Surface characterization from doubly scattered light
When a translucent diffuser is illuminated by a speckle pattern, a new speckle pattern is produced. We show that the decorrelation of this intensity pattern by displacement of the diffusing surface is related to the standard deviation of the slope's distribution when the illuminating speckle gr...
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| Veröffentlicht in: | Applied Optics 2004-05, Vol.43 (14), p.2884-2887 |
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| container_issue | 14 |
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| container_title | Applied Optics |
| container_volume | 43 |
| creator | Perez-Quintián, Fernando Rebollo, María A |
| description | When a translucent diffuser is illuminated by a speckle pattern, a new speckle pattern is produced. We show that the decorrelation of this intensity pattern by displacement of the diffusing surface is related to the standard deviation of the slope's distribution when the illuminating speckle grain is chosen appropriately small. The experimental results are compared with those obtained by measuring the angular distribution of the mean scattered intensity, and they show good agreement with each other. |
| doi_str_mv | 10.1364/AO.43.002884 |
| format | Article |
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| identifier | ISSN: 1559-128X |
| ispartof | Applied Optics, 2004-05, Vol.43 (14), p.2884-2887 |
| issn | 1559-128X 0003-6935 1539-4522 |
| language | eng |
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| source | Alma/SFX Local Collection; Optica Publishing Group Journals |
| title | Surface characterization from doubly scattered light |
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