Determination of optical constants of scandium films in the 20-1000 eV range
The transmittance of thin films of Sc deposited by evaporation in ultrahigh vacuum conditions has been investigated in the 20-1000 eV spectral range. Transmittance measurements were performed in situ on Sc layers that were deposited over grids coated with a C support film. Transmittance measurements...
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| Veröffentlicht in: | Journal of the Optical Society of America. A, Optics, image science, and vision Optics, image science, and vision, 2006-11, Vol.23 (11), p.2880-2887 |
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| container_end_page | 2887 |
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| container_issue | 11 |
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| container_title | Journal of the Optical Society of America. A, Optics, image science, and vision |
| container_volume | 23 |
| creator | FERNANDEZ-PEREA, Monica LARRUQUERT, Juan I AZNAREZ, José A MENDEZ, José A POLETTO, Luca MALVEZZI, A. Marco GIGLIA, Angelo NANNARONE, Stefano |
| description | The transmittance of thin films of Sc deposited by evaporation in ultrahigh vacuum conditions has been investigated in the 20-1000 eV spectral range. Transmittance measurements were performed in situ on Sc layers that were deposited over grids coated with a C support film. Transmittance measurements were used to obtain the extinction coefficient of Sc films at each individual photon energy investigated. These data, along with the data available in the literature for the rest of the spectrum, were used to obtain the refractive index of Sc by means of the Kramers-Krönig analysis. Sum-rule tests indicated an acceptable consistency of the data. |
| doi_str_mv | 10.1364/JOSAA.23.002880 |
| format | Article |
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Sum-rule tests indicated an acceptable consistency of the data.</description><identifier>ISSN: 1084-7529</identifier><identifier>EISSN: 1520-8532</identifier><identifier>DOI: 10.1364/JOSAA.23.002880</identifier><identifier>PMID: 17047716</identifier><language>eng</language><publisher>Washington, DC: Optical Society of America</publisher><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Exact sciences and technology ; Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity ; Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation ; Optical properties of bulk materials and thin films ; Physics</subject><ispartof>Journal of the Optical Society of America. 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Marco</creatorcontrib><creatorcontrib>GIGLIA, Angelo</creatorcontrib><creatorcontrib>NANNARONE, Stefano</creatorcontrib><title>Determination of optical constants of scandium films in the 20-1000 eV range</title><title>Journal of the Optical Society of America. A, Optics, image science, and vision</title><addtitle>J Opt Soc Am A Opt Image Sci Vis</addtitle><description>The transmittance of thin films of Sc deposited by evaporation in ultrahigh vacuum conditions has been investigated in the 20-1000 eV spectral range. Transmittance measurements were performed in situ on Sc layers that were deposited over grids coated with a C support film. Transmittance measurements were used to obtain the extinction coefficient of Sc films at each individual photon energy investigated. These data, along with the data available in the literature for the rest of the spectrum, were used to obtain the refractive index of Sc by means of the Kramers-Krönig analysis. Sum-rule tests indicated an acceptable consistency of the data.</description><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Exact sciences and technology</subject><subject>Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity</subject><subject>Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation</subject><subject>Optical properties of bulk materials and thin films</subject><subject>Physics</subject><issn>1084-7529</issn><issn>1520-8532</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2006</creationdate><recordtype>article</recordtype><recordid>eNpFkLtPwzAQhy0EoqUwsyEvsKX1M3bGqrxVqQOP1XIcG4wSp8TOwH-PSysxWGedvvud7gPgEqM5piVbPG9elss5oXOEiJToCEwxJ6iQnJLj_EeSFYKTagLOYvxCCLFSilMwwQIxIXA5Betbm-zQ-aCT7wPsHey3yRvdQtOHmHRIcdeMRofGjx10vu0i9AGmTwvzJpxDoX2Hgw4f9hycON1Ge3GoM_B2f_e6eizWm4en1XJdGEp4KlhTa0p1Q2ptJMJNzSpLuWOsYtJwQTV1jJuGCJmfYIY73riqJJZKhkgGZuBmn7sd-u_RxqQ6H41tWx1sP0ZVyqpEHOEMLvagGfoYB-vUdvCdHn4URmonUP0JVISqvcA8cXWIHuvONv_8wVgGrg-AzlJalw83Pv5zkhAuS05_AUQhdpA</recordid><startdate>20061101</startdate><enddate>20061101</enddate><creator>FERNANDEZ-PEREA, Monica</creator><creator>LARRUQUERT, Juan I</creator><creator>AZNAREZ, José A</creator><creator>MENDEZ, José A</creator><creator>POLETTO, Luca</creator><creator>MALVEZZI, A. 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A, Optics, image science, and vision</jtitle><addtitle>J Opt Soc Am A Opt Image Sci Vis</addtitle><date>2006-11-01</date><risdate>2006</risdate><volume>23</volume><issue>11</issue><spage>2880</spage><epage>2887</epage><pages>2880-2887</pages><issn>1084-7529</issn><eissn>1520-8532</eissn><abstract>The transmittance of thin films of Sc deposited by evaporation in ultrahigh vacuum conditions has been investigated in the 20-1000 eV spectral range. Transmittance measurements were performed in situ on Sc layers that were deposited over grids coated with a C support film. Transmittance measurements were used to obtain the extinction coefficient of Sc films at each individual photon energy investigated. These data, along with the data available in the literature for the rest of the spectrum, were used to obtain the refractive index of Sc by means of the Kramers-Krönig analysis. Sum-rule tests indicated an acceptable consistency of the data.</abstract><cop>Washington, DC</cop><pub>Optical Society of America</pub><pmid>17047716</pmid><doi>10.1364/JOSAA.23.002880</doi><tpages>8</tpages></addata></record> |
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| language | eng |
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| subjects | Condensed matter: electronic structure, electrical, magnetic, and optical properties Exact sciences and technology Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of bulk materials and thin films Physics |
| title | Determination of optical constants of scandium films in the 20-1000 eV range |
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