Measuring material softening with nanoscale spatial resolution using heated silicon probes

This article describes the use of heated silicon atomic force microscopy probes to perform local thermal analysis (LTA) of a thin film of polystyrene. The experiments measure film softening behavior with 100 nm spatial resolution, whereas previous research on LTA used probes that had a resolution ne...

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Veröffentlicht in:	Review of scientific instruments 2007-02, Vol.78 (2), p.023702-023702
Hauptverfasser:	Nelson, B A, King, W P
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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