Molecular depth profiling of multilayer structures of organic semiconductor materials by secondary ion mass spectrometry with large argon cluster ion beams

In this study, we present molecular depth profiling of multilayer structures composed of organic semiconductor materials such as tris(8‐hydroxyquinoline)aluminum (Alq3) and 4,4′‐bis[N‐(1‐naphthyl)‐N‐phenylamino]biphenyl (NPD). Molecular ions produced from Alq3 and NPD were measured by linear‐type ti...

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Veröffentlicht in:	Rapid communications in mass spectrometry 2009-10, Vol.23 (20), p.3264-3268
Hauptverfasser:	Ninomiya, Satoshi, Ichiki, Kazuya, Yamada, Hideaki, Nakata, Yoshihiko, Seki, Toshio, Aoki, Takaaki, Matsuo, Jiro
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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