The new future of scanning probe microscopy: Combining atomic force microscopy with other surface-sensitive techniques, optical microscopy and fluorescence techniques

Atomic force microscopy (AFM) is in its thirties and has become an invaluable tool for studying the micro- and nanoworlds. As a stand-alone, high-resolution imaging technique and force transducer, it defies most other surface instrumentation in ease of use, sensitivity and versatility. Still, the te...

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Veröffentlicht in:	Nanoscale 2009-10, Vol.1 (1), p.40-49
Hauptverfasser:	Moreno Flores, Susana, Toca-Herrera, José L
Format:	Artikel
Sprache:	eng
Schlagworte:	Animals Fibroblasts Mice Microscopy, Atomic Force Microscopy, Fluorescence Microscopy, Scanning Probe Optics and Photonics Spectrum Analysis, Raman Surface Plasmon Resonance Surface Properties
Online-Zugang:	Volltext
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