Exchange bias dependence on interface spin alignment in a Ni80Fe20/(Ni,Fe)O thin film

A Ni80Fe20/(Ni,Fe)O thin film exhibits a positive exchange bias when cooled in a zero field and a negative exchange bias when field cooled. With transmission electron microscopy and electron energy loss spectrometry, the composition and magnetic structure has been ascertained and a distribution of m...

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Veröffentlicht in:Physical review letters 2007-03, Vol.98 (9), p.097204-097204
Hauptverfasser: Ouyang, H, Lin, K-W, Liu, C-C, Lo, Shen-Chuan, Tzeng, Y-M, Guo, Z-Y, van Lierop, J
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container_end_page 097204
container_issue 9
container_start_page 097204
container_title Physical review letters
container_volume 98
creator Ouyang, H
Lin, K-W
Liu, C-C
Lo, Shen-Chuan
Tzeng, Y-M
Guo, Z-Y
van Lierop, J
description A Ni80Fe20/(Ni,Fe)O thin film exhibits a positive exchange bias when cooled in a zero field and a negative exchange bias when field cooled. With transmission electron microscopy and electron energy loss spectrometry, the composition and magnetic structure has been ascertained and a distribution of magnetization easy axes about the interface extrapolated. The results indicate that the positive exchange bias is from antiferromagnetic interface moments perpendicular to their ferromagnetic counterparts. With field cooling the alignment is put into a parallel configuration resulting in a negative exchange bias.
doi_str_mv 10.1103/PhysRevLett.98.097204
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fullrecord <record><control><sourceid>proquest_pubme</sourceid><recordid>TN_cdi_proquest_miscellaneous_70272884</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>70272884</sourcerecordid><originalsourceid>FETCH-LOGICAL-p209t-7d37626a0541dac03962011fef16efdd4f3f8daf741fa67406e0c6fb45eb6b823</originalsourceid><addsrcrecordid>eNo1kFFPwjAUhfugEUR_gqZPRhMHt-1ot0dDQE0IGCPPS7feQs1W5loM_Hsx4tPJl_PlPBxCbhgMGQMxetscwjt-zzHGYZ4NIVcc0jPSBxAsyQFUj1yG8AkAjMvsgvSYEuOc5aJPVtN9tdF-jbR0OlCDLXqDvkK69dT5iJ3VRwit81TXbu0b9JH-Al24DGbIYXS_cI8zfFjSuDkW1tXNFTm3ug54fcoBWc2mH5OXZL58fp08zZOWQx4TZYSSXGoYp8zoCkQuOTBm0TKJ1pjUCpsZbVXKrJYqBYlQSVumYyxlmXExIHd_u223_dphiEXjQoV1rT1ud6FQwBXPsvQo3p7EXdmgKdrONbo7FP9HiB_4E19G</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>70272884</pqid></control><display><type>article</type><title>Exchange bias dependence on interface spin alignment in a Ni80Fe20/(Ni,Fe)O thin film</title><source>American Physical Society Journals</source><creator>Ouyang, H ; Lin, K-W ; Liu, C-C ; Lo, Shen-Chuan ; Tzeng, Y-M ; Guo, Z-Y ; van Lierop, J</creator><creatorcontrib>Ouyang, H ; Lin, K-W ; Liu, C-C ; Lo, Shen-Chuan ; Tzeng, Y-M ; Guo, Z-Y ; van Lierop, J</creatorcontrib><description>A Ni80Fe20/(Ni,Fe)O thin film exhibits a positive exchange bias when cooled in a zero field and a negative exchange bias when field cooled. With transmission electron microscopy and electron energy loss spectrometry, the composition and magnetic structure has been ascertained and a distribution of magnetization easy axes about the interface extrapolated. The results indicate that the positive exchange bias is from antiferromagnetic interface moments perpendicular to their ferromagnetic counterparts. With field cooling the alignment is put into a parallel configuration resulting in a negative exchange bias.</description><identifier>ISSN: 0031-9007</identifier><identifier>DOI: 10.1103/PhysRevLett.98.097204</identifier><identifier>PMID: 17359193</identifier><language>eng</language><publisher>United States</publisher><ispartof>Physical review letters, 2007-03, Vol.98 (9), p.097204-097204</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27903,27904</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/17359193$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Ouyang, H</creatorcontrib><creatorcontrib>Lin, K-W</creatorcontrib><creatorcontrib>Liu, C-C</creatorcontrib><creatorcontrib>Lo, Shen-Chuan</creatorcontrib><creatorcontrib>Tzeng, Y-M</creatorcontrib><creatorcontrib>Guo, Z-Y</creatorcontrib><creatorcontrib>van Lierop, J</creatorcontrib><title>Exchange bias dependence on interface spin alignment in a Ni80Fe20/(Ni,Fe)O thin film</title><title>Physical review letters</title><addtitle>Phys Rev Lett</addtitle><description>A Ni80Fe20/(Ni,Fe)O thin film exhibits a positive exchange bias when cooled in a zero field and a negative exchange bias when field cooled. With transmission electron microscopy and electron energy loss spectrometry, the composition and magnetic structure has been ascertained and a distribution of magnetization easy axes about the interface extrapolated. The results indicate that the positive exchange bias is from antiferromagnetic interface moments perpendicular to their ferromagnetic counterparts. With field cooling the alignment is put into a parallel configuration resulting in a negative exchange bias.