Electron tomography of regularly shaped nanostructures under non-linear image acquisition

Electron tomography allows the 3D quantitative characterization of nanostructures, provided a monotonic relationship is fulfilled between the projected signal and the atomic number and thickness of the specimen. This requirement is not satisfied if the micrographs are affected by (i) diffraction con...

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Veröffentlicht in:	Journal of microscopy (Oxford) 2008-10, Vol.232 (1), p.186-195
Hauptverfasser:	SAGHI, Z, XU, X, MÖBUS, G
Format:	Artikel
Sprache:	eng
Schlagworte:	Electron tomography geometric tomography projection linearity simulations TEM
Online-Zugang:	Volltext
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