Measurements of light scattering from glass substrates by total integrated scattering

Measurements of light scattering from glass substrates by total integrated scattering

A total integrated scattering (TIS) measurement was performed to investigate the surface and volume scattering of K9 glass substrates with low reflectance. Ag layers with thicknesses of 60 nm were deposited on the front and back surfaces of the K9 glass substrates by the magnetron sputtering techniq...

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Veröffentlicht in:Applied Optics 2005-10, Vol.44 (29), p.6163-6166
Hauptverfasser: Hou, Haihong, Yi, Kui, Shang, Shuzhen, Shao, Jianda, Fan, Zhengxiu
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container_issue 29
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container_title Applied Optics
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creator Hou, Haihong
Yi, Kui
Shang, Shuzhen
Shao, Jianda
Fan, Zhengxiu
description A total integrated scattering (TIS) measurement was performed to investigate the surface and volume scattering of K9 glass substrates with low reflectance. Ag layers with thicknesses of 60 nm were deposited on the front and back surfaces of the K9 glass substrates by the magnetron sputtering technique. Surface scattering of the K9 glass substrate was obtained by the TIS measurement of the Ag layers on the assumption that the Ag layers and the K9 substrate had the same surface profile. Volume scattering of the substrates was deduced by subtracting the front and back surface scattering from the total scattering of the substrates.
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_68716044</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>68716044</sourcerecordid><originalsourceid>FETCH-LOGICAL-c355t-d78d97fbbd04d722598f9613a4b03b7da73a6f81a6985430dd42cb94796cf19d3</originalsourceid><addsrcrecordid>eNpNkEtLAzEUhYMotlZ3riUrV07NO5NlKb6g0o0FdyGZJOPIPGqSWfTf29KCrs7l8N2z-AC4xWiOqWCPZpgzNkdIYEHPwBRzqgrGCTk_3FwVmJSfE3CV0jdClDMlL8EEC0KlImoKNu_epDH6zvc5wSHAtqm_MkyVydnHpq9hiEMH69akBNNoU44m-wTtDuYhmxY2ffb1oXP_nq7BRTBt8jennIHN89PH8rVYrV_elotVUVHOc-Fk6ZQM1jrEnCSEqzIogalhFlErnZHUiFBiI1TJGUXOMVJZxaQSVcDK0Rm4P-5u4_Az-pR116TKt63p_TAmLUqJBWJsDz4cwSoOKUUf9DY2nYk7jZE-aNSLtWZMHzXu8bvT7mg77_7gkzf6C9REbrc</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>68716044</pqid></control><display><type>article</type><title>Measurements of light scattering from glass substrates by total integrated scattering</title><source>Alma/SFX Local Collection</source><source>Optica Publishing Group Journals</source><creator>Hou, Haihong ; Yi, Kui ; Shang, Shuzhen ; Shao, Jianda ; Fan, Zhengxiu</creator><creatorcontrib>Hou, Haihong ; Yi, Kui ; Shang, Shuzhen ; Shao, Jianda ; Fan, Zhengxiu</creatorcontrib><description>A total integrated scattering (TIS) measurement was performed to investigate the surface and volume scattering of K9 glass substrates with low reflectance. Ag layers with thicknesses of 60 nm were deposited on the front and back surfaces of the K9 glass substrates by the magnetron sputtering technique. Surface scattering of the K9 glass substrate was obtained by the TIS measurement of the Ag layers on the assumption that the Ag layers and the K9 substrate had the same surface profile. Volume scattering of the substrates was deduced by subtracting the front and back surface scattering from the total scattering of the substrates.</description><identifier>ISSN: 1559-128X</identifier><identifier>ISSN: 0003-6935</identifier><identifier>EISSN: 1539-4522</identifier><identifier>DOI: 10.1364/ao.44.006163</identifier><identifier>PMID: 16237929</identifier><language>eng</language><publisher>United States</publisher><ispartof>Applied Optics, 2005-10, Vol.44 (29), p.6163-6166</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c355t-d78d97fbbd04d722598f9613a4b03b7da73a6f81a6985430dd42cb94796cf19d3</citedby><cites>FETCH-LOGICAL-c355t-d78d97fbbd04d722598f9613a4b03b7da73a6f81a6985430dd42cb94796cf19d3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,777,781,27906,27907</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/16237929$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Hou, Haihong</creatorcontrib><creatorcontrib>Yi, Kui</creatorcontrib><creatorcontrib>Shang, Shuzhen</creatorcontrib><creatorcontrib>Shao, Jianda</creatorcontrib><creatorcontrib>Fan, Zhengxiu</creatorcontrib><title>Measurements