Skirting: A Limitation for the Performance of X-ray Microanalysis in the Variable Pressure or Environmental Scanning Electron Microscope
The variable pressure or environmental scanning electron microscope (VP‐SEM; ESEM) has become the microscope of choice for many scientists and technologists. Hence, the development of robust methods for X‐ray microanalysis, limited by skirting, has become critical. In this paper, two pressure variat...
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| Veröffentlicht in: | Scanning 2007-05, Vol.29 (3), p.114-122 |
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| creator | Le Berre, J. F. Demopoulos, G. P. Gauvin, R. |
| description | The variable pressure or environmental scanning electron microscope (VP‐SEM; ESEM) has become the microscope of choice for many scientists and technologists. Hence, the development of robust methods for X‐ray microanalysis, limited by skirting, has become critical. In this paper, two pressure variation correction methods (Doehne and Gauvin) are compared. Both of these methods appear to be effective; the results were found to be well within 10% of the values obtained at 0 Pa. The Doehne method is dependent on an empirical factor (D), therefore the accuracy of the results will depend on the accuracy of this value. Also the Doehne method is compromised by the nonlinearity of the response with pressure. The Gauvin method is more user‐friendly and more precise when considering the total range of pressure. SCANNING 29: 000‐V000, 2007. © 2007 Wiley Periodicals, Inc. |
| doi_str_mv | 10.1002/sca.20052 |
| format | Article |
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| source | Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals; Alma/SFX Local Collection |
| subjects | ESEM skirting VP-SEM X-ray microanalysis |
| title | Skirting: A Limitation for the Performance of X-ray Microanalysis in the Variable Pressure or Environmental Scanning Electron Microscope |
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