Digital extraction of interference fringe contours

Two basic techniques for extracting interferogram contours have been discussed. The first is a global contour extracton technique based on the fast Fourier transform. The second extracts individual contours with a thinning algorithm using logical neighborhood transformations. (AIP)

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Veröffentlicht in:Appl. Opt.; (United States) 1985-06, Vol.24 (12), p.1727-1728
Hauptverfasser: MASTIN, G. A, GHIGLIA, D. C
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container_title Appl. Opt.; (United States)
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creator MASTIN, G. A
GHIGLIA, D. C
description Two basic techniques for extracting interferogram contours have been discussed. The first is a global contour extracton technique based on the fast Fourier transform. The second extracts individual contours with a thinning algorithm using logical neighborhood transformations. (AIP)
doi_str_mv 10.1364/AO.24.001727
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fullrecord <record><control><sourceid>proquest_osti_</sourceid><recordid>TN_cdi_proquest_miscellaneous_733942881</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>733942881</sourcerecordid><originalsourceid>FETCH-LOGICAL-c375t-beb42fe1b2147f253ee3b4928f8f0537e229ae5cc930c8ca24347c8c6648e6713</originalsourceid><addsrcrecordid>eNqF0D1LBDEQBuAgip6nnbUsIti4Z3byXR5-g3CN1iEbJxrZ29UkB_rvXbnT1mqmeHiZeQk5auisYZJfzBcz4DNKGwVqi0wawUzNBcA2mVBKWS0NE3tkP-e30YCWZpfsAeWcMqkmBK7iSyyuq_CzJOdLHPpqCFXsC6aACXuPVUixf8HKD30ZVikfkJ3guoyHmzklTzfXj5d39cPi9v5y_lB7pkSpW2w5BGxaaLgKIBgia7kBHXSggikEMA6F94ZRr70DzrgaFym5RqkaNiUn69whl2izjwX963hEj75YIbkaHxvR2Rq9p-FjhbnYZcweu871OKyyVYwZDlr_xJ2vpU9DzgmDfU9x6dKXbaj9adLOFxa4XTc58uNN8Kpd4vMf_q1uBKcb4LJ3XUiu9zH_OQNCC8r_Y1ozI6Rg3zBihZc</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>733942881</pqid></control><display><type>article</type><title>Digital extraction of interference fringe contours</title><source>Alma/SFX Local Collection</source><source>Optica Publishing Group Journals</source><creator>MASTIN, G. A ; GHIGLIA, D. C</creator><creatorcontrib>MASTIN, G. A ; GHIGLIA, D. C ; Sandia National Laboratories, Albuquerque, New Mexico 87185</creatorcontrib><description>Two basic techniques for extracting interferogram contours have been discussed. The first is a global contour extracton technique based on the fast Fourier transform. The second extracts individual contours with a thinning algorithm using logical neighborhood transformations. (AIP)</description><identifier>ISSN: 0003-6935</identifier><identifier>ISSN: 1559-128X</identifier><identifier>EISSN: 1539-4522</identifier><identifier>DOI: 10.1364/AO.24.001727</identifier><identifier>PMID: 20440367</identifier><identifier>CODEN: APOPAI</identifier><language>eng</language><publisher>Washington, DC: Optical Society of America</publisher><subject>440300 - Miscellaneous Instruments- (-1989) ; Applied sciences ; DIGITAL SYSTEMS ; Exact sciences and technology ; IMAGE PROCESSING ; Instruments, apparatus, components and techniques common to several branches of physics and astronomy ; Interferometers ; INTERFEROMETRY ; OPTICAL EQUIPMENT ; Optical instruments, equipment and techniques ; OTHER INSTRUMENTATION ; Other techniques and industries ; Physics ; PLASMA DIAGNOSTICS ; PROCESSING</subject><ispartof>Appl. Opt.; (United States), 1985-06, Vol.24 (12), p.1727-1728</ispartof><rights>1986 INIST-CNRS</rights><rights>1985 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c375t-beb42fe1b2147f253ee3b4928f8f0537e229ae5cc930c8ca24347c8c6648e6713</citedby><cites>FETCH-LOGICAL-c375t-beb42fe1b2147f253ee3b4928f8f0537e229ae5cc930c8ca24347c8c6648e6713</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,885,27923,27924</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=8839565$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=9258504$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/20440367$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink><backlink>$$Uhttps://www.osti.gov/biblio/5647935$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>MASTIN, G. A</creatorcontrib><creatorcontrib>GHIGLIA, D. C</creatorcontrib><creatorcontrib>Sandia National Laboratories, Albuquerque, New Mexico 87185</creatorcontrib><title>Digital extraction of interference fringe contours</title><title>Appl. Opt.; (United States)</title><addtitle>Appl Opt</addtitle><description>Two basic techniques for extracting interferogram contours have been discussed. The first is a global contour extracton technique based on the fast Fourier transform. The second extracts individual contours with a thinning algorithm using logical neighborhood transformations. (AIP)</description><subject>440300 - Miscellaneous Instruments- (-1989)</subject><subject>Applied sciences</subject><subject>DIGITAL SYSTEMS</subject><subject>Exact sciences and technology</subject><subject>IMAGE