Optimization of adhesion mode atomic force microscopy resolves individual molecules in topography and adhesion
The force sensor of an atomic force microscope (AFM) is sensitive enough to measure single molecular binding strengths by means of a force–distance curve. In order to combine high-force sensitivity with the spatial resolution of an AFM in topography mode, adhesion mode has been developed. Since this...
Gespeichert in:
| Veröffentlicht in: | Ultramicroscopy 1999-10, Vol.80 (2), p.133-144 |
|---|---|
| Hauptverfasser: | , , , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 144 |
|---|---|
| container_issue | 2 |
| container_start_page | 133 |
| container_title | Ultramicroscopy |
| container_volume | 80 |
| creator | Willemsen, O.H Snel, M.M.E van Noort, S.J.T van der Werf, K.O Grooth, B.G.de Figdor, C.G Greve, J |
| description | The force sensor of an atomic force microscope (AFM) is sensitive enough to measure single molecular binding strengths by means of a force–distance curve. In order to combine high-force sensitivity with the spatial resolution of an AFM in topography mode, adhesion mode has been developed. Since this mode generates a force–distance curve for every pixel of an image, the measurement speed in liquid is limited by the viscous drag of the cantilever. We have equipped our adhesion mode AFM with a cantilever that has a low viscous drag in order to reach pixel frequencies of 65
Hz. Optimized filtering techniques combined with an auto-zero circuitry that reduces the drift in the deflection signal, limited high- and low-frequency fluctuations in the height signal to 0.3
nm. This reduction of the height noise, in combination with a thermally stabilized AFM, allowed the visualization of individual molecules on mica with an image quality comparable to tapping mode. The lateral resolution in both the topography and the simultaneously recorded adhesion image are only limited by the size of the tip. Hardware and software position feedback systems allows individual molecules to be followed in time during more than 30
min with scan sizes down to 60×60
nm
2 |
| doi_str_mv | 10.1016/S0304-3991(99)00099-6 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_70845057</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0304399199000996</els_id><sourcerecordid>70845057</sourcerecordid><originalsourceid>FETCH-LOGICAL-c437t-b01c67e7c44ff307d5c0e6ba29ea4a280bc6ebff3fe5122dcdc69063e5bcc0a83</originalsourceid><addsrcrecordid>eNqFkM1u1DAUha2qiA6FR2jlRVXBInCdHzteVVXFn1SpC2BtOdc31CiJg52MNDw9ycyoZcfKV_Z3ju2PsQsB7wUI-eEbFFBmhdbirdbvAEDrTJ6wjaiVznKVF6ds84ScsVcp_VogAWX9kp0JqHJZ6HrDhodx8r3_YycfBh5abt0jpXXugyNup9B75G2ISHyZYkgYxh2PlEK3pcT94PzWu9l2S6AjnLv9Jp_CGH5GOz7uuB3cU-tr9qK1XaI3x_Wc_fj08fvdl-z-4fPXu9v7DMtCTVkDAqUihWXZtgUoVyGQbGyuyZY2r6FBSc1y1FIl8tyhQ6lBFlQ1iGDr4pxdH3rHGH7PlCbT-4TUdXagMCejoC4rqNQCVgdw_VqK1Jox-t7GnRFgVtFmL9qsFo3WZi_ayCV3ebxgbnpy_6QOZhfg6gjYhLZrox3Qp2dOaFCw9twcMFpsbD1Fk9DTgOR8JJyMC_4_L_kLt9Cdrg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>70845057</pqid></control><display><type>article</type><title>Optimization of adhesion mode atomic force microscopy resolves individual molecules in topography and adhesion</title><source>MEDLINE</source><source>Elsevier ScienceDirect Journals Complete</source><creator>Willemsen, O.H ; Snel, M.M.E ; van Noort, S.J.T ; van der Werf, K.O ; Grooth, B.G.de ; Figdor, C.G ; Greve, J</creator><creatorcontrib>Willemsen, O.H ; Snel, M.M.E ; van Noort, S.J.T ; van der Werf, K.O ; Grooth, B.G.de ; Figdor, C.G ; Greve, J</creatorcontrib><description>The force sensor of an atomic force microscope (AFM) is sensitive enough to measure single molecular binding strengths by means of a force–distance curve. In order to combine high-force sensitivity with the spatial resolution of an AFM in topography mode, adhesion mode has been developed. Since this mode generates a force–distance curve for every pixel of an image, the measurement speed in liquid is limited by the viscous drag of the cantilever. We have equipped our adhesion mode AFM with a cantilever that has a low viscous drag in order to reach pixel frequencies of 65
