Atomistic origin of urbach tails in amorphous silicon

Exponential band edges have been observed in a variety of materials, both crystalline and amorphous. In this Letter, we infer the structural origins of these tails in amorphous and defective crystalline Si by direct calculation with current ab initio methods. We find that exponential tails appear in...

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Veröffentlicht in:	Physical review letters 2008-05, Vol.100 (20), p.206403-206403, Article 206403
Hauptverfasser:	Pan, Y, Inam, F, Zhang, M, Drabold, D A
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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