Quantification of Free-Carrier Absorption in Silicon Nanocrystals with an Optical Microcavity

We present a highly sensitive and accurate microcavity-based technique to quantify the free-carrier absorption (FCA) cross-section of semiconductor quantum-dot ensembles. The procedure is based on measuring the pump-intensity-dependent broadening of the whispering gallery modes (WGMs) of microdisk r...

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Veröffentlicht in:	Nano letters 2008-11, Vol.8 (11), p.3787-3793
Hauptverfasser:	Kekatpure, Rohan D, Brongersma, Mark L
Format:	Artikel
Sprache:	eng
Schlagworte:	Cross-disciplinary physics: materials science rheology Exact sciences and technology Materials science Nanocrystalline materials Nanoscale materials and structures: fabrication and characterization Physics
Online-Zugang:	Volltext
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