Phase measurement for accurate mapping of chemical bonds in acentric space groups
Although the electron density is fundamental to the study of chemical bonding and density-functional theory, it cannot be accurately mapped experimentally for the important class of crystals lacking inversion symmetry, since structure factor phase information is normally inaccessible. We report the...
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Veröffentlicht in: | PHYSICAL REVIEW LETTERS 2005-08, Vol.95 (8), p.085502-085502, Article 085502 |
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creator | SPACKMAN, M. A JIANG, B GROY, T. L HE, H WHITTEN, A. E SPENCE, J. C. H |
description | Although the electron density is fundamental to the study of chemical bonding and density-functional theory, it cannot be accurately mapped experimentally for the important class of crystals lacking inversion symmetry, since structure factor phase information is normally inaccessible. We report the combination of x-ray and electron diffraction experiments for the determination of the electron density in acentric AlN, using multiple-scattering effects in convergent-beam electron diffraction to obtain sensitivity to structure factor phases, and describe a new error metric and weighting scheme for multipole refinement using combined measurements of structure factor magnitudes and phases. |
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We report the combination of x-ray and electron diffraction experiments for the determination of the electron density in acentric AlN, using multiple-scattering effects in convergent-beam electron diffraction to obtain sensitivity to structure factor phases, and describe a new error metric and weighting scheme for multipole refinement using combined measurements of structure factor magnitudes and phases.</description><identifier>ISSN: 0031-9007</identifier><identifier>EISSN: 1079-7114</identifier><identifier>DOI: 10.1103/PhysRevLett.95.085502</identifier><identifier>PMID: 16196869</identifier><identifier>CODEN: PRLTAO</identifier><language>eng</language><publisher>Ridge, NY: American Physical Society</publisher><subject>Condensed matter: structure, mechanical and thermal properties ; Exact sciences and technology ; MATERIALS SCIENCE ; Physics ; Single-crystal and powder diffraction ; Structure of solids and liquids; crystallography ; X-ray diffraction and scattering</subject><ispartof>PHYSICAL REVIEW LETTERS, 2005-08, Vol.95 (8), p.085502-085502, Article 085502</ispartof><rights>2007 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c364t-e9169713822f5eb6438cd416f2e282833e98ca0171407d58fb39b71a055dc8473</citedby><cites>FETCH-LOGICAL-c364t-e9169713822f5eb6438cd416f2e282833e98ca0171407d58fb39b71a055dc8473</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,778,782,883,2865,2866,27907,27908</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=17535632$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/16196869$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink><backlink>$$Uhttps://www.osti.gov/biblio/1164075$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>SPACKMAN, M. 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We report the combination of x-ray and electron diffraction experiments for the determination of the electron density in acentric AlN, using multiple-scattering effects in convergent-beam electron diffraction to obtain sensitivity to structure factor phases, and describe a new error metric and weighting scheme for multipole refinement using combined measurements of structure factor magnitudes and phases.</description><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Exact sciences and technology</subject><subject>MATERIALS SCIENCE</subject><subject>Physics</subject><subject>Single-crystal and powder diffraction</subject><subject>Structure of solids and liquids; crystallography</subject><subject>X-ray diffraction and scattering</subject><issn>0031-9007</issn><issn>1079-7114</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNpNkFuLFDEQRoMo7rj6E5Qg6FuPqU7n9iiLNxhwFX0O6XT1TmS606a6hf33RmZgfaqCOl9VcRh7CWIPIOS72-M9fcc_B1zXvVN7YZUS7SO2A2FcYwC6x2wnhITGCWGu2DOiX0IIaLV9yq5Ag9NWux37dnsMhHzCQFvBCeeVj7nwEONWwloHYVnSfMfzyOMRpxTDifd5HoinuVKVLylyWmrL70reFnrOnozhRPjiUq_Zz48fftx8bg5fP325eX9ootTd2qAD7QxI27ajwl530sahAz222NrWSonOxiDAQCfMoOzYS9cbCEKpIdrOyGv2-rw305o8xbRiPMY8zxhXD6BrTFXo7RlaSv69Ia1-ShTxdAoz5o18ldAZ0ekKqjMYSyYqOPqlpCmUew_C_xPu_xPunfJn4TX36nJg6yccHlIXwxV4cwECVXljCXNM9MDVJ5WWrfwLqDuLAg</recordid><startdate>20050819</startdate><enddate>20050819</enddate><creator>SPACKMAN, M. 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H</creatorcontrib><creatorcontrib>John Spence/Arizona State University</creatorcontrib><collection>Pascal-Francis</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><collection>OSTI.GOV</collection><jtitle>PHYSICAL REVIEW LETTERS</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>SPACKMAN, M. A</au><au>JIANG, B</au><au>GROY, T. L</au><au>HE, H</au><au>WHITTEN, A. E</au><au>SPENCE, J. C. 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We report the combination of x-ray and electron diffraction experiments for the determination of the electron density in acentric AlN, using multiple-scattering effects in convergent-beam electron diffraction to obtain sensitivity to structure factor phases, and describe a new error metric and weighting scheme for multipole refinement using combined measurements of structure factor magnitudes and phases.</abstract><cop>Ridge, NY</cop><pub>American Physical Society</pub><pmid>16196869</pmid><doi>10.1103/PhysRevLett.95.085502</doi><tpages>1</tpages></addata></record> |
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subjects | Condensed matter: structure, mechanical and thermal properties Exact sciences and technology MATERIALS SCIENCE Physics Single-crystal and powder diffraction Structure of solids and liquids crystallography X-ray diffraction and scattering |
title | Phase measurement for accurate mapping of chemical bonds in acentric space groups |
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