Optical constants of absorbing materials: a new approach
A detailed study of a new method of determining the optical properties of absorbing materials is presented. It makes use of normal incidence reflectances from the specimen itself (R(s)) and from the specimen coated with a transparent film of two different thicknesses but of the same refractive index...
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Veröffentlicht in: | Applied Optics 1981-08, Vol.20 (15), p.2747-2753 |
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creator | Nagendra, C L Thutupalli, G K |
description | A detailed study of a new method of determining the optical properties of absorbing materials is presented. It makes use of normal incidence reflectances from the specimen itself (R(s)) and from the specimen coated with a transparent film of two different thicknesses but of the same refractive index (R(1s) and R(2s)) in the form of R(1s)/R(s) and R(2s)/R(s)- It is seen that a simple goniometer can be easily adopted for measuring the reflectance ratios over a wide spectral range. The versatility of the method has been proved by the fact that it has been successfully adopted for specimens with surface structures varying from atomically smooth to rough surfaces. |
doi_str_mv | 10.1364/AO.20.002747 |
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fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_733803105</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>23798706</sourcerecordid><originalsourceid>FETCH-LOGICAL-c319t-bd9ba24f435e4e08784b9573c9331c207e1cb177d07041181386ebfa256e3163</originalsourceid><addsrcrecordid>eNp9kD1PwzAQQC0EoqWwMaNMsJBy9tmxzVZVfEmVsnRgs2zXgaB8EadC_HtStTAy3en09E56hFxSmFPM-N0inzOYAzDJ5RGZUoE65YKx490udEqZep2Qsxg_AFBwLU_JhAEiAsKUqLwbSm-rxLdNHGwzxKQtEuti27uyeUtqO4S-tFW8T2zShK_Edl3fWv9-Tk6K8RwuDnNG1o8P6-VzusqfXpaLVeqR6iF1G-0s4wVHEXgAJRV3Wkj0GpF6BjJQ76iUG5DAKVUUVRZcYZnIAtIMZ-Rmrx2_fm5DHExdRh-qyjah3UYjERUgBTGS1_-SDKVWEnbK2z3o-zbGPhSm68va9t-GgtklNYvcMDD7pCN-dfBuXR02f_BvQ_wB3Bluyw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>23798706</pqid></control><display><type>article</type><title>Optical constants of absorbing materials: a new approach</title><source>Alma/SFX Local Collection</source><source>Optica Publishing Group Journals</source><creator>Nagendra, C L ; Thutupalli, G K</creator><creatorcontrib>Nagendra, C L ; Thutupalli, G K</creatorcontrib><description>A detailed study of a new method of determining the optical properties of absorbing materials is presented. It makes use of normal incidence reflectances from the specimen itself (R(s)) and from the specimen coated with a transparent film of two different thicknesses but of the same refractive index (R(1s) and R(2s)) in the form of R(1s)/R(s) and R(2s)/R(s)- It is seen that a simple goniometer can be easily adopted for measuring the reflectance ratios over a wide spectral range. The versatility of the method has been proved by the fact that it has been successfully adopted for specimens with surface structures varying from atomically smooth to rough surfaces.</description><identifier>ISSN: 1559-128X</identifier><identifier>ISSN: 0003-6935</identifier><identifier>EISSN: 1539-4522</identifier><identifier>DOI: 10.1364/AO.20.002747</identifier><identifier>PMID: 20333030</identifier><language>eng</language><publisher>United States</publisher><ispartof>Applied Optics, 1981-08, Vol.20 (15), p.2747-2753</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c319t-bd9ba24f435e4e08784b9573c9331c207e1cb177d07041181386ebfa256e3163</citedby><cites>FETCH-LOGICAL-c319t-bd9ba24f435e4e08784b9573c9331c207e1cb177d07041181386ebfa256e3163</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/20333030$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Nagendra, C L</creatorcontrib><creatorcontrib>Thutupalli, G K</creatorcontrib><title>Optical constants of absorbing materials: a new approach</title><title>Applied Optics</title><addtitle>Appl Opt</addtitle><description>A detailed study of a new method of determining the optical properties of absorbing materials is presented. It makes use of normal incidence reflectances from the specimen itself (R(s)) and from the specimen coated with a transparent film of two different thicknesses but of the same refractive index (R(1s) and R(2s)) in the form of R(1s)/R(s) and R(2s)/R(s)- It is seen that a simple goniometer can be easily adopted for measuring the reflectance ratios over a wide spectral range. The versatility of the method has been proved by the fact that it has been successfully adopted for specimens with surface structures varying from atomically smooth to rough surfaces.</description><issn>1559-128X</issn><issn>0003-6935</issn><issn>1539-4522</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1981</creationdate><recordtype>article</recordtype><recordid>eNp9kD1PwzAQQC0EoqWwMaNMsJBy9tmxzVZVfEmVsnRgs2zXgaB8EadC_HtStTAy3en09E56hFxSmFPM-N0inzOYAzDJ5RGZUoE65YKx490udEqZep2Qsxg_AFBwLU_JhAEiAsKUqLwbSm-rxLdNHGwzxKQtEuti27uyeUtqO4S-tFW8T2zShK_Edl3fWv9-Tk6K8RwuDnNG1o8P6-VzusqfXpaLVeqR6iF1G-0s4wVHEXgAJRV3Wkj0GpF6BjJQ76iUG5DAKVUUVRZcYZnIAtIMZ-Rmrx2_fm5DHExdRh-qyjah3UYjERUgBTGS1_-SDKVWEnbK2z3o-zbGPhSm68va9t-GgtklNYvcMDD7pCN-dfBuXR02f_BvQ_wB3Bluyw</recordid><startdate>19810801</startdate><enddate>19810801</enddate><creator>Nagendra, C L</creator><creator>Thutupalli, G K</creator><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>7X8</scope></search><sort><creationdate>19810801</creationdate><title>Optical constants of absorbing materials: a new approach</title><author>Nagendra, C L ; Thutupalli, G K</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c319t-bd9ba24f435e4e08784b9573c9331c207e1cb177d07041181386ebfa256e3163</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1981</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Nagendra, C L</creatorcontrib><creatorcontrib>Thutupalli, G K</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>MEDLINE - Academic</collection><jtitle>Applied Optics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Nagendra, C L</au><au>Thutupalli, G K</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Optical constants of absorbing materials: a new approach</atitle><jtitle>Applied Optics</jtitle><addtitle>Appl Opt</addtitle><date>1981-08-01</date><risdate>1981</risdate><volume>20</volume><issue>15</issue><spage>2747</spage><epage>2753</epage><pages>2747-2753</pages><issn>1559-128X</issn><issn>0003-6935</issn><eissn>1539-4522</eissn><abstract>A detailed study of a new method of determining the optical properties of absorbing materials is presented. It makes use of normal incidence reflectances from the specimen itself (R(s)) and from the specimen coated with a transparent film of two different thicknesses but of the same refractive index (R(1s) and R(2s)) in the form of R(1s)/R(s) and R(2s)/R(s)- It is seen that a simple goniometer can be easily adopted for measuring the reflectance ratios over a wide spectral range. The versatility of the method has been proved by the fact that it has been successfully adopted for specimens with surface structures varying from atomically smooth to rough surfaces.</abstract><cop>United States</cop><pmid>20333030</pmid><doi>10.1364/AO.20.002747</doi><tpages>7</tpages></addata></record> |
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title | Optical constants of absorbing materials: a new approach |
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