Waveguide analysis of heat-drawn and chemically etched probe tips for scanning near-field optical microscopy

We analyze two basic aspects of a scanning near-field optical microscope (SNOM) probe's operation: (i) spot-size evolution of the electric field along the probe with and without a metal layer, and (ii) a modal analysis of the SNOM probe, particularly in close proximity to the aperture. A slab w...

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Veröffentlicht in:	Applied Optics 2006-09, Vol.45 (25), p.6442-6456
Hauptverfasser:	Moar, Peter N, Love, John D, Ladouceur, François, Cahill, Laurence W
Format:	Artikel
Sprache:	eng
Schlagworte:	Computer-Aided Design Electroplating Equipment Design Equipment Failure Analysis Hot Temperature Microscopy, Atomic Force - instrumentation Microscopy, Atomic Force - methods Microscopy, Confocal - instrumentation Microscopy, Confocal - methods Reproducibility of Results Sensitivity and Specificity Transducers
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