Low-energy foil aberration corrector

A spherical and chromatic aberration corrector for electron microscopes is proposed, consisting of a thin foil sandwiched between two apertures. The electrons are retarded at the foil to almost zero energy, so that they can travel ballistically through the foil. It is shown that such a low-voltage c...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Ultramicroscopy 2002-12, Vol.93 (3), p.321-330
Hauptverfasser: van Aken, R.H, Hagen, C.W, Barth, J.E, Kruit, P
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 330
container_issue 3
container_start_page 321
container_title Ultramicroscopy
container_volume 93
creator van Aken, R.H
Hagen, C.W
Barth, J.E
Kruit, P
description A spherical and chromatic aberration corrector for electron microscopes is proposed, consisting of a thin foil sandwiched between two apertures. The electrons are retarded at the foil to almost zero energy, so that they can travel ballistically through the foil. It is shown that such a low-voltage corrector has a negative spherical aberration for not too large distances between aperture and foil, as well as a negative chromatic aberration. For various distances the third- and fifth-order spherical aberration coefficients and the first- and second-order chromatic aberration coefficients are calculated using ray tracing. Provided that the foils have sufficient electron transmission the corrector is able to correct the third-order spherical aberration and the first-order chromatic aberration of a typical low-voltage scanning electron microscope. Preliminary results show that the fifth-order spherical aberration and the second-order chromatic aberration can be kept sufficiently low.
doi_str_mv 10.1016/S0304-3991(02)00287-5
format Article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_72782394</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0304399102002875</els_id><sourcerecordid>72782394</sourcerecordid><originalsourceid>FETCH-LOGICAL-c391t-e8e87bd6ae442b6ef88f4a00f99bf5ab2ac0a0da2274fd900e4948c4655605423</originalsourceid><addsrcrecordid>eNqF0D1PwzAQgGELgWgp_ARQB0AwBM4XJ7EnhCq-pEoMwGw5zhkZpTHYLaj_nn6JjkxenjvbL2PHHK448PL6BXIQWa4UvwC8BEBZZcUO63NZqQwrzHdZ_4_02EFKHwDAQch91uMoFKLgfXY6Dj8ZdRTf50MXfDs0NcVopj50QxtiJDsN8ZDtOdMmOtqcA_Z2f_c6eszGzw9Po9txZnPFpxlJklXdlIaEwLokJ6UTBsApVbvC1GgsGGgMYiVcowBIKCGtKIuihEJgPmDn672fMXzNKE31xCdLbWs6CrOkK6wk5kosYLGGNoaUIjn9Gf3ExLnmoJd59CqPXv5dA-pVHl0s5k42F8zqCTXbqU2PBTjbAJOsaV00nfVp6wTkFeLS3awdLXJ8e4o6WU-dpcYvk-km-H-e8gutCH_q</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>72782394</pqid></control><display><type>article</type><title>Low-energy foil aberration corrector</title><source>Access via ScienceDirect (Elsevier)</source><creator>van Aken, R.H ; Hagen, C.W ; Barth, J.E ; Kruit, P</creator><creatorcontrib>van Aken, R.H ; Hagen, C.W ; Barth, J.E ; Kruit, P</creatorcontrib><description>A spherical and chromatic aberration corrector for electron microscopes is proposed, consisting of a thin foil sandwiched between two apertures. The electrons are retarded at the foil to almost zero energy, so that they can travel ballistically through the foil. It is shown that such a low-voltage corrector has a negative spherical aberration for not too large distances between aperture and foil, as well as a negative chromatic aberration. For various distances the third- and fifth-order spherical aberration coefficients and the first- and second-order chromatic aberration coefficients are calculated using ray tracing. Provided that the foils have sufficient electron transmission the corrector is able to correct the third-order spherical aberration and the first-order chromatic aberration of a typical low-voltage scanning electron microscope. Preliminary results show that the fifth-order spherical aberration and the second-order chromatic aberration can be kept sufficiently low.