Mathematical formulations for the schlieren detection method applied to the measurement of photodeformation

In a schlieren detection scheme for photodeformation measurements, the divergence of the probe beam that is induced by the axisymmetric but radially inhomogeneous periodic photothermal displacement of the surface of a sample is transformed into an intensity variation by insertion of an iris in front...

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Veröffentlicht in:	Applied Optics 2002-02, Vol.41 (6), p.1128-1144
Hauptverfasser:	Cournoyer, Alain, Baulaigue, Pierre, Bures, Jacques, Bertrand, Lionel, Occelli, Roland
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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