Fourier transform approach for thickness estimation of reflecting interference filters

An empirical procedure based on optical-density-bandwidth products was recently proposed for thickness estimation of dielectric thin film reflectors. A parallel is established with new results derived from the Fourier transform thin film synthesis technique. Two Fourier-transform approaches are prop...

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Veröffentlicht in:	Applied Optics 2006-08, Vol.45 (22), p.5636-5641
1. Verfasser:	Verly, Pierre G
Format:	Artikel
Sprache:	eng
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container_title	Applied Optics
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creator	Verly, Pierre G
description	An empirical procedure based on optical-density-bandwidth products was recently proposed for thickness estimation of dielectric thin film reflectors. A parallel is established with new results derived from the Fourier transform thin film synthesis technique. Two Fourier-transform approaches are proposed and justified by numerical examples.
doi_str_mv	10.1364/AO.45.005636
format	Article
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title	Fourier transform approach for thickness estimation of reflecting interference filters
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