Adaptive Q control for tapping-mode nanoscanning using a piezoactuated bimorph probe

A new approach, called adaptive Q control, for tapping-mode atomic force microscopy (AFM) is introduced and implemented on a homemade AFM setup utilizing a laser Doppler vibrometer and a piezoactuated bimorph probe. In standard Q control, the effective Q factor of the scanning probe is adjusted prio...

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Veröffentlicht in:	Review of scientific instruments 2007-04, Vol.78 (4), p.043707-043707-8
Hauptverfasser:	Gunev, Ihsan, Varol, Aydin, Karaman, Sertac, Basdogan, Cagatay
Format:	Artikel
Sprache:	eng
Schlagworte:	Calibration Engineering Sciences Instrumentation and Detectors Lasers Mechanical engineering Mechanics Microscopy, Atomic Force - methods Microscopy, Atomic Force - standards Physics Vibration
Online-Zugang:	Volltext
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