A novel sample holder allowing atomic force microscopy on transmission electron microscopy specimen grids: repetitive, direct correlation between AFM and TEM images
Summary A novel sample holder that allows atomic force microscopy (AFM) to be performed on transmission electron microscope (TEM) grids is described. Consequently, AFM and TEM images were repeatedly obtained on exactly the same sample area. For both techniques, a thin carbon film was used as the ima...
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| Veröffentlicht in: | Journal of microscopy (Oxford) 2002-02, Vol.205 (2), p.205-208 |
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| container_title | Journal of microscopy (Oxford) |
| container_volume | 205 |
| creator | Lin, A. C. Goh, M. C. |
| description | Summary
A novel sample holder that allows atomic force microscopy (AFM) to be performed on transmission electron microscope (TEM) grids is described. Consequently, AFM and TEM images were repeatedly obtained on exactly the same sample area. For both techniques, a thin carbon film was used as the imaging substrate. Although these techniques have been previously used in conjunction, AFM and TEM images on exactly the same area have not been repeatedly obtained for any system. Correlation of AFM and TEM images is useful for work where the three‐dimensional topographical information provided by the AFM could be used to better interpret the two‐dimensional images provided by the TEM and vice versa. To demonstrate the applicability of such correlation, new results pertaining to a fibrillar collagen system are summarized. |
| doi_str_mv | 10.1046/j.0022-2720.2001.00978.x |
| format | Article |
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A novel sample holder that allows atomic force microscopy (AFM) to be performed on transmission electron microscope (TEM) grids is described. Consequently, AFM and TEM images were repeatedly obtained on exactly the same sample area. For both techniques, a thin carbon film was used as the imaging substrate. Although these techniques have been previously used in conjunction, AFM and TEM images on exactly the same area have not been repeatedly obtained for any system. Correlation of AFM and TEM images is useful for work where the three‐dimensional topographical information provided by the AFM could be used to better interpret the two‐dimensional images provided by the TEM and vice versa. To demonstrate the applicability of such correlation, new results pertaining to a fibrillar collagen system are summarized.</description><identifier>ISSN: 0022-2720</identifier><identifier>EISSN: 1365-2818</identifier><identifier>DOI: 10.1046/j.0022-2720.2001.00978.x</identifier><identifier>PMID: 11879435</identifier><language>eng</language><publisher>Oxford, UK: Blackwell Science Ltd</publisher><subject>AFM ; atomic force microscope ; Fibrillar Collagens - ultrastructure ; fibrous long spacing collagen ; FLS ; Humans ; Microscopy, Atomic Force - instrumentation ; Microscopy, Atomic Force - methods ; Microscopy, Electron - instrumentation ; Microscopy, Electron - methods ; negative‐staining ; Phosphotungstic Acid - metabolism ; sample holder ; Staining and Labeling - methods ; TEM ; transmission electron microscopy</subject><ispartof>Journal of microscopy (Oxford), 2002-02, Vol.205 (2), p.205-208</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c3648-83b6d38e4200908452f38938113e184638fe5b81f04c23b2b911c00274175cb53</citedby><cites>FETCH-LOGICAL-c3648-83b6d38e4200908452f38938113e184638fe5b81f04c23b2b911c00274175cb53</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1046%2Fj.0022-2720.2001.00978.x$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1046%2Fj.0022-2720.2001.00978.x$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,780,784,1416,1432,27923,27924,45573,45574,46408,46832</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/11879435$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Lin, A. C.</creatorcontrib><creatorcontrib>Goh, M. C.</creatorcontrib><title>A novel sample holder allowing atomic force microscopy on transmission electron microscopy specimen grids: repetitive, direct correlation between AFM and TEM images</title><title>Journal of microscopy (Oxford)</title><addtitle>J Microsc</addtitle><description>Summary
A novel sample holder that allows atomic force microscopy (AFM) to be performed on transmission electron microscope (TEM) grids is described. Consequently, AFM and TEM images were repeatedly obtained on exactly the same sample area. For both techniques, a thin carbon film was used as the imaging substrate. Although these techniques have been previously used in conjunction, AFM and TEM images on exactly the same area have not been repeatedly obtained for any system. Correlation of AFM and TEM images is useful for work where the three‐dimensional topographical information provided by the AFM could be used to better interpret the two‐dimensional images provided by the TEM and vice versa. To demonstrate the applicability of such correlation, new results pertaining to a fibrillar collagen system are summarized.