</description><issn>0031-9007</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><recordid>eNo1kFFPwjAUhfugEUR_gqZPRhMHt-1ot0dDQE0IGCPPS7feQs1W5loM_Hsx4tPJl_PlPBxCbhgMGQMxetscwjt-zzHGYZ4NIVcc0jPSBxAsyQFUj1yG8AkAjMvsgvSYEuOc5aJPVtN9tdF-jbR0OlCDLXqDvkK69dT5iJ3VRwit81TXbu0b9JH-Al24DGbIYXS_cI8zfFjSuDkW1tXNFTm3ug54fcoBWc2mH5OXZL58fp08zZOWQx4TZYSSXGoYp8zoCkQuOTBm0TKJ1pjUCpsZbVXKrJYqBYlQSVumYyxlmXExIHd_u223_dphiEXjQoV1rT1ud6FQwBXPsvQo3p7EXdmgKdrONbo7FP9HiB_4E19G</recordid><startdate>20070302</startdate><enddate>20070302</enddate><creator>Ouyang, H</creator><creator>Lin, K-W</creator><creator>Liu, C-C</creator><creator>Lo, Shen-Chuan</creator><creator>Tzeng, Y-M</creator><creator>Guo, Z-Y</creator><creator>van Lierop, J</creator><scope>NPM</scope><scope>7X8</scope></search><sort><creationdate>20070302</creationdate><title>Exchange bias dependence on interface spin alignment in a Ni80Fe20/(Ni,Fe)O thin film</title><author>Ouyang, H ; Lin, K-W ; Liu, C-C ; Lo, Shen-Chuan ; Tzeng, Y-M ; Guo, Z-Y ; van Lierop, J</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p209t-7d37626a0541dac03962011fef16efdd4f3f8daf741fa67406e0c6fb45eb6b823</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2007</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ouyang, H</creatorcontrib><creatorcontrib>Lin, K-W</creatorcontrib><creatorcontrib>Liu, C-C</creatorcontrib><creatorcontrib>Lo, Shen-Chuan</creatorcontrib><creatorcontrib>Tzeng, Y-M</creatorcontrib><creatorcontrib>Guo, Z-Y</creatorcontrib><creatorcontrib>van Lierop, J</creatorcontrib><collection>PubMed</collection><collection>MEDLINE - Academic</collection><jtitle>Physical review letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Ouyang, H</au><au>Lin, K-W</au><au>Liu, C-C</au><au>Lo, Shen-Chuan</au><au>Tzeng, Y-M</au><au>Guo, Z-Y</au><au>van Lierop, J</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Exchange bias dependence on interface spin alignment in a Ni80Fe20/(Ni,Fe)O thin film</atitle><jtitle>Physical review letters</jtitle><addtitle>Phys Rev Lett</addtitle><date>2007-03-02</date><risdate>2007</risdate><volume>98</volume><issue>9</issue><spage>097204</spage><epage>097204</epage><pages>097204-097204</pages><issn>0031-9007</issn><abstract>A Ni80Fe20/(Ni,Fe)O thin film exhibits a positive exchange bias when cooled in a zero field and a negative exchange bias when field cooled. With transmission electron microscopy and electron energy loss spectrometry, the composition and magnetic structure has been ascertained and a distribution of magnetization easy axes about the interface extrapolated. The results indicate that the positive exchange bias is from antiferromagnetic interface moments perpendicular to their ferromagnetic counterparts. With field cooling the alignment is put into a parallel configuration resulting in a negative exchange bias.</abstract><cop>United States</cop><pmid>17359193</pmid><doi>10.1103/PhysRevLett.98.097204</doi><tpages>1</tpages></addata></record>
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title Exchange bias dependence on interface spin alignment in a Ni80Fe20/(Ni,Fe)O thin film
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-23T16%3A41%3A41IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_pubme&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Exchange%20bias%20dependence%20on%20interface%20spin%20alignment%20in%20a%20Ni80Fe20/(Ni,Fe)O%20thin%20film&rft.jtitle=Physical%20review%20letters&rft.au=Ouyang,%20H&rft.date=2007-03-02&rft.volume=98&rft.issue=9&rft.spage=097204&rft.epage=097204&rft.pages=097204-097204&rft.issn=0031-9007&rft_id=info:doi/10.1103/PhysRevLett.98.097204&rft_dat=%3Cproquest_pubme%3E70272884%3C/proquest_pubme%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=70272884&rft_id=info:pmid/17359193&rfr_iscdi=true