Black-box model for the complete characterization of the spectral gain and noise in semiconductor optical amplifiers

A Black Box Model for the quick complete characterization of the optical gain and amplified spontaneous emission noise in Semiconductor Optical Amplifiers is presented and verified experimentally. This model provides good accuracy, even neglecting third order terms in the spectral gain shift, and ca...

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Veröffentlicht in:Optics express 2006-02, Vol.14 (4), p.1626-1631
Hauptverfasser: Gallep, Cristiano, Rieznik, Andrés, Fragnito, Hugo, Frateschi, Newton, Conforti, Evandro
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container_end_page 1631
container_issue 4
container_start_page 1626
container_title Optics express
container_volume 14
creator Gallep, Cristiano
Rieznik, Andrés
Fragnito, Hugo
Frateschi, Newton
Conforti, Evandro
description A Black Box Model for the quick complete characterization of the optical gain and amplified spontaneous emission noise in Semiconductor Optical Amplifiers is presented and verified experimentally. This model provides good accuracy, even neglecting third order terms in the spectral gain shift, and can provide cost reduction in SOA characterization and design as well as provide simple algorithms for hybrid integration in-package control.
doi_str_mv 10.1364/OE.14.001626
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title Black-box model for the complete characterization of the spectral gain and noise in semiconductor optical amplifiers
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