Computer simulation of schlieren images of rotationally symmetric plasma systems: a simple method
Schlieren techniques are commonly used methods for quantitative analysis of cylindrical or spherical index of refraction profiles. Many schlieren objects, however, are characterized by more complex geometries, so we have investigated the more general case of noncylindrical, rotationally symmetric di...
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| Veröffentlicht in: | Appl. Opt.; (United States) 1986-03, Vol.25 (5), p.769-774 |
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| container_title | Appl. Opt.; (United States) |
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| creator | NOLL, R HAAS, C. R WEIKL, B HERZIGER, G |
| description | Schlieren techniques are commonly used methods for quantitative analysis of cylindrical or spherical index of refraction profiles. Many schlieren objects, however, are characterized by more complex geometries, so we have investigated the more general case of noncylindrical, rotationally symmetric distributions of index of refraction n(r,z). Assuming straight ray paths in the schlieren object we have calculated 2-D beam deviation profiles. It is shown that experimental schlieren images of the noncylindrical plasma generated by a plasma focus device can be simulated with these deviation profiles. The computer simulation allows a quantitative analysis of these schlieren images, which yields, for example, the plasma parameters, electron density, and electron density gradients. |
| doi_str_mv | 10.1364/AO.25.000769 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_osti_</sourceid><recordid>TN_cdi_proquest_miscellaneous_734185998</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>734185998</sourcerecordid><originalsourceid>FETCH-LOGICAL-c321t-d60e86d4a3dd644a58f64238f2174b1bbb1cedff3b64554a4a93739af5b140223</originalsourceid><addsrcrecordid>eNqN0U2r1DAUBuAginfu1Z1rKSK6sWO-27gbhusHXJiNrkOaJk4kbWpOuph_b8YZdCeuAuc8vIHzIvSC4C1hkr_fHbZUbDHGnVSP0IYIplouKH2MNnXIWqmYuEG3AD8wJrSX6im6IT1lhHK1QWafpmUtLjcQpjWaEtLcJN-APcbgspubMJnvDs6znMrvvYnx1MBpmlzJwTZLNDCZOoDiJvjQmHPUEl1T98c0PkNPvIngnl_fO_Tt4_3X_ef24fDpy3730FpGSWlHiV0vR27YOErOjei95JT1npKOD2QYBmLd6D0bJBeCG24U65gyXgyEY0rZHXp1yU1QggYbirNHm-bZ2aJlvQQlsqK3F7Tk9HN1UPQUwLoYzezSCrpjnPRCqb7KN_-UlCnFqDr_--4CbU4A2Xm95HqzfNIE63NDenfQVOhLQ5W_vOauw-TGv_haSQWvr8CANdFnM9sAf1xPsOhw9x8MYy7YL5dApN0</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>23993292</pqid></control><display><type>article</type><title>Computer simulation of schlieren images of rotationally symmetric plasma systems: a simple method</title><source>Alma/SFX Local Collection</source><source>Optica Publishing Group Journals</source><creator>NOLL, R ; HAAS, C. R ; WEIKL, B ; HERZIGER, G</creator><creatorcontrib>NOLL, R ; HAAS, C. R ; WEIKL, B ; HERZIGER, G ; Fraunhofer Institut fuer Laser-technik, Drosselweg 87, D-5100 Aachen, Federal Republic of Germany</creatorcontrib><description>Schlieren techniques are commonly used methods for quantitative analysis of cylindrical or spherical index of refraction profiles. Many schlieren objects, however, are characterized by more complex geometries, so we have investigated the more general case of noncylindrical, rotationally symmetric distributions of index of refraction n(r,z). Assuming straight ray paths in the schlieren object we have calculated 2-D beam deviation profiles. It is shown that experimental schlieren images of the noncylindrical plasma generated by a plasma focus device can be simulated with these deviation profiles. The computer simulation allows a quantitative analysis of these schlieren images, which yields, for example, the plasma parameters, electron density, and electron density gradients.</description><identifier>ISSN: 0003-6935</identifier><identifier>ISSN: 1559-128X</identifier><identifier>EISSN: 1539-4522</identifier><identifier>DOI: 10.1364/AO.25.000769</identifier><identifier>PMID: 18231249</identifier><identifier>CODEN: APOPAI</identifier><language>eng</language><publisher>Washington, DC: Optical Society of America</publisher><subject>70 PLASMA PHYSICS AND FUSION TECHNOLOGY ; 700102 - Fusion Energy- Plasma Research- Diagnostics ; Applied sciences ; COMPUTERIZED SIMULATION ; ELECTRON DENSITY ; Exact sciences and technology ; GEOMETRY ; MATHEMATICS ; OPTICAL PROPERTIES ; Other techniques and industries ; PHOTOGRAPHY ; PHYSICAL PROPERTIES ; Physics ; Physics of gases, plasmas and electric discharges ; Physics of plasmas and electric