Near-field measurement of ZnS:Mn nanocrystal and bulk thin-film electroluminescent devices

A near-field study of the electro-optical phenomena and aging characteristics of nanostructured and bulk ZnS:Mn alternating-current thin-film electro-optical devices is presented. ZnS:Mn nanocrystals embedded in the glass matrices as well as ZnS:Mn thin-film phosphors contain four different concentrations of Mn (from 0.05 to 1.0 mol%). The activator impurity in the phosphor influences the spectral properties and, to a large extent, the temporal properties of optical emission and an aging process of the devices. Therefore, a local photoluminescence and electroluminescence investigation using a scanning near-field optical microscope technique is provided and the aging characteristics of ZnS:Mn nanocrystal structure also presented.