Waveguide analysis of heat-drawn and chemically etched probe tips for scanning near-field optical microscopy
We analyze two basic aspects of a scanning near-field optical microscope (SNOM) probe's operation: (i) spot-size evolution of the electric field along the probe with and without a metal layer, and (ii) a modal analysis of the SNOM probe, particularly in close proximity to the aperture. A slab w...
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| Veröffentlicht in: | Applied Optics 2006-09, Vol.45 (25), p.6442-6456 |
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| container_title | Applied Optics |
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| creator | Moar, Peter N Love, John D Ladouceur, François Cahill, Laurence W |
| description | We analyze two basic aspects of a scanning near-field optical microscope (SNOM) probe's operation: (i) spot-size evolution of the electric field along the probe with and without a metal layer, and (ii) a modal analysis of the SNOM probe, particularly in close proximity to the aperture. A slab waveguide model is utilized to minimize the analytical complexity, yet provides useful quantitative results--including losses associated with the metal coating--which can then be used as design rules. |
| doi_str_mv | 10.1364/AO.45.006442 |
| format | Article |
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| identifier | ISSN: 1559-128X |
| ispartof | Applied Optics, 2006-09, Vol.45 (25), p.6442-6456 |
| issn | 1559-128X 0003-6935 1539-4522 |
| language | eng |
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| source | MEDLINE; Alma/SFX Local Collection; Optica Publishing Group Journals |
| subjects | Computer-Aided Design Electroplating Equipment Design Equipment Failure Analysis Hot Temperature Microscopy, Atomic Force - instrumentation Microscopy, Atomic Force - methods Microscopy, Confocal - instrumentation Microscopy, Confocal - methods Reproducibility of Results Sensitivity and Specificity Transducers |
| title | Waveguide analysis of heat-drawn and chemically etched probe tips for scanning near-field optical microscopy |
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