Properties of liquid silicon observed by time-resolved x-ray absorption spectroscopy

Properties of liquid silicon observed by time-resolved x-ray absorption spectroscopy

Time-resolved x-ray spectroscopy at the Si L edges is used to probe the electronic structure of an amorphous Si foil as it melts following absorption of an ultrafast laser pulse. Picosecond temporal resolution allows observation of the transient liquid phase before vaporization and before the liquid...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Physical review letters 2003-10, Vol.91 (15), p.157403-157403, Article 157403
Hauptverfasser: Johnson, S L, Heimann, P A, Lindenberg, A M, Jeschke, H O, Garcia, M E, Chang, Z, Lee, R W, Rehr, J J, Falcone, R W
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 157403
container_issue 15
container_start_page 157403
container_title Physical review letters
container_volume 91
creator Johnson, S L
Heimann, P A
Lindenberg, A M
Jeschke, H O
Garcia, M E
Chang, Z
Lee, R W
Rehr, J J
Falcone, R W
description Time-resolved x-ray spectroscopy at the Si L edges is used to probe the electronic structure of an amorphous Si foil as it melts following absorption of an ultrafast laser pulse. Picosecond temporal resolution allows observation of the transient liquid phase before vaporization and before the liquid breaks up into droplets. The melting causes changes in the spectrum that match predictions of molecular dynamics and ab initio x-ray absorption codes.
doi_str_mv 10.1103/physrevlett.91.157403
format Article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_71357891</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>71357891</sourcerecordid><originalsourceid>FETCH-LOGICAL-c371t-f0ec4f6d626ce63c1f05f826ab00365253a71dffe84a4e3ccb7aae73925489ab3</originalsourceid><addsrcrecordid>eNpFkF1LwzAUhoMobk5_gtIr7zpzmrRpL0X8goFD5nVI0xOMtEuXtMP-ezM28OrA4XnPeXkIuQW6BKDsof-egsd9i8OwrGAJueCUnZE5UFGlAoCfkzmlDNKKUjEjVyH8UEohK8pLMgNeRKLic7JZe9ejHyyGxJmktbvRNkmwrdVum7g6oN9jk9RTMtgOU4_BtYfFb-rVlKg6ON8PNqKhRz14F7Trp2tyYVQb8OY0F-Tr5Xnz9JauPl7fnx5XqWYChtRQ1NwUTZEVGgumwdDclFmh6li8yLOcKQGNMVhyxZFpXQulULAqy3lZqZotyP3xbu_dbsQwyM4GjW2rtujGIAWwXJQVRDA_gjo2jNqM7L3tlJ8kUHnQKddR5yfuV1GnrEAedcbc3enBWHfY_KdO_tgfkCR2hg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>71357891</pqid></control><display><type>article</type><title>Properties of liquid silicon observed by time-resolved x-ray absorption spectroscopy</title><source>American Physical Society Journals</source><creator>Johnson, S L ; Heimann, P A ; Lindenberg, A M ; Jeschke, H O ; Garcia, M E ; Chang, Z ; Lee, R W ; Rehr, J J ; Falcone, R W</creator><creatorcontrib>Johnson, S L ; Heimann, P A ; Lindenberg, A M ; Jeschke, H O ; Garcia, M E ; Chang, Z ; Lee, R W ; Rehr, J J ; Falcone, R W</creatorcontrib><description>Time-resolved x-ray spectroscopy at the Si L edges is used to probe the electronic structure of an amorphous Si foil as it melts following absorption of an ultrafast laser pulse. Picosecond temporal resolution allows observation of the transient liquid phase before vaporization and before the liquid breaks up into droplets. The melting causes changes in the spectrum that match predictions of molecular dynamics and ab initio x-ray absorption codes.</description><identifier>ISSN: 0031-9007</identifier><identifier>EISSN: 1079-7114</identifier><identifier>DOI: 10.1103/physrevlett.91.157403</identifier><identifier>PMID: 14611494</identifier><language>eng</language><publisher>United States</publisher><ispartof>Physical review letters, 2003-10, Vol.91 (15), p.157403-157403, Article 157403</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c371t-f0ec4f6d626ce63c1f05f826ab00365253a71dffe84a4e3ccb7aae73925489ab3</citedby><cites>FETCH-LOGICAL-c371t-f0ec4f6d626ce63c1f05f826ab00365253a71dffe84a4e3ccb7aae73925489ab3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,2863,2864,27901,27902</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/14611494$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Johnson, S L</creatorcontrib><creatorcontrib>Heimann, P A</creatorcontrib><creatorcontrib>Lindenberg, A M</creatorcontrib><creatorcontrib>Jeschke, H O</creatorcontrib><creatorcontrib>Garcia, M E</creatorcontrib><creatorcontrib>Chang, Z</creatorcontrib><creatorcontrib>Lee, R W</creatorcontrib><creatorcontrib>Rehr, J J</creatorcontrib><creatorcontrib>Falcone, R W</creatorcontrib><title>Properties of liquid silicon observed by time-resolved x-ray absorption spectroscopy</title><title>Physical review letters</title><addtitle>Phys Rev Lett</addtitle><description>Time-resolved x-ray spectroscopy at the Si L edges is used to probe the electronic structure of an amorphous Si foil as it melts following absorption of an ultrafast laser pulse. Picosecond temporal resolution allows observation of the transient liquid phase before vaporization and before the liquid breaks up into droplets. The melting causes changes in the spectrum that match predictions of molecular dynamics and ab initio x-ray absorption codes.