SimulaTEM: Multislice simulations for general objects
In this work we present the program SimulaTEM for the simulation of high resolution micrographs and diffraction patterns. This is a program based on the multislice approach that does not assume a periodic object. It can calculate images from finite objects, from amorphous samples, from crystals, qua...
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| Veröffentlicht in: | Ultramicroscopy 2010, Vol.110 (2), p.95-104 |
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| container_title | Ultramicroscopy |
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| creator | Gómez-Rodríguez, A. Beltrán-del-Río, L.M. Herrera-Becerra, R. |
| description | In this work we present the program SimulaTEM for the simulation of high resolution micrographs and diffraction patterns. This is a program based on the multislice approach that does not assume a periodic object. It can calculate images from finite objects, from amorphous samples, from crystals, quasicrystals, grain boundaries, nanoparticles or arbitrary objects provided the coordinates of all the atoms can be supplied. |
| doi_str_mv | 10.1016/j.ultramic.2009.09.010 |
| format | Article |
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| ispartof | Ultramicroscopy, 2010, Vol.110 (2), p.95-104 |
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| language | eng |
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| source | ScienceDirect Journals (5 years ago - present) |
| subjects | Electron diffraction High resolution electron microscopy Image simulation Multislice |
| title | SimulaTEM: Multislice simulations for general objects |
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