Extended depth of field and aberration control for inexpensive digital microscope systems

Extended depth of field and aberration control for inexpensive digital microscope systems

We present a new application and current results for extending depth of field using wave front coding. A cubic phase plate is used to code wave fronts in microscopy resulting in extended depths of field and inexpensive chromatic aberration control. A review of the theory behind cubic phase plate ext...

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Veröffentlicht in:Optics express 1999-05, Vol.4 (11), p.467-474
Hauptverfasser: Tucker, S, Cathey, W T, Dowski, Jr, E
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container_title Optics express
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creator Tucker, S
Cathey, W T
Dowski, Jr, E
description We present a new application and current results for extending depth of field using wave front coding. A cubic phase plate is used to code wave fronts in microscopy resulting in extended depths of field and inexpensive chromatic aberration control. A review of the theory behind cubic phase plate extended depth of field systems is given along with the challenges that are face when applying the theory to microscopy. Current results from the new extended depth of field microscope systems are shown.
doi_str_mv 10.1364/OE.4.000467
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title Extended depth of field and aberration control for inexpensive digital microscope systems
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