A novel sample holder allowing atomic force microscopy on transmission electron microscopy specimen grids: repetitive, direct correlation between AFM and TEM images

Summary A novel sample holder that allows atomic force microscopy (AFM) to be performed on transmission electron microscope (TEM) grids is described. Consequently, AFM and TEM images were repeatedly obtained on exactly the same sample area. For both techniques, a thin carbon film was used as the ima...

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Veröffentlicht in:	Journal of microscopy (Oxford) 2002-02, Vol.205 (2), p.205-208
Hauptverfasser:	Lin, A. C., Goh, M. C.
Format:	Artikel
Sprache:	eng
Schlagworte:	AFM atomic force microscope Fibrillar Collagens - ultrastructure fibrous long spacing collagen FLS Humans Microscopy, Atomic Force - instrumentation Microscopy, Atomic Force - methods Microscopy, Electron - instrumentation Microscopy, Electron - methods negative‐staining Phosphotungstic Acid - metabolism sample holder Staining and Labeling - methods TEM transmission electron microscopy
Online-Zugang:	Volltext
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