discharges ; Plasma diagnostic techniques and instrumentation ; PLASMA DIAGNOSTICS ; REFRACTIVITY ; SCHLIEREN METHOD ; SIMULATION</subject><ispartof>Appl. Opt.; (United States), 1986-03, Vol.25 (5), p.769-774</ispartof><rights>1987 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c321t-d60e86d4a3dd644a58f64238f2174b1bbb1cedff3b64554a4a93739af5b140223</citedby><cites>FETCH-LOGICAL-c321t-d60e86d4a3dd644a58f64238f2174b1bbb1cedff3b64554a4a93739af5b140223</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,778,782,883,27911,27912</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=8100045$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=8105707$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/18231249$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink><backlink>$$Uhttps://www.osti.gov/biblio/6003216$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>NOLL, R</creatorcontrib><creatorcontrib>HAAS, C. R</creatorcontrib><creatorcontrib>WEIKL, B</creatorcontrib><creatorcontrib>HERZIGER, G</creatorcontrib><creatorcontrib>Fraunhofer Institut fuer Laser-technik, Drosselweg 87, D-5100 Aachen, Federal Republic of Germany</creatorcontrib><title>Computer simulation of schlieren images of rotationally symmetric plasma systems: a simple method</title><title>Appl. Opt.; (United States)</title><addtitle>Appl Opt</addtitle><description>Schlieren techniques are commonly used methods for quantitative analysis of cylindrical or spherical index of refraction profiles. Many schlieren objects, however, are characterized by more complex geometries, so we have investigated the more general case of noncylindrical, rotationally symmetric distributions of index of refraction n(r,z). Assuming straight ray paths in the schlieren object we have calculated 2-D beam deviation profiles. It is shown that experimental schlieren images of the noncylindrical plasma generated by a plasma focus device can be simulated with these deviation profiles. The computer simulation allows a quantitative analysis of these schlieren images, which yields, for example, the plasma parameters, electron density, and electron density gradients.</description><subject>70 PLASMA PHYSICS AND FUSION TECHNOLOGY</subject><subject>700102 - Fusion Energy- Plasma Research- Diagnostics</subject><subject>Applied sciences</subject><subject>COMPUTERIZED SIMULATION</subject><subject>ELECTRON DENSITY</subject><subject>Exact sciences and technology</subject><subject>GEOMETRY</subject><subject>MATHEMATICS</subject><subject>OPTICAL PROPERTIES</subject><subject>Other techniques and industries</subject><subject>PHOTOGRAPHY</subject><subject>PHYSICAL PROPERTIES</subject><subject>Physics</subject><subject>Physics of gases, plasmas and electric discharges</subject><subject>Physics of plasmas and electric discharges</subject><subject>Plasma diagnostic techniques and instrumentation</subject><subject>PLASMA DIAGNOSTICS</subject><subject>REFRACTIVITY</subject><subject>SCHLIEREN METHOD</subject><subject>SIMULATION</subject><issn>0003-6935</issn><issn>1559-128X</issn><issn>1539-4522</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1986</creationdate><recordtype>article</recordtype><recordid>eNqN0U2r1DAUBuAginfu1Z1rKSK6sWO-27gbhusHXJiNrkOaJk4kbWpOuph_b8YZdCeuAuc8vIHzIvSC4C1hkr_fHbZUbDHGnVSP0IYIplouKH2MNnXIWqmYuEG3AD8wJrSX6im6IT1lhHK1QWafpmUtLjcQpjWaEtLcJN-APcbgspubMJnvDs6znMrvvYnx1MBpmlzJwTZLNDCZOoDiJvjQmHPUEl1T98c0PkNPvIngnl_fO_Tt4_3X_ef24fDpy3730FpGSWlHiV0vR27YOErOjei95JT1npKOD2QYBmLd6D0bJBeCG24U65gyXgyEY0rZHXp1yU1QggYbirNHm-bZ2aJlvQQlsqK3F7Tk9HN1UPQUwLoYzezSCrpjnPRCqb7KN_-UlCnFqDr_--4CbU4A2Xm95HqzfNIE63NDenfQVOhLQ5W_vOauw-TGv_haSQWvr8CANdFnM9sAf1xPsOhw9x8MYy7YL5dApN0</recordid><startdate>19860301</startdate><enddate>19860301</enddate><creator>NOLL, R</creator><creator>HAAS, C. R</creator><creator>WEIKL, B</creator><creator>HERZIGER, G</creator><general>Optical Society of America</general><scope>IQODW</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>7X8</scope><scope>OTOTI</scope></search><sort><creationdate>19860301</creationdate><title>Computer simulation of schlieren images of rotationally symmetric plasma systems: a simple method</title><author>NOLL, R ; HAAS, C. R ; WEIKL, B ; HERZIGER, G</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c321t-d60e86d4a3dd644a58f64238f2174b1bbb1cedff3b64554a4a93739af5b140223</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1986</creationdate><topic>70 PLASMA PHYSICS AND FUSION TECHNOLOGY</topic><topic>700102 - Fusion Energy- Plasma Research- Diagnostics</topic><topic>Applied