Measurement of the optical functions of uniaxial materials by two-modulator generalized ellipsometry: rutile (TiO(2))

Measurement of the optical functions of uniaxial materials by two-modulator generalized ellipsometry: rutile (TiO(2))

Two-modulator generalized ellipsometry is applied to determination of the optical functions of uniaxial rutile. For a nondepolarizing sample the two-modulator generalized ellipsometer determines all the elements of the normalized Jones matrix with one measurement and thereby totally characterizes li...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Optics Letters 1997-12, Vol.22 (23), p.1808-1810
Hauptverfasser: Jellison, Jr, G E, Modine, F A, Boatner, L A
Format: Artikel
Sprache:eng
Schlagworte:
ELLIPSOMETRY
MATERIALS SCIENCE
OPTICAL PROPERTIES
PHYSICS
RUTILE
TITANIUM OXIDES
ULTRAVIOLET SPECTRA
VISIBLE SPECTRA
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 1810
container_issue 23
container_start_page 1808
container_title Optics Letters
container_volume 22
creator Jellison, Jr, G E
Modine, F A
Boatner, L A
description Two-modulator generalized ellipsometry is applied to determination of the optical functions of uniaxial rutile. For a nondepolarizing sample the two-modulator generalized ellipsometer determines all the elements of the normalized Jones matrix with one measurement and thereby totally characterizes light reflecting from the sample. If a uniaxial crystal is appropriately aligned, then determining its optical functions requires only a single measurement. We have used this new instrument to obtain optical functions of rutile that are the most accurate available for optical energies above the band edge.
doi_str_mv 10.1364/ol.22.001808
format Article
fullrecord <record><control><sourceid>proquest_osti_</sourceid><recordid>TN_cdi_proquest_miscellaneous_734226628</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>734226628</sourcerecordid><originalsourceid>FETCH-LOGICAL-c380t-a071f6892ed1c3735823dbceae4dfd41b2e5822b6bf9b42d771784744db6f1fc3</originalsourceid><addsrcrecordid>eNpFkUuLFDEUhYMoTs_ozrXElTNgtXlVknIngy9o6c24DqnkxolUVdo80PbXTw3d4Opezv04HO5B6BUlW8qleJ-mLWNbQqgm-gna0J4PnVCDeIo2hArZDf3ALtBlKb8IIVJx_hxdUE215opvUPsOtrQMMywVp4DrPeB0qNHZCYe2uBrTUh4PbYn2b1zV2VbI61LweMT1T-rm5Ntka8r4JyyQ7RT_gccwTfFQ0gw1Hz_g3GqcAF_fxf01u7l5gZ6F1QFenucV-vH5093t1263__Lt9uOuc1yT2lmiaJB6YOCpW-P2mnE_OrAgfPCCjgxWiY1yDMMomFeKKi2UEH6UgQbHr9Cbk28qNZriYgV379KygKumlz2lamXenphDTr8blGrmWNwa3y6QWjGKC8akZHol351Il1MpGYI55DjbfDSUmMcuzH5nGDOnLlb89dm4jTP4__D5-fwBoXqFqQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>734226628</pqid></control><display><type>article</type><title>Measurement of the optical functions of uniaxial materials by two-modulator generalized ellipsometry: rutile (TiO(2))</title><source>Optica Publishing Group Journals</source><creator>Jellison, Jr, G E ; Modine, F A ; Boatner, L A</creator><creatorcontrib>Jellison, Jr, G E ; Modine, F A ; Boatner, L A ; Oak Ridge National Laboratory</creatorcontrib><description>Two-modulator generalized ellipsometry is applied to determination of the optical functions of uniaxial rutile. For a nondepolarizing sample the two-modulator generalized ellipsometer determines all the elements of the normalized Jones matrix with one measurement and thereby totally characterizes light reflecting from the sample. If a uniaxial crystal is appropriately aligned, then determining its optical functions requires only a single measurement. We have used this new instrument to obtain optical functions of rutile that are the most accurate available for optical energies above the band edge.</description><identifier>ISSN: 0146-9592</identifier><identifier>EISSN: 1539-4794</identifier><identifier>DOI: 10.1364/ol.22.001808</identifier><identifier>PMID: 18188373</identifier><language>eng</language><publisher>United States</publisher><subject>ELLIPSOMETRY ; MATERIALS SCIENCE ; OPTICAL PROPERTIES ; PHYSICS ; RUTILE ; TITANIUM OXIDES ; ULTRAVIOLET SPECTRA ; VISIBLE SPECTRA</subject><ispartof>Optics Letters, 1997-12, Vol.22 (23), p.1808-1810</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c380t-a071f6892ed1c3735823dbceae4dfd41b2e5822b6bf9b42d771784744db6f1fc3</citedby><cites>FETCH-LOGICAL-c380t-a071f6892ed1c3735823dbceae4dfd41b2e5822b6bf9b42d771784744db6f1fc3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,881,3244,27903,27904</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/18188373$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink><backlink>$$Uhttps://www.osti.gov/biblio/565117$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Jellison, Jr, G E</creatorcontrib><creatorcontrib>Modine, F A</creatorcontrib><creatorcontrib>Boatner, L A</creatorcontrib><creatorcontrib>Oak Ridge National Laboratory</creatorcontrib><title>Measurement of the optical functions of uniaxial materials by two-modulator generalized ellipsometry: rutile (TiO(2))</title><title>Optics Letters</title><addtitle>Opt Lett</addtitle><description>Two-modulator generalized ellipsometry is applied to determination of the optical functions of uniaxial rutile. For a nondepolarizing sample the two-modulator generalized ellipsometer determines all the elements of the normalized Jones matrix with one measurement and thereby totally characterizes light reflecting from the sample. If a uniaxial crystal is appropriately aligned, then determining its optical functions requires only a single measurement. We have used this new instrument to obtain optical functions of rutile that are the most accurate available for optical energies above the band edge.