AFM colloidal forces measured between microscopic probes and flat substrates in nanoparticle suspensions

Colloidal forces between atomic force microscopy probes of 0.12 and 0.58 N/m spring constant and flat substrates in nanoparticle suspensions were measured. Silicon nitride tips and glass spheres with a diameter of 5 and 15 μm were used as the probes whereas mica and silicon wafer were used as substr...

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Veröffentlicht in:	Journal of colloid and interface science 2006-09, Vol.301 (2), p.511-522
Hauptverfasser:	Drelich, J., Long, J., Xu, Z., Masliyah, J., Nalaskowski, J., Beauchamp, R., Liu, Y.
Format:	Artikel
Sprache:	eng
Schlagworte:	Chemistry Colloidal forces Colloidal state and disperse state Exact sciences and technology General and physical chemistry Nanofluid Nanoparticles Physical and chemical studies. Granulometry. Electrokinetic phenomena Structural forces Suspensions
Online-Zugang:	Volltext
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