Index determination of opaque and semitransparent metallic films: application to light absorbers

Index-determination methods based on reflectance and transmittance measurements are developed for both opaque and semitransparent metallic films. Results are given concerning chromium and nickel layers manufactured by electron-beam deposition. To take account of the evolution of the optical constant...

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Veröffentlicht in:	Applied Optics 2002-05, Vol.41 (13), p.2546-2554
Hauptverfasser:	Cathelinaud, Michel, Lemarquis, Frédéric, Amra, Claude
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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