Application of the Tauc-Lorentz formulation to the interband absorption of optical coating materials

Recent progress in ellipsometry instrumentation permits precise measurement and characterization of optical coating materials in the deep-UV wavelength range. Dielectric coating materials exhibit their first electronic interband transition in this spectral range. The Tauc-Lorentz model is a powerful...

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Veröffentlicht in:Applied Optics 2002-06, Vol.41 (16), p.3137-3141
Hauptverfasser: von Blanckenhagen, Bernhard, Tonova, Diana, Ullmann, Jens
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container_title Applied Optics
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creator von Blanckenhagen, Bernhard
Tonova, Diana
Ullmann, Jens
description Recent progress in ellipsometry instrumentation permits precise measurement and characterization of optical coating materials in the deep-UV wavelength range. Dielectric coating materials exhibit their first electronic interband transition in this spectral range. The Tauc-Lorentz model is a powerful tool with which to parameterize interband absorption above the band edge. The application of this model for the parameterization of the optical absorption of TiO2, Ta2O5, HfO2, Al2O3, and LaF3 thin-film materials is described.
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title Application of the Tauc-Lorentz formulation to the interband absorption of optical coating materials
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