Hz. Optimized filtering techniques combined with an auto-zero circuitry that reduces the drift in the deflection signal, limited high- and low-frequency fluctuations in the height signal to 0.3
nm. This reduction of the height noise, in combination with a thermally stabilized AFM, allowed the visualization of individual molecules on mica with an image quality comparable to tapping mode. The lateral resolution in both the topography and the simultaneously recorded adhesion image are only limited by the size of the tip. Hardware and software position feedback systems allows individual molecules to be followed in time during more than 30
min with scan sizes down to 60×60
nm
2</description><identifier>ISSN: 0304-3991</identifier><identifier>EISSN: 1879-2723</identifier><identifier>DOI: 10.1016/S0304-3991(99)00099-6</identifier><identifier>PMID: 10526398</identifier><identifier>CODEN: ULTRD6</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>Atomic force microscopes ; Evaluation Studies as Topic ; Exact sciences and technology ; Force mapping ; Humans ; Instrumentation ; Instruments, apparatus, components and techniques common to several branches of physics and astronomy ; Intercellular Adhesion Molecule-1 - metabolism ; Intercellular Adhesion Molecule-1 - ultrastructure ; Microscopy, Atomic Force - instrumentation ; Microscopy, Atomic Force - methods ; Molecular recognition ; Physics ; Scanning probe microscopes, components and techniques ; Single molecules ; Surface Properties</subject><ispartof>Ultramicroscopy, 1999-10, Vol.80 (2), p.133-144</ispartof><rights>1999 Elsevier Science B.V.</rights><rights>2000 INIST-CNRS</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c437t-b01c67e7c44ff307d5c0e6ba29ea4a280bc6ebff3fe5122dcdc69063e5bcc0a83</citedby><cites>FETCH-LOGICAL-c437t-b01c67e7c44ff307d5c0e6ba29ea4a280bc6ebff3fe5122dcdc69063e5bcc0a83</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/S0304-3991(99)00099-6$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,780,784,3550,27924,27925,45995</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=1190706$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/10526398$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Willemsen, O.H</creatorcontrib><creatorcontrib>Snel, M.M.E</creatorcontrib><creatorcontrib>van Noort, S.J.T</creatorcontrib><creatorcontrib>van der Werf, K.O</creatorcontrib><creatorcontrib>Grooth, B.G.de</creatorcontrib><creatorcontrib>Figdor, C.G</creatorcontrib><creatorcontrib>Greve, J</creatorcontrib><title>Optimization of adhesion mode atomic force microscopy resolves individual molecules in topography and adhesion</title><title>Ultramicroscopy</title><addtitle>Ultramicroscopy</addtitle><description>The force sensor of an atomic force microscope (AFM) is sensitive enough to measure single molecular binding strengths by means of a force–distance curve. In order to combine high-force sensitivity with the spatial resolution of an AFM in topography mode, adhesion mode has been developed. Since this mode generates a force–distance curve for every pixel of an image, the measurement speed in liquid is limited by the viscous drag of the cantilever. We have equipped our adhesion mode AFM with a cantilever that has a low viscous drag in order to reach pixel frequencies of 65
Hz. Optimized filtering techniques combined with an auto-zero circuitry that reduces the drift in the deflection signal, limited high- and low-frequency fluctuations in the height signal to 0.3
