used: (1) measurements of Si wafers whose index of refraction are well known from 2 to 5 mum, in which case the FT-IR result is compared with calculated values; (2) comparison of FT-IR and laser transmittance measurements at 3.39 and 10.6 mum on nominally neutral-density filters that are free of etaloning effects. Various schemes are employed to estimate and reduce systematic error sources in both the FT-IR and laser measurements, and quantitative uncertainty analyses are performed.
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title Testing the radiometric accuracy of Fourier transform infrared transmittance measurements
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