</description><subject>AFM</subject><subject>atomic force microscope</subject><subject>Fibrillar Collagens - ultrastructure</subject><subject>fibrous long spacing collagen</subject><subject>FLS</subject><subject>Humans</subject><subject>Microscopy, Atomic Force - instrumentation</subject><subject>Microscopy, Atomic Force - methods</subject><subject>Microscopy, Electron - instrumentation</subject><subject>Microscopy, Electron - methods</subject><subject>negative‐staining</subject><subject>Phosphotungstic Acid - metabolism</subject><subject>sample holder</subject><subject>Staining and Labeling - methods</subject><subject>TEM</subject><subject>transmission electron microscopy</subject><issn>0022-2720</issn><issn>1365-2818</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2002</creationdate><recordtype>article</recordtype><sourceid>EIF</sourceid><recordid>eNqNkU1u2zAQhYmiQeMmvULBVVaVyz9JVJGNYSRpihjZJGuCokYuDUpUSDmO75ODhqqNpsuu-Ab4ZjjzHkKYkjklovi-mRPCWMZKRuaMEJrKqpTzlw9oRnmRZ0xS-RHN_kKn6HOMG0KIzCX5hE4plWUleD5Drwvc-2dwOOpucIB_e9dAwNo5v7P9GuvRd9bg1gcDOKngo_HDHvsej0H3sbMx2lSAAzOGJP5h4gDGdtDjdbBN_IEDDDDa0T7DN9zYkBqw8SGA0-M0ooZxB4leXK-w7hv8cLXCttNriOfopNUuwpfje4Yer68elj-zu_ub2-XiLjO8EDKTvC4aLkEkSyoiRc5aLisuKeVApSi4bCGvJW2JMIzXrK4oNcmjUtAyN3XOz9DFYe4Q_NMW4qjSeQac0z34bVQlFVVZcJ5AeQCnW2OAVg0hrRr2ihI1JaQ2ajJfTearKSH1JyH1klq_Hv_Y1h00743HSBJweQB21sH-vwerX6vbJPgb6gag_Q</recordid><startdate>200202</startdate><enddate>200202</enddate><creator>Lin, A. C.</creator><creator>Goh, M. C.</creator><general>Blackwell Science Ltd</general><scope>CGR</scope><scope>CUY</scope><scope>CVF</scope><scope>ECM</scope><scope>EIF</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>200202</creationdate><title>A novel sample holder allowing atomic force microscopy on transmission electron microscopy specimen grids: repetitive, direct correlation between AFM and TEM images</title><author>Lin, A. C. ; Goh, M. C.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3648-83b6d38e4200908452f38938113e184638fe5b81f04c23b2b911c00274175cb53</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2002</creationdate><topic>AFM</topic><topic>atomic force microscope</topic><topic>Fibrillar Collagens - ultrastructure</topic><topic>fibrous long spacing collagen</topic><topic>FLS</topic><topic>Humans</topic><topic>Microscopy, Atomic Force - instrumentation</topic><topic>Microscopy, Atomic Force - methods</topic><topic>Microscopy, Electron - instrumentation</topic><topic>Microscopy, Electron - methods</topic><topic>negative‐staining</topic><topic>Phosphotungstic Acid - metabolism</topic><topic>sample holder</topic><topic>Staining and Labeling - methods</topic><topic>TEM</topic><topic>transmission electron microscopy</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Lin, A. C.</creatorcontrib><creatorcontrib>Goh, M. C.</creatorcontrib><collection>Medline</collection><collection>MEDLINE</collection><collection>MEDLINE (Ovid)</collection><collection>MEDLINE</collection><collection>MEDLINE</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Journal of microscopy (Oxford)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Lin, A. C.</au><au>Goh, M. C.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A novel sample holder allowing atomic force microscopy on transmission electron microscopy specimen grids: repetitive, direct correlation between AFM and TEM images</atitle><jtitle>Journal of microscopy (Oxford)</jtitle><addtitle>J Microsc</addtitle><date>2002-02</date><risdate>2002</risdate><volume>205</volume><issue>2</issue><spage>205</spage><epage>208</epage><pages>205-208</pages><issn>0022-2720</issn><eissn>1365-2818</eissn><abstract>Summary
A novel sample holder that allows atomic force microscopy (AFM) to be performed on transmission electron microscope (TEM) grids is described. Consequently, AFM and TEM images were repeatedly obtained on exactly the same sample area. For both techniques, a thin carbon film was used as the imaging substrate. Although these techniques have been previously used in conjunction, AFM and TEM images on exactly the same area have not been repeatedly obtained for any system. Correlation of AFM and TEM images is useful for work where the three‐dimensional topographical information provided by the AFM could be used to better interpret the two‐dimensional images provided by the TEM and vice versa. To demonstrate the applicability of such correlation, new results pertaining to a fibrillar collagen system are summarized.</abstract><cop>Oxford, UK</cop><pub>Blackwell Science Ltd</pub><pmid>11879435</pmid><doi>10.1046/j.0022-2720.2001.00978.x</doi><tpages>4</tpages></addata></record> |
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| ispartof | Journal of microscopy (Oxford), 2002-02, Vol.205 (2), p.205-208 |
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| language | eng |
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| source | MEDLINE; Wiley Free Content; Wiley Online Library All Journals |
| subjects | AFM atomic force microscope Fibrillar Collagens - ultrastructure fibrous long spacing collagen FLS Humans Microscopy, Atomic Force - instrumentation Microscopy, Atomic Force - methods Microscopy, Electron - instrumentation Microscopy, Electron - methods negative‐staining Phosphotungstic Acid - metabolism sample holder Staining and Labeling - methods TEM transmission electron microscopy |
| title | A novel sample holder allowing atomic force microscopy on transmission electron microscopy specimen grids: repetitive, direct correlation between AFM and TEM images |
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