nm. This reduction of the height noise, in combination with a thermally stabilized AFM, allowed the visualization of individual molecules on mica with an image quality comparable to tapping mode. The lateral resolution in both the topography and the simultaneously recorded adhesion image are only limited by the size of the tip. Hardware and software position feedback systems allows individual molecules to be followed in time during more than 30
min with scan sizes down to 60×60
nm
2</description><subject>Atomic force microscopes</subject><subject>Evaluation Studies as Topic</subject><subject>Exact sciences and technology</subject><subject>Force mapping</subject><subject>Humans</subject><subject>Instrumentation</subject><subject>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</subject><subject>Intercellular Adhesion Molecule-1 - metabolism</subject><subject>Intercellular Adhesion Molecule-1 - ultrastructure</subject><subject>Microscopy, Atomic Force - instrumentation</subject><subject>Microscopy, Atomic Force - methods</subject><subject>Molecular recognition</subject><subject>Physics</subject><subject>Scanning probe microscopes, components and techniques</subject><subject>Single molecules</subject><subject>Surface Properties</subject><issn>0304-3991</issn><issn>1879-2723</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1999</creationdate><recordtype>article</recordtype><sourceid>EIF</sourceid><recordid>eNqFkM1u1DAUha2qiA6FR2jlRVXBInCdHzteVVXFn1SpC2BtOdc31CiJg52MNDw9ycyoZcfKV_Z3ju2PsQsB7wUI-eEbFFBmhdbirdbvAEDrTJ6wjaiVznKVF6ds84ScsVcp_VogAWX9kp0JqHJZ6HrDhodx8r3_YycfBh5abt0jpXXugyNup9B75G2ISHyZYkgYxh2PlEK3pcT94PzWu9l2S6AjnLv9Jp_CGH5GOz7uuB3cU-tr9qK1XaI3x_Wc_fj08fvdl-z-4fPXu9v7DMtCTVkDAqUihWXZtgUoVyGQbGyuyZY2r6FBSc1y1FIl8tyhQ6lBFlQ1iGDr4pxdH3rHGH7PlCbT-4TUdXagMCejoC4rqNQCVgdw_VqK1Jox-t7GnRFgVtFmL9qsFo3WZi_ayCV3ebxgbnpy_6QOZhfg6gjYhLZrox3Qp2dOaFCw9twcMFpsbD1Fk9DTgOR8JJyMC_4_L_kLt9Cdrg</recordid><startdate>19991001</startdate><enddate>19991001</enddate><creator>Willemsen, O.H</creator><creator>Snel, M.M.E</creator><creator>van Noort, S.J.T</creator><creator>van der Werf, K.O</creator><creator>Grooth, B.G.de</creator><creator>Figdor, C.G</creator><creator>Greve, J</creator><general>Elsevier B.V</general><general>Elsevier Science</general><scope>IQODW</scope><scope>CGR</scope><scope>CUY</scope><scope>CVF</scope><scope>ECM</scope><scope>EIF</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>19991001</creationdate><title>Optimization of adhesion mode atomic force microscopy resolves individual molecules in topography and adhesion</title><author>Willemsen, O.H ; Snel, M.M.E ; van Noort, S.J.T ; van der Werf, K.O ; Grooth, B.G.de ; Figdor, C.G ; Greve, J</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c437t-b01c67e7c44ff307d5c0e6ba29ea4a280bc6ebff3fe5122dcdc69063e5bcc0a83</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1999</creationdate><topic>Atomic force microscopes</topic><topic>Evaluation Studies as Topic</topic><topic>Exact sciences and technology</topic><topic>Force mapping</topic><topic>Humans</topic><topic>Instrumentation</topic><topic>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</topic><topic>Intercellular Adhesion Molecule-1 - metabolism</topic><topic>Intercellular Adhesion Molecule-1 - ultrastructure</topic><topic>Microscopy, Atomic Force - instrumentation</topic><topic>Microscopy, Atomic Force - methods</topic><topic>Molecular recognition</topic><topic>Physics</topic><topic>Scanning probe microscopes, components and techniques</topic><topic>Single molecules</topic><topic>Surface Properties</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Willemsen, O.H</creatorcontrib><creatorcontrib>Snel, M.M.E</creatorcontrib><creatorcontrib>van Noort, S.J.T</creatorcontrib><creatorcontrib>van der Werf, K.O</creatorcontrib><creatorcontrib>Grooth, B.G.de</creatorcontrib><creatorcontrib>Figdor, C.G</creatorcontrib><creatorcontrib>Greve, J</creatorcontrib><collection>Pascal-Francis</collection><collection>Medline</collection><collection>MEDLINE</collection><collection>MEDLINE (Ovid)</collection><collection>MEDLINE</collection><collection>MEDLINE</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Ultramicroscopy</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Willemsen, O.H</au><au>Snel, M.M.E</au><au>van Noort, S.J.T</au><au>van der Werf, K.O</au><au>Grooth, B.G.de</au><au>Figdor, C.G</au><au>Greve, J</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Optimization of adhesion mode atomic force microscopy resolves individual molecules in topography and adhesion</atitle><jtitle>Ultramicroscopy</jtitle><addtitle>Ultramicroscopy</addtitle><date>1999-10-01</date><risdate>1999</risdate><volume>80</volume><issue>2</issue><spage>133</spage><epage>144</epage><pages>133-144</pages><issn>0304-3991</issn><eissn>1879-2723</eissn><coden>ULTRD6</coden><abstract>The force sensor of an atomic force microscope (AFM) is sensitive enough to measure single molecular binding strengths by means of a force–distance curve. In order to combine high-force sensitivity with the spatial resolution of an AFM in topography mode, adhesion mode has been developed. Since this mode generates a force–distance curve for every pixel of an image, the measurement speed in liquid is limited by the viscous drag of the cantilever. We have equipped our adhesion mode AFM with a cantilever that has a low viscous drag in order to reach pixel frequencies of 65
Hz. Optimized filtering techniques combined with an auto-zero circuitry that reduces the drift in the deflection signal, limited high- and low-frequency fluctuations in the height signal to 0.3
nm. This reduction of the height noise, in combination with a thermally stabilized AFM, allowed the visualization of individual molecules on mica with an image quality comparable to tapping mode. The lateral resolution in both the topography and the simultaneously recorded adhesion image are only limited by the size of the tip. Hardware and software position feedback systems allows individual molecules to be followed in time during more than 30
min with scan sizes down to 60×60
nm
2</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><pmid>10526398</pmid><doi>10.1016/S0304-3991(99)00099-6</doi><tpages>12</tpages><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0304-3991 |
| ispartof | Ultramicroscopy, 1999-10, Vol.80 (2), p.133-144 |
| issn | 0304-3991 1879-2723 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_70845057 |
| source | MEDLINE; Elsevier ScienceDirect Journals Complete |
| subjects | Atomic force microscopes Evaluation Studies as Topic Exact sciences and technology Force mapping Humans Instrumentation Instruments, apparatus, components and techniques common to several branches of physics and astronomy Intercellular Adhesion Molecule-1 - metabolism Intercellular Adhesion Molecule-1 - ultrastructure Microscopy, Atomic Force - instrumentation Microscopy, Atomic Force - methods Molecular recognition Physics Scanning probe microscopes, components and techniques Single molecules Surface Properties |
| title | Optimization of adhesion mode atomic force microscopy resolves individual molecules in topography and adhesion |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T19%3A31%3A50IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Optimization%20of%20adhesion%20mode%20atomic%20force%20microscopy%20resolves%20individual%20molecules%20in%20topography%20and%20adhesion&rft.jtitle=Ultramicroscopy&rft.au=Willemsen,%20O.H&rft.date=1999-10-01&rft.volume=80&rft.issue=2&rft.spage=133&rft.epage=144&rft.pages=133-144&rft.issn=0304-3991&rft.eissn=1879-2723&rft.coden=ULTRD6&rft_id=info:doi/10.1016/S0304-3991(99)00099-6&rft_dat=%3Cproquest_cross%3E70845057%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=70845057&rft_id=info:pmid/10526398&rft_els_id=S0304399199000996&rfr_iscdi=true |