sciences</topic><topic>COMPUTERIZED SIMULATION</topic><topic>ELECTRON DENSITY</topic><topic>Exact sciences and technology</topic><topic>GEOMETRY</topic><topic>MATHEMATICS</topic><topic>OPTICAL PROPERTIES</topic><topic>Other techniques and industries</topic><topic>PHOTOGRAPHY</topic><topic>PHYSICAL PROPERTIES</topic><topic>Physics</topic><topic>Physics of gases, plasmas and electric discharges</topic><topic>Physics of plasmas and electric discharges</topic><topic>Plasma diagnostic techniques and instrumentation</topic><topic>PLASMA DIAGNOSTICS</topic><topic>REFRACTIVITY</topic><topic>SCHLIEREN METHOD</topic><topic>SIMULATION</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>NOLL, R</creatorcontrib><creatorcontrib>HAAS, C. R</creatorcontrib><creatorcontrib>WEIKL, B</creatorcontrib><creatorcontrib>HERZIGER, G</creatorcontrib><creatorcontrib>Fraunhofer Institut fuer Laser-technik, Drosselweg 87, D-5100 Aachen, Federal Republic of Germany</creatorcontrib><collection>Pascal-Francis</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>MEDLINE - Academic</collection><collection>OSTI.GOV</collection><jtitle>Appl. Opt.; (United States)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>NOLL, R</au><au>HAAS, C. R</au><au>WEIKL, B</au><au>HERZIGER, G</au><aucorp>Fraunhofer Institut fuer Laser-technik, Drosselweg 87, D-5100 Aachen, Federal Republic of Germany</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Computer simulation of schlieren images of rotationally symmetric plasma systems: a simple method</atitle><jtitle>Appl. Opt.; (United States)</jtitle><addtitle>Appl Opt</addtitle><date>1986-03-01</date><risdate>1986</risdate><volume>25</volume><issue>5</issue><spage>769</spage><epage>774</epage><pages>769-774</pages><issn>0003-6935</issn><issn>1559-128X</issn><eissn>1539-4522</eissn><coden>APOPAI</coden><abstract>Schlieren techniques are commonly used methods for quantitative analysis of cylindrical or spherical index of refraction profiles. Many schlieren objects, however, are characterized by more complex geometries, so we have investigated the more general case of noncylindrical, rotationally symmetric distributions of index of refraction n(r,z). Assuming straight ray paths in the schlieren object we have calculated 2-D beam deviation profiles. It is shown that experimental schlieren images of the noncylindrical plasma generated by a plasma focus device can be simulated with these deviation profiles. The computer simulation allows a quantitative analysis of these schlieren images, which yields, for example, the plasma parameters, electron density, and electron density gradients.</abstract><cop>Washington, DC</cop><pub>Optical Society of America</pub><pmid>18231249</pmid><doi>10.1364/AO.25.000769</doi><tpages>6</tpages></addata></record> |
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| ispartof | Appl. Opt.; (United States), 1986-03, Vol.25 (5), p.769-774 |
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| source | Alma/SFX Local Collection; Optica Publishing Group Journals |
| subjects | 70 PLASMA PHYSICS AND FUSION TECHNOLOGY 700102 - Fusion Energy- Plasma Research- Diagnostics Applied sciences COMPUTERIZED SIMULATION ELECTRON DENSITY Exact sciences and technology GEOMETRY MATHEMATICS OPTICAL PROPERTIES Other techniques and industries PHOTOGRAPHY PHYSICAL PROPERTIES Physics Physics of gases, plasmas and electric discharges Physics of plasmas and electric discharges Plasma diagnostic techniques and instrumentation PLASMA DIAGNOSTICS REFRACTIVITY SCHLIEREN METHOD SIMULATION |
| title | Computer simulation of schlieren images of rotationally symmetric plasma systems: a simple method |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-15T12%3A19%3A29IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_osti_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Computer%20simulation%20of%20schlieren%20images%20of%20rotationally%20symmetric%20plasma%20systems:%20a%20simple%20method&rft.jtitle=Appl.%20Opt.;%20(United%20States)&rft.au=NOLL,%20R&rft.aucorp=Fraunhofer%20Institut%20fuer%20Laser-technik,%20Drosselweg%2087,%20D-5100%20Aachen,%20Federal%20Republic%20of%20Germany&rft.date=1986-03-01&rft.volume=25&rft.issue=5&rft.spage=769&rft.epage=774&rft.pages=769-774&rft.issn=0003-6935&rft.eissn=1539-4522&rft.coden=APOPAI&rft_id=info:doi/10.1364/AO.25.000769&rft_dat=%3Cproquest_osti_%3E734185998%3C/proquest_osti_%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=23993292&rft_id=info:pmid/18231249&rfr_iscdi=true |