</description><identifier>ISSN: 0304-3991</identifier><identifier>EISSN: 1879-2723</identifier><identifier>DOI: 10.1016/S0304-3991(02)00287-5</identifier><identifier>PMID: 12492241</identifier><identifier>CODEN: ULTRD6</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>Aberration correction ; Aberrations ; Beam optics ; Chromatic aberration ; Chromatic and geometrical aberrations ; Electromagnetism; electron and ion optics ; Electron, positron and ion microscopes, electron diffractometers and related techniques ; Exact sciences and technology ; Foil ; Fundamental areas of phenomenology (including applications) ; Geometrical optics ; Instruments, apparatus, components and techniques common to several branches of physics and astronomy ; Optics ; Other topics in electromagnetism; electron and ion optics ; Physics ; Spherical aberration</subject><ispartof>Ultramicroscopy, 2002-12, Vol.93 (3), p.321-330</ispartof><rights>2002 Elsevier Science B.V.</rights><rights>2003 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c391t-e8e87bd6ae442b6ef88f4a00f99bf5ab2ac0a0da2274fd900e4948c4655605423</citedby><cites>FETCH-LOGICAL-c391t-e8e87bd6ae442b6ef88f4a00f99bf5ab2ac0a0da2274fd900e4948c4655605423</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/S0304-3991(02)00287-5$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>315,782,786,3554,27933,27934,46004</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=14037221$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/12492241$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>van Aken, R.H</creatorcontrib><creatorcontrib>Hagen, C.W</creatorcontrib><creatorcontrib>Barth, J.E</creatorcontrib><creatorcontrib>Kruit, P</creatorcontrib><title>Low-energy foil aberration corrector</title><title>Ultramicroscopy</title><addtitle>Ultramicroscopy</addtitle><description>A spherical and chromatic aberration corrector for electron microscopes is proposed, consisting of a thin foil sandwiched between two apertures. The electrons are retarded at the foil to almost zero energy, so that they can travel ballistically through the foil. It is shown that such a low-voltage corrector has a negative spherical aberration for not too large distances between aperture and foil, as well as a negative chromatic aberration. For various distances the third- and fifth-order spherical aberration coefficients and the first- and second-order chromatic aberration coefficients are calculated using ray tracing. Provided that the foils have sufficient electron transmission the corrector is able to correct the third-order spherical aberration and the first-order chromatic aberration of a typical low-voltage scanning electron microscope. Preliminary results show that the fifth-order spherical aberration and the second-order chromatic aberration can be kept sufficiently low.</description><subject>Aberration correction</subject><subject>Aberrations</subject><subject>Beam optics</subject><subject>Chromatic aberration</subject><subject>Chromatic and geometrical aberrations</subject><subject>Electromagnetism; electron and ion optics</subject><subject>Electron, positron and ion microscopes, electron diffractometers and related techniques</subject><subject>Exact sciences and technology</subject><subject>Foil</subject><subject>Fundamental areas of phenomenology (including applications)</subject><subject>Geometrical optics</subject><subject>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</subject><subject>Optics</subject><subject>Other topics in electromagnetism; electron and ion optics</subject><subject>Physics</subject><subject>Spherical aberration</subject><issn>0304-3991</issn><issn>1879-2723</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2002</creationdate><recordtype>article</recordtype><recordid>eNqF0D1PwzAQgGELgWgp_ARQB0AwBM4XJ7EnhCq-pEoMwGw5zhkZpTHYLaj_nn6JjkxenjvbL2PHHK448PL6BXIQWa4UvwC8BEBZZcUO63NZqQwrzHdZ_4_02EFKHwDAQch91uMoFKLgfXY6Dj8ZdRTf50MXfDs0NcVopj50QxtiJDsN8ZDtOdMmOtqcA_Z2f_c6eszGzw9Po9txZnPFpxlJklXdlIaEwLokJ6UTBsApVbvC1GgsGGgMYiVcowBIKCGtKIuihEJgPmDn672fMXzNKE31xCdLbWs6CrOkK6wk5kosYLGGNoaUIjn9Gf3ExLnmoJd59CqPXv5dA-pVHl0s5k42F8zqCTXbqU2PBTjbAJOsaV00nfVp6wTkFeLS3awdLXJ8e4o6WU-dpcYvk-km-H-e8gutCH_q</recordid><startdate>20021201</startdate><enddate>20021201</enddate><creator>van Aken, R.H</creator><creator>Hagen, C.W</creator><creator>Barth, J.E</creator><creator>Kruit, P</creator><general>Elsevier B.V</general><general>Elsevier Science</general><scope>IQODW</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>20021201</creationdate><title>Low-energy foil aberration corrector</title><author>van Aken, R.H ; Hagen, C.W ; Barth, J.E ; Kruit, P</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c391t-e8e87bd6ae442b6ef88f4a00f99bf5ab2ac0a0da2274fd900e4948c4655605423</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2002</creationdate><topic>Aberration correction</topic><topic>Aberrations</topic><topic>Beam optics</topic><topic>Chromatic aberration</topic><topic>Chromatic and geometrical aberrations</topic><topic>Electromagnetism; electron and ion optics</topic><topic>Electron, positron and ion microscopes, electron diffractometers and related techniques</topic><topic>Exact sciences and technology</topic><topic>Foil</topic><topic>Fundamental areas of phenomenology (including applications)</topic><topic>Geometrical optics</topic><topic>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</topic><topic>Optics</topic><topic>Other topics in electromagnetism; electron and ion optics</topic><topic>Physics</topic><topic>Spherical aberration</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>van Aken, R.H</creatorcontrib><creatorcontrib>Hagen, C.W</creatorcontrib><creatorcontrib>Barth, J.E</creatorcontrib><creatorcontrib>Kruit, P</creatorcontrib><collection>Pascal-Francis</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Ultramicroscopy</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>van Aken, R.H</au><au>Hagen, C.W</au><au>Barth, J.E</au><au>Kruit, P</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Low-energy foil aberration corrector</atitle><jtitle>Ultramicroscopy</jtitle><addtitle>Ultramicroscopy</addtitle><date>2002-12-01</date><risdate>2002</risdate><volume>93</volume><issue>3</issue><spage>321</spage><epage>330</epage><pages>321-330</pages><issn>0304-3991</issn><eissn>1879-2723</eissn><coden>ULTRD6</coden><abstract>A spherical and chromatic aberration corrector for electron microscopes is proposed, consisting of a thin foil sandwiched between two apertures. The electrons are retarded at the foil to almost zero energy, so that they can travel ballistically through the foil. It is shown that such a low-voltage corrector has a negative spherical aberration for not too large distances between aperture and foil, as well as a negative chromatic aberration. For various distances the third- and fifth-order spherical aberration coefficients and the first- and second-order chromatic aberration coefficients are calculated using ray tracing. Provided that the foils have sufficient electron transmission the corrector is able to correct the third-order spherical aberration and the first-order chromatic aberration of a typical low-voltage scanning electron microscope. Preliminary results show that the fifth-order spherical aberration and the second-order chromatic aberration can be kept sufficiently low.</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><pmid>12492241</pmid><doi>10.1016/S0304-3991(02)00287-5</doi><tpages>10</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0304-3991
ispartof Ultramicroscopy, 2002-12, Vol.93 (3), p.321-330
issn 0304-3991
1879-2723
language eng
recordid cdi_proquest_miscellaneous_72782394
source Access via ScienceDirect (Elsevier)
subjects Aberration correction
Aberrations
Beam optics
Chromatic aberration
Chromatic and geometrical aberrations
Electromagnetism
electron and ion optics
Electron, positron and ion microscopes, electron diffractometers and related techniques
Exact sciences and technology
Foil
Fundamental areas of phenomenology (including applications)
Geometrical optics
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Optics
Other topics in electromagnetism
electron and ion optics
Physics
Spherical aberration
title Low-energy foil aberration corrector
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-03T13%3A38%3A24IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Low-energy%20foil%20aberration%20corrector&rft.jtitle=Ultramicroscopy&rft.au=van%20Aken,%20R.H&rft.date=2002-12-01&rft.volume=93&rft.issue=3&rft.spage=321&rft.epage=330&rft.pages=321-330&rft.issn=0304-3991&rft.eissn=1879-2723&rft.coden=ULTRD6&rft_id=info:doi/10.1016/S0304-3991(02)00287-5&rft_dat=%3Cproquest_cross%3E72782394%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=72782394&rft_id=info:pmid/12492241&rft_els_id=S0304399102002875&rfr_iscdi=true