The secondary electron emission yield for 24 solid elements excited by primary electrons in the range 250-5000 ev: a theory/experiment comparison

The secondary electron (SE) yield, δ, was measured from 24 different elements at low primary beam energy (250–5,000 eV). Surface contamination affects the intensity of δ but not its variation with primary electron energy. The experiments suggest that the mean free path of SEs varies across the d ban...

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Veröffentlicht in:	Scanning 2008-09, Vol.30 (5), p.365-380
Hauptverfasser:	Walker, C.G.H., El-Gomati, M.M., Assa'd, A.M.D., Zadražil, M.
Format:	Artikel
Sprache:	eng
Schlagworte:	d band inelastic mean free path low energy Monte Carlo secondary electron yield
Online-Zugang:	Volltext
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