Single-shot spatial-coherence measurement of 13 nm high-order harmonic beam by a Young's double-slit measurement

The interference pattern produced by a single 13 nm high-order harmonic pulse is captured by an extreme-ultraviolet CCD camera. A beam divergence of 0.35 mrad and a high fringe visibility of 0.96 are obtained with an optimal phase-matching condition for the 13 nm harmonics. The spatial coherence len...

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Veröffentlicht in:Optics letters 2007-03, Vol.32 (6), p.722-724
Hauptverfasser: NAGATA, Yutaka, FURUSAWA, Kentaro, NABEKAWA, Yasuo, MIDORIKAWA, Katsumi
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container_title Optics letters
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creator NAGATA, Yutaka
FURUSAWA, Kentaro
NABEKAWA, Yasuo
MIDORIKAWA, Katsumi
description The interference pattern produced by a single 13 nm high-order harmonic pulse is captured by an extreme-ultraviolet CCD camera. A beam divergence of 0.35 mrad and a high fringe visibility of 0.96 are obtained with an optimal phase-matching condition for the 13 nm harmonics. The spatial coherence length of the 13 nm harmonics selected by Mo/Si multilayer mirrors is larger than the beam diameter. This result shows that the 13 nm harmonic beam is useful for applications in interferometry, time-resolved studies of ultrafast dynamics.
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source Optica Publishing Group Journals
subjects Coherence
Electromagnetism
electron and ion optics
Exact sciences and technology
Fundamental areas of phenomenology (including applications)
Interference
Nonlinear optics
Optics
Physics
Ultrafast processes
optical pulse generation and pulse compression
Wave optics
X-ray beams and x-ray optics
title Single-shot spatial-coherence measurement of 13 nm high-order harmonic beam by a Young's double-slit measurement
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