</description><issn>0031-9007</issn><issn>1079-7114</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2003</creationdate><recordtype>article</recordtype><recordid>eNpFkF1LwzAUhoMobk5_gtIr7zpzmrRpL0X8goFD5nVI0xOMtEuXtMP-ezM28OrA4XnPeXkIuQW6BKDsof-egsd9i8OwrGAJueCUnZE5UFGlAoCfkzmlDNKKUjEjVyH8UEohK8pLMgNeRKLic7JZe9ejHyyGxJmktbvRNkmwrdVum7g6oN9jk9RTMtgOU4_BtYfFb-rVlKg6ON8PNqKhRz14F7Trp2tyYVQb8OY0F-Tr5Xnz9JauPl7fnx5XqWYChtRQ1NwUTZEVGgumwdDclFmh6li8yLOcKQGNMVhyxZFpXQulULAqy3lZqZotyP3xbu_dbsQwyM4GjW2rtujGIAWwXJQVRDA_gjo2jNqM7L3tlJ8kUHnQKddR5yfuV1GnrEAedcbc3enBWHfY_KdO_tgfkCR2hg</recordid><startdate>20031010</startdate><enddate>20031010</enddate><creator>Johnson, S L</creator><creator>Heimann, P A</creator><creator>Lindenberg, A M</creator><creator>Jeschke, H O</creator><creator>Garcia, M E</creator><creator>Chang, Z</creator><creator>Lee, R W</creator><creator>Rehr, J J</creator><creator>Falcone, R W</creator><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>20031010</creationdate><title>Properties of liquid silicon observed by time-resolved x-ray absorption spectroscopy</title><author>Johnson, S L ; Heimann, P A ; Lindenberg, A M ; Jeschke, H O ; Garcia, M E ; Chang, Z ; Lee, R W ; Rehr, J J ; Falcone, R W</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c371t-f0ec4f6d626ce63c1f05f826ab00365253a71dffe84a4e3ccb7aae73925489ab3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2003</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Johnson, S L</creatorcontrib><creatorcontrib>Heimann, P A</creatorcontrib><creatorcontrib>Lindenberg, A M</creatorcontrib><creatorcontrib>Jeschke, H O</creatorcontrib><creatorcontrib>Garcia, M E</creatorcontrib><creatorcontrib>Chang, Z</creatorcontrib><creatorcontrib>Lee, R W</creatorcontrib><creatorcontrib>Rehr, J J</creatorcontrib><creatorcontrib>Falcone, R W</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Physical review letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Johnson, S L</au><au>Heimann, P A</au><au>Lindenberg, A M</au><au>Jeschke, H O</au><au>Garcia, M E</au><au>Chang, Z</au><au>Lee, R W</au><au>Rehr, J J</au><au>Falcone, R W</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Properties of liquid silicon observed by time-resolved x-ray absorption spectroscopy</atitle><jtitle>Physical review letters</jtitle><addtitle>Phys Rev Lett</addtitle><date>2003-10-10</date><risdate>2003</risdate><volume>91</volume><issue>15</issue><spage>157403</spage><epage>157403</epage><pages>157403-157403</pages><artnum>157403</artnum><issn>0031-9007</issn><eissn>1079-7114</eissn><abstract>Time-resolved x-ray spectroscopy at the Si L edges is used to probe the electronic structure of an amorphous Si foil as it melts following absorption of an ultrafast laser pulse. Picosecond temporal resolution allows observation of the transient liquid phase before vaporization and before the liquid breaks up into droplets. The melting causes changes in the spectrum that match predictions of molecular dynamics and ab initio x-ray absorption codes.</abstract><cop>United States</cop><pmid>14611494</pmid><doi>10.1103/physrevlett.91.157403</doi><tpages>1</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0031-9007
ispartof Physical review letters, 2003-10, Vol.91 (15), p.157403-157403, Article 157403
issn 0031-9007
1079-7114
language eng
recordid cdi_proquest_miscellaneous_71357891
source American Physical Society Journals
title Properties of liquid silicon observed by time-resolved x-ray absorption spectroscopy
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-09T03%3A57%3A20IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Properties%20of%20liquid%20silicon%20observed%20by%20time-resolved%20x-ray%20absorption%20spectroscopy&rft.jtitle=Physical%20review%20letters&rft.au=Johnson,%20S%20L&rft.date=2003-10-10&rft.volume=91&rft.issue=15&rft.spage=157403&rft.epage=157403&rft.pages=157403-157403&rft.artnum=157403&rft.issn=0031-9007&rft.eissn=1079-7114&rft_id=info:doi/10.1103/physrevlett.91.157403&rft_dat=%3Cproquest_cross%3E71357891%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=71357891&rft_id=info:pmid/14611494&rfr_iscdi=true