PROCESSING</subject><subject>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</subject><subject>Interferometers</subject><subject>INTERFEROMETRY</subject><subject>OPTICAL EQUIPMENT</subject><subject>Optical instruments, equipment and techniques</subject><subject>OTHER INSTRUMENTATION</subject><subject>Other techniques and industries</subject><subject>Physics</subject><subject>PLASMA DIAGNOSTICS</subject><subject>PROCESSING</subject><issn>0003-6935</issn><issn>1559-128X</issn><issn>1539-4522</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1985</creationdate><recordtype>article</recordtype><recordid>eNqF0D1LBDEQBuAgip6nnbUsIti4Z3byXR5-g3CN1iEbJxrZ29UkB_rvXbnT1mqmeHiZeQk5auisYZJfzBcz4DNKGwVqi0wawUzNBcA2mVBKWS0NE3tkP-e30YCWZpfsAeWcMqkmBK7iSyyuq_CzJOdLHPpqCFXsC6aACXuPVUixf8HKD30ZVikfkJ3guoyHmzklTzfXj5d39cPi9v5y_lB7pkSpW2w5BGxaaLgKIBgia7kBHXSggikEMA6F94ZRr70DzrgaFym5RqkaNiUn69whl2izjwX963hEj75YIbkaHxvR2Rq9p-FjhbnYZcweu871OKyyVYwZDlr_xJ2vpU9DzgmDfU9x6dKXbaj9adLOFxa4XTc58uNN8Kpd4vMf_q1uBKcb4LJ3XUiu9zH_OQNCC8r_Y1ozI6Rg3zBihZc</recordid><startdate>19850615</startdate><enddate>19850615</enddate><creator>MASTIN, G. A</creator><creator>GHIGLIA, D. C</creator><general>Optical Society of America</general><scope>IQODW</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope><scope>OTOTI</scope></search><sort><creationdate>19850615</creationdate><title>Digital extraction of interference fringe contours</title><author>MASTIN, G. A ; GHIGLIA, D. C</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c375t-beb42fe1b2147f253ee3b4928f8f0537e229ae5cc930c8ca24347c8c6648e6713</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1985</creationdate><topic>440300 - Miscellaneous Instruments- (-1989)</topic><topic>Applied sciences</topic><topic>DIGITAL SYSTEMS</topic><topic>Exact sciences and technology</topic><topic>IMAGE PROCESSING</topic><topic>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</topic><topic>Interferometers</topic><topic>INTERFEROMETRY</topic><topic>OPTICAL EQUIPMENT</topic><topic>Optical instruments, equipment and techniques</topic><topic>OTHER INSTRUMENTATION</topic><topic>Other techniques and industries</topic><topic>Physics</topic><topic>PLASMA DIAGNOSTICS</topic><topic>PROCESSING</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>MASTIN, G. A</creatorcontrib><creatorcontrib>GHIGLIA, D. C</creatorcontrib><creatorcontrib>Sandia National Laboratories, Albuquerque, New Mexico 87185</creatorcontrib><collection>Pascal-Francis</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><collection>OSTI.GOV</collection><jtitle>Appl. Opt.; (United States)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>MASTIN, G. A</au><au>GHIGLIA, D. C</au><aucorp>Sandia National Laboratories, Albuquerque, New Mexico 87185</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Digital extraction of interference fringe contours</atitle><jtitle>Appl. Opt.; (United States)</jtitle><addtitle>Appl Opt</addtitle><date>1985-06-15</date><risdate>1985</risdate><volume>24</volume><issue>12</issue><spage>1727</spage><epage>1728</epage><pages>1727-1728</pages><issn>0003-6935</issn><issn>1559-128X</issn><eissn>1539-4522</eissn><coden>APOPAI</coden><abstract>Two basic techniques for extracting interferogram contours have been discussed. The first is a global contour extracton technique based on the fast Fourier transform. The second extracts individual contours with a thinning algorithm using logical neighborhood transformations. (AIP)</abstract><cop>Washington, DC</cop><pub>Optical Society of America</pub><pmid>20440367</pmid><doi>10.1364/AO.24.001727</doi><tpages>2</tpages></addata></record>
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1559-128X
1539-4522
language eng
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source Alma/SFX Local Collection; Optica Publishing Group Journals
subjects 440300 - Miscellaneous Instruments- (-1989)
Applied sciences
DIGITAL SYSTEMS
Exact sciences and technology
IMAGE PROCESSING
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Interferometers
INTERFEROMETRY
OPTICAL EQUIPMENT
Optical instruments, equipment and techniques
OTHER INSTRUMENTATION
Other techniques and industries
Physics
PLASMA DIAGNOSTICS
PROCESSING
title Digital extraction of interference fringe contours
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-11T13%3A10%3A11IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_osti_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Digital%20extraction%20of%20interference%20fringe%20contours&rft.jtitle=Appl.%20Opt.;%20(United%20States)&rft.au=MASTIN,%20G.%20A&rft.aucorp=Sandia%20National%20Laboratories,%20Albuquerque,%20New%20Mexico%2087185&rft.date=1985-06-15&rft.volume=24&rft.issue=12&rft.spage=1727&rft.epage=1728&rft.pages=1727-1728&rft.issn=0003-6935&rft.eissn=1539-4522&rft.coden=APOPAI&rft_id=info:doi/10.1364/AO.24.001727&rft_dat=%3Cproquest_osti_%3E733942881%3C/proquest_osti_%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=733942881&rft_id=info:pmid/20440367&rfr_iscdi=true