Phase retrieval and aberration correction in the presence of vortices in high-resolution transmission electron microscopy
We discuss phase retrieval and the correction of images for aberrations, in particular defocus and spherical aberration, in high-resolution transmission electron microscopy. Non-interferometric phase retrieval requires at least two intensity measurements in different planes. Vortices in the phase ma...
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| Veröffentlicht in: | Ultramicroscopy 2001-07, Vol.88 (2), p.85-97 |
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| container_title | Ultramicroscopy |
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| creator | Allen, L.J. Faulkner, H.M.L. Oxley, M.P. Paganin, D. |
| description | We discuss phase retrieval and the correction of images for aberrations, in particular defocus and spherical aberration, in high-resolution transmission electron microscopy. Non-interferometric phase retrieval requires at least two intensity measurements in different planes. Vortices in the phase may occur in the image plane or the other planes involved in the phase retrieval. We discuss the performance of various methods of phase retrieval in that case. After retrieval of the phase, the aberrations can be corrected in the Fraunhofer diffraction space (the wave function in the diffraction space is related to that in the image space by a Fourier transform). The aberration-corrected image is obtained from the aberration-corrected wave function in the diffraction plane by inverse Fourier transformation. |
| doi_str_mv | 10.1016/S0304-3991(01)00072-9 |
| format | Article |
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Non-interferometric phase retrieval requires at least two intensity measurements in different planes. Vortices in the phase may occur in the image plane or the other planes involved in the phase retrieval. We discuss the performance of various methods of phase retrieval in that case. After retrieval of the phase, the aberrations can be corrected in the Fraunhofer diffraction space (the wave function in the diffraction space is related to that in the image space by a Fourier transform). 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Non-interferometric phase retrieval requires at least two intensity measurements in different planes. Vortices in the phase may occur in the image plane or the other planes involved in the phase retrieval. We discuss the performance of various methods of phase retrieval in that case. After retrieval of the phase, the aberrations can be corrected in the Fraunhofer diffraction space (the wave function in the diffraction space is related to that in the image space by a Fourier transform). The aberration-corrected image is obtained from the aberration-corrected wave function in the diffraction plane by inverse Fourier transformation.</description><subject>Defocus</subject><subject>Electron, positron and ion microscopes, electron diffractometers and related techniques</subject><subject>Exact sciences and technology</subject><subject>Exit wave reconstruction</subject><subject>Fundamental areas of phenomenology (including applications)</subject><subject>High-resolution transmission electron microscopy</subject><subject>Imaging and optical processing</subject><subject>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</subject><subject>Optics</subject><subject>Phase retrieval</subject><subject>Physics</subject><subject>Spherical aberration</subject><subject>Vortices</subject><issn>0304-3991</issn><issn>1879-2723</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2001</creationdate><recordtype>article</recordtype><recordid>eNqFkU1rGzEQQEVJqZ20PyFhLwnJYduZ_ZJ1CiEkacHQQn0Xs9rZWGW9cqS1wf8-WtvUx4BAM9Kb0fAkxCXCdwSsfvyFHIo0VwpvAe8AQGap-iSmOJMqzWSWn4npf2QizkP4FyGEYvZFTBALVDMpp2L3Z0mBE8-Dt7ylLqG-Sahm72mwrk-M857NPrR9Miw5WXsO3BtOXJtsnR-s4TDeLe3rMo13rtvs8cFTH1Y2hDHhLjbxMVhZ410wbr37Kj631AX-dtwvxOL5afH4M53_fvn1-DBPTVHKIc1qJauS8qxoCoklAyiq24rqCnKSxMawyVDWzaxpIB7HrDJUmzIj2WKeX4ibQ9u1d28bDoOOMxnuOurZbYKWoEqECiNYHsBxwOC51WtvV-R3GkGPyvVeuR59aohrVK5VrLs6PrCpV9ycqo6OI3B9BCgY6troxdhw4grM8gqKyN0fOI42tpa9DsaOphs7foFunP1glHdaqKFy</recordid><startdate>20010701</startdate><enddate>20010701</enddate><creator>Allen, L.J.</creator><creator>Faulkner, H.M.L.</creator><creator>Oxley, M.P.</creator><creator>Paganin, D.</creator><general>Elsevier B.V</general><general>Elsevier Science</general><scope>IQODW</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>20010701</creationdate><title>Phase retrieval and aberration correction in the presence of vortices in high-resolution transmission electron microscopy</title><author>Allen, L.J. ; Faulkner, H.M.L. ; Oxley, M.P. ; Paganin, D.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c457t-2b9765a324d4715e009abf6ab603a7aeccec217bd8dd06abec26cabc52a7f133</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2001</creationdate><topic>Defocus</topic><topic>Electron, positron and ion microscopes, electron diffractometers and related techniques</topic><topic>Exact sciences and technology</topic><topic>Exit wave reconstruction</topic><topic>Fundamental areas of phenomenology (including applications)</topic><topic>High-resolution transmission electron microscopy</topic><topic>Imaging and optical processing</topic><topic>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</topic><topic>Optics</topic><topic>Phase retrieval</topic><topic>Physics</topic><topic>Spherical aberration</topic><topic>Vortices</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Allen, L.J.</creatorcontrib><creatorcontrib>Faulkner, H.M.L.</creatorcontrib><creatorcontrib>Oxley, M.P.</creatorcontrib><creatorcontrib>Paganin, D.</creatorcontrib><collection>Pascal-Francis</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Ultramicroscopy</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Allen, L.J.</au><au>Faulkner, H.M.L.</au><au>Oxley, M.P.</au><au>Paganin, D.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Phase retrieval and aberration correction in the presence of vortices in high-resolution transmission electron microscopy</atitle><jtitle>Ultramicroscopy</jtitle><addtitle>Ultramicroscopy</addtitle><date>2001-07-01</date><risdate>2001</risdate><volume>88</volume><issue>2</issue><spage>85</spage><epage>97</epage><pages>85-97</pages><issn>0304-3991</issn><eissn>1879-2723</eissn><coden>ULTRD6</coden><abstract>We discuss phase retrieval and the correction of images for aberrations, in particular defocus and spherical aberration, in high-resolution transmission electron microscopy. Non-interferometric phase retrieval requires at least two intensity measurements in different planes. Vortices in the phase may occur in the image plane or the other planes involved in the phase retrieval. We discuss the performance of various methods of phase retrieval in that case. After retrieval of the phase, the aberrations can be corrected in the Fraunhofer diffraction space (the wave function in the diffraction space is related to that in the image space by a Fourier transform). The aberration-corrected image is obtained from the aberration-corrected wave function in the diffraction plane by inverse Fourier transformation.</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><pmid>11419877</pmid><doi>10.1016/S0304-3991(01)00072-9</doi><tpages>13</tpages></addata></record> |
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| language | eng |
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| source | Elsevier ScienceDirect Journals |
| subjects | Defocus Electron, positron and ion microscopes, electron diffractometers and related techniques Exact sciences and technology Exit wave reconstruction Fundamental areas of phenomenology (including applications) High-resolution transmission electron microscopy Imaging and optical processing Instruments, apparatus, components and techniques common to several branches of physics and astronomy Optics Phase retrieval Physics Spherical aberration Vortices |
| title | Phase retrieval and aberration correction in the presence of vortices in high-resolution transmission electron microscopy |
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