</description><subject>ELLIPSOMETRY</subject><subject>MATERIALS SCIENCE</subject><subject>OPTICAL PROPERTIES</subject><subject>PHYSICS</subject><subject>RUTILE</subject><subject>TITANIUM OXIDES</subject><subject>ULTRAVIOLET SPECTRA</subject><subject>VISIBLE SPECTRA</subject><issn>0146-9592</issn><issn>1539-4794</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1997</creationdate><recordtype>article</recordtype><recordid>eNpFkUuLFDEUhYMoTs_ozrXElTNgtXlVknIngy9o6c24DqnkxolUVdo80PbXTw3d4Opezv04HO5B6BUlW8qleJ-mLWNbQqgm-gna0J4PnVCDeIo2hArZDf3ALtBlKb8IIVJx_hxdUE215opvUPsOtrQMMywVp4DrPeB0qNHZCYe2uBrTUh4PbYn2b1zV2VbI61LweMT1T-rm5Ntka8r4JyyQ7RT_gccwTfFQ0gw1Hz_g3GqcAF_fxf01u7l5gZ6F1QFenucV-vH5093t1263__Lt9uOuc1yT2lmiaJB6YOCpW-P2mnE_OrAgfPCCjgxWiY1yDMMomFeKKi2UEH6UgQbHr9Cbk28qNZriYgV379KygKumlz2lamXenphDTr8blGrmWNwa3y6QWjGKC8akZHol351Il1MpGYI55DjbfDSUmMcuzH5nGDOnLlb89dm4jTP4__D5-fwBoXqFqQ</recordid><startdate>19971201</startdate><enddate>19971201</enddate><creator>Jellison, Jr, G E</creator><creator>Modine, F A</creator><creator>Boatner, L A</creator><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope><scope>OTOTI</scope></search><sort><creationdate>19971201</creationdate><title>Measurement of the optical functions of uniaxial materials by two-modulator generalized ellipsometry: rutile (TiO(2))</title><author>Jellison, Jr, G E ; Modine, F A ; Boatner, L A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c380t-a071f6892ed1c3735823dbceae4dfd41b2e5822b6bf9b42d771784744db6f1fc3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1997</creationdate><topic>ELLIPSOMETRY</topic><topic>MATERIALS SCIENCE</topic><topic>OPTICAL PROPERTIES</topic><topic>PHYSICS</topic><topic>RUTILE</topic><topic>TITANIUM OXIDES</topic><topic>ULTRAVIOLET SPECTRA</topic><topic>VISIBLE SPECTRA</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Jellison, Jr, G E</creatorcontrib><creatorcontrib>Modine, F A</creatorcontrib><creatorcontrib>Boatner, L A</creatorcontrib><creatorcontrib>Oak Ridge National Laboratory</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><collection>OSTI.GOV</collection><jtitle>Optics Letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Jellison, Jr, G E</au><au>Modine, F A</au><au>Boatner, L A</au><aucorp>Oak Ridge National Laboratory</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Measurement of the optical functions of uniaxial materials by two-modulator generalized ellipsometry: rutile (TiO(2))</atitle><jtitle>Optics Letters</jtitle><addtitle>Opt Lett</addtitle><date>1997-12-01</date><risdate>1997</risdate><volume>22</volume><issue>23</issue><spage>1808</spage><epage>1810</epage><pages>1808-1810</pages><issn>0146-9592</issn><eissn>1539-4794</eissn><abstract>Two-modulator generalized ellipsometry is applied to determination of the optical functions of uniaxial rutile. For a nondepolarizing sample the two-modulator generalized ellipsometer determines all the elements of the normalized Jones matrix with one measurement and thereby totally characterizes light reflecting from the sample. If a uniaxial crystal is appropriately aligned, then determining its optical functions requires only a single measurement. We have used this new instrument to obtain optical functions of rutile that are the most accurate available for optical energies above the band edge.</abstract><cop>United States</cop><pmid>18188373</pmid><doi>10.1364/ol.22.001808</doi><tpages>3</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0146-9592
ispartof Optics Letters, 1997-12, Vol.22 (23), p.1808-1810
issn 0146-9592
1539-4794
language eng
recordid cdi_proquest_miscellaneous_734226628
source Optica Publishing Group Journals
subjects ELLIPSOMETRY
MATERIALS SCIENCE
OPTICAL PROPERTIES
PHYSICS
RUTILE
TITANIUM OXIDES
ULTRAVIOLET SPECTRA
VISIBLE SPECTRA
title Measurement of the optical functions of uniaxial materials by two-modulator generalized ellipsometry: rutile (TiO(2))
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-23T02%3A38%3A04IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_osti_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Measurement%20of%20the%20optical%20functions%20of%20uniaxial%20materials%20by%20two-modulator%20generalized%20ellipsometry:%20rutile%20(TiO(2))&rft.jtitle=Optics%20Letters&rft.au=Jellison,%20Jr,%20G%20E&rft.aucorp=Oak%20Ridge%20National%20Laboratory&rft.date=1997-12-01&rft.volume=22&rft.issue=23&rft.spage=1808&rft.epage=1810&rft.pages=1808-1810&rft.issn=0146-9592&rft.eissn=1539-4794&rft_id=info:doi/10.1364/ol.22.001808&rft_dat=%3Cproquest_osti_%3E734226628%3C/proquest_osti_%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=734226628&rft_id=info:pmid/18188373&rfr_iscdi=true