of light scattering from glass substrates by total integrated scattering</title><title>Applied Optics</title><addtitle>Appl Opt</addtitle><description>A total integrated scattering (TIS) measurement was performed to investigate the surface and volume scattering of K9 glass substrates with low reflectance. Ag layers with thicknesses of 60 nm were deposited on the front and back surfaces of the K9 glass substrates by the magnetron sputtering technique. Surface scattering of the K9 glass substrate was obtained by the TIS measurement of the Ag layers on the assumption that the Ag layers and the K9 substrate had the same surface profile. Volume scattering of the substrates was deduced by subtracting the front and back surface scattering from the total scattering of the substrates.</description><issn>1559-128X</issn><issn>0003-6935</issn><issn>1539-4522</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNpNkEtLAzEUhYMotlZ3riUrV07NO5NlKb6g0o0FdyGZJOPIPGqSWfTf29KCrs7l8N2z-AC4xWiOqWCPZpgzNkdIYEHPwBRzqgrGCTk_3FwVmJSfE3CV0jdClDMlL8EEC0KlImoKNu_epDH6zvc5wSHAtqm_MkyVydnHpq9hiEMH69akBNNoU44m-wTtDuYhmxY2ffb1oXP_nq7BRTBt8jennIHN89PH8rVYrV_elotVUVHOc-Fk6ZQM1jrEnCSEqzIogalhFlErnZHUiFBiI1TJGUXOMVJZxaQSVcDK0Rm4P-5u4_Az-pR116TKt63p_TAmLUqJBWJsDz4cwSoOKUUf9DY2nYk7jZE-aNSLtWZMHzXu8bvT7mg77_7gkzf6C9REbrc</recordid><startdate>20051010</startdate><enddate>20051010</enddate><creator>Hou, Haihong</creator><creator>Yi, Kui</creator><creator>Shang, Shuzhen</creator><creator>Shao, Jianda</creator><creator>Fan, Zhengxiu</creator><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>20051010</creationdate><title>Measurements of light scattering from glass substrates by total integrated scattering</title><author>Hou, Haihong ; Yi, Kui ; Shang, Shuzhen ; Shao, Jianda ; Fan, Zhengxiu</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c355t-d78d97fbbd04d722598f9613a4b03b7da73a6f81a6985430dd42cb94796cf19d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Hou, Haihong</creatorcontrib><creatorcontrib>Yi, Kui</creatorcontrib><creatorcontrib>Shang, Shuzhen</creatorcontrib><creatorcontrib>Shao, Jianda</creatorcontrib><creatorcontrib>Fan, Zhengxiu</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Applied Optics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Hou, Haihong</au><au>Yi, Kui</au><au>Shang, Shuzhen</au><au>Shao, Jianda</au><au>Fan, Zhengxiu</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Measurements of light scattering from glass substrates by total integrated scattering</atitle><jtitle>Applied Optics</jtitle><addtitle>Appl Opt</addtitle><date>2005-10-10</date><risdate>2005</risdate><volume>44</volume><issue>29</issue><spage>6163</spage><epage>6166</epage><pages>6163-6166</pages><issn>1559-128X</issn><issn>0003-6935</issn><eissn>1539-4522</eissn><abstract>A total integrated scattering (TIS) measurement was performed to investigate the surface and volume scattering of K9 glass substrates with low reflectance. Ag layers with thicknesses of 60 nm were deposited on the front and back surfaces of the K9 glass substrates by the magnetron sputtering technique. Surface scattering of the K9 glass substrate was obtained by the TIS measurement of the Ag layers on the assumption that the Ag layers and the K9 substrate had the same surface profile. Volume scattering of the substrates was deduced by subtracting the front and back surface scattering from the total scattering of the substrates.</abstract><cop>United States</cop><pmid>16237929</pmid><doi>10.1364/ao.44.006163</doi><tpages>4</tpages></addata></record>
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title Measurements of light scattering from glass substrates by total integrated scattering
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-17T09%3A37%3A56IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Measurements%20of%20light%20scattering%20from%20glass%20substrates%20by%20total%20integrated%20scattering&rft.jtitle=Applied%20Optics&rft.au=Hou,%20Haihong&rft.date=2005-10-10&rft.volume=44&rft.issue=29&rft.spage=6163&rft.epage=6166&rft.pages=6163-6166&rft.issn=1559-128X&rft.eissn=1539-4522&rft_id=info:doi/10.1364/ao.44.006163&rft_dat=%3Cproquest_cross%3E68716044%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=68716044&rft_id=info:pmid/16237929